Analysis on Hot Carrier Injection of 0.15 μm Short-Channel AlGaN/GaN HEMTs Using Electroluminescence Spectroscopy - Jung, Junwoo; Lee, Jong-Min; Min, Byoung-Gue; Kang, Dong Min; Kang, Inho; Kim, Hyungtak (Journal of Electromagnetic Engineering and Science, 2025)
Keywords: algan/gan hemts; constant voltage stress; electroluminescence; hot carrier injection; reliability; 전자/정보통신공학