An intercomparison of AC voltage using a digitally synthesized source

An AC voltage intercomparison was conducted by the National Institute of Standards and Technology (NIST) to determine the consistency of AC voltage measurements made at various standards laboratories. The transport standard used for this purpose was an NIST-developed, digitally synthesized sinusoida...

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on instrumentation and measurement Vol. 39; no. 1; pp. 6 - 9
Main Authors Oldham, N.M., Bruce, W.F., Fu, C.M., Cohee, A., Smith, A.G.
Format Journal Article
LanguageEnglish
Published IEEE 01.02.1990
Subjects
Online AccessGet full text

Cover

Loading…
Abstract An AC voltage intercomparison was conducted by the National Institute of Standards and Technology (NIST) to determine the consistency of AC voltage measurements made at various standards laboratories. The transport standard used for this purpose was an NIST-developed, digitally synthesized sinusoidal voltage source whose RMS (root mean square) value was calculated by measuring the DC level of each of the steps used to synthesize the sine wave. The uncertainty of the calculated voltage at approximately 7 V RMS is typically within +or-10 parts per million (p.p.m.) from 15 Hz to 7.8 kHz. This approach incorporates a technique of determining AC voltage with reference to a measured standard DC voltage, which is independent of the traditional thermal voltage converter approach. Preliminary measurements made at each of the participating laboratories agree with the calculated value to within +or-20 p.p.m. These results indicate that at 7 V, in the low audio-frequency range, the AC voltage measurement techniques implemented at these laboratories are near the state of the art.< >
AbstractList An AC voltage intercomparison was conducted by the National Institute of Standards and Technology (NIST) to determine the consistency of AC voltage measurements made at various standards laboratories. The transport standard used for this purpose was an NIST-developed, digitally synthesized sinusoidal voltage source whose RMS (root mean square) value was calculated by measuring the DC level of each of the steps used to synthesize the sine wave. The uncertainty of the calculated voltage at approximately 7 V RMS is typically within +/-10 parts per million (p.p.m.) from 15 Hz to 7.8 kHz. This approach incorporates a technique of determining AC voltage with reference to a measured standard DC voltage, which is independent of the traditional thermal voltage converter approach. Preliminary measurements made at each of the participating laboratories agree with the calculated value to within +/-20 p.p.m. These results indicate that at 7 V, in the low audio-frequency range, the AC voltage measurement techniques implemented at these laboratories are near the state of the art
An AC voltage intercomparison was conducted by the National Institute of Standards and Technology (NIST) to determine the consistency of AC voltage measurements made at various standards laboratories. The transport standard used for this purpose was an NIST-developed, digitally synthesized sinusoidal voltage source whose RMS (root mean square) value was calculated by measuring the DC level of each of the steps used to synthesize the sine wave. The uncertainty of the calculated voltage at approximately 7 V RMS is typically within +or-10 parts per million (p.p.m.) from 15 Hz to 7.8 kHz. This approach incorporates a technique of determining AC voltage with reference to a measured standard DC voltage, which is independent of the traditional thermal voltage converter approach. Preliminary measurements made at each of the participating laboratories agree with the calculated value to within +or-20 p.p.m. These results indicate that at 7 V, in the low audio-frequency range, the AC voltage measurement techniques implemented at these laboratories are near the state of the art.< >
Author Smith, A.G.
Bruce, W.F.
Oldham, N.M.
Fu, C.M.
Cohee, A.
Author_xml – sequence: 1
  givenname: N.M.
  surname: Oldham
  fullname: Oldham, N.M.
  organization: Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
– sequence: 2
  givenname: W.F.
  surname: Bruce
  fullname: Bruce, W.F.
– sequence: 3
  givenname: C.M.
  surname: Fu
  fullname: Fu, C.M.
– sequence: 4
  givenname: A.
  surname: Cohee
  fullname: Cohee, A.
– sequence: 5
  givenname: A.G.
  surname: Smith
  fullname: Smith, A.G.
BookMark eNo90MFLwzAUBvAgE9ym4NVbTuKl8yVtk-Y4yqbCwIueQ5a-zkiXzKQV5l_vtOLpO3w_Ho9vRiY-eCTkmsGCMVD3TC1KKKA8I1NWljJTQvAJmQKwKlNFKS7ILKV3AJCikFOyWnrqfI_Rhv3BRJeCp6Gly5p-hq43O6RDcn5HDW3czvWm6440HX3_hsl9YUNTGKLFS3Lemi7h1V_Oyet69VI_Zpvnh6d6uclsDlWfbRENk0VuUanTQxykLBRHxSXANscmt2YLnLfKWGt4ZZpcmZZxwUVTYtWyfE5ux7uHGD4GTL3eu2Sx64zHMCTNq0IIpcQJ3o3QxpBSxFYfotubeNQM9M9Omin9u9OJ3ozUIeI_G7tvmfVkFg
CODEN IEIMAO
CitedBy_id crossref_primary_10_1109_19_387296
crossref_primary_10_1109_19_769627
crossref_primary_10_1109_19_650773
Cites_doi 10.1109/TIM.1987.6312708
10.1109/CPEM.1988.671164
10.1109/TIM.1987.6312575
10.1109/TIM.1986.6499105
ContentType Journal Article
DBID AAYXX
CITATION
7SP
7U5
8FD
L7M
DOI 10.1109/19.50405
DatabaseName CrossRef
Electronics & Communications Abstracts
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList Solid State and Superconductivity Abstracts

DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1557-9662
EndPage 9
ExternalDocumentID 10_1109_19_50405
50405
GroupedDBID -~X
0R~
29I
4.4
5GY
5VS
6IK
85S
8WZ
97E
A6W
AAJGR
AASAJ
AAYOK
ABQJQ
ABVLG
ACGFO
ACIWK
ACNCT
AENEX
AETIX
AI.
AIBXA
AKJIK
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
H~9
IAAWW
IBMZZ
ICLAB
IDIHD
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RIG
RNS
TN5
TWZ
VH1
VJK
XFK
AAYXX
CITATION
7SP
7U5
8FD
L7M
ID FETCH-LOGICAL-c308t-beea1743ce990012077492e92700b3ed3cab022f9acca28ad39af12626d5e8f13
IEDL.DBID RIE
ISSN 0018-9456
IngestDate Fri Aug 16 21:06:07 EDT 2024
Fri Aug 23 02:10:49 EDT 2024
Wed Jun 26 19:25:38 EDT 2024
IsDoiOpenAccess false
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Issue 1
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c308t-beea1743ce990012077492e92700b3ed3cab022f9acca28ad39af12626d5e8f13
Notes ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
OpenAccessLink https://zenodo.org/records/1260707/files/article.pdf
PQID 28466996
PQPubID 23500
PageCount 4
ParticipantIDs ieee_primary_50405
proquest_miscellaneous_28466996
crossref_primary_10_1109_19_50405
PublicationCentury 1900
PublicationDate 1990-02-01
PublicationDateYYYYMMDD 1990-02-01
PublicationDate_xml – month: 02
  year: 1990
  text: 1990-02-01
  day: 01
PublicationDecade 1990
PublicationTitle IEEE transactions on instrumentation and measurement
PublicationTitleAbbrev TIM
PublicationYear 1990
Publisher IEEE
Publisher_xml – name: IEEE
References ref4
fu (ref6) 1989
ref3
ref5
hermach (ref1) 1985
ref2
smith (ref8) 1989
bruce (ref7) 1989
References_xml – ident: ref5
  doi: 10.1109/TIM.1987.6312708
– start-page: 5c
  year: 1989
  ident: ref7
  article-title: Challenges and benefits to the standards lab from a state-of-the-art DMM
  publication-title: Conf Rec Measurement Science Conf
  contributor:
    fullname: bruce
– year: 1985
  ident: ref1
  publication-title: An investigation of the uncertainties for the NBS thermal voltage and current converters
  contributor:
    fullname: hermach
– ident: ref4
  doi: 10.1109/CPEM.1988.671164
– ident: ref3
  doi: 10.1109/TIM.1987.6312575
– start-page: 1b(1
  year: 1989
  ident: ref6
  article-title: A TVC calibration method?Matching without iteration
  publication-title: Conf Rec Measurement Science Conf
  contributor:
    fullname: fu
– start-page: 2b(21
  year: 1989
  ident: ref8
  article-title: Avoiding the pitfalls of alternating voltage measurement
  publication-title: Conf Rec Measurement Science Conf
  contributor:
    fullname: smith
– ident: ref2
  doi: 10.1109/TIM.1986.6499105
SSID ssj0007647
Score 1.3939635
Snippet An AC voltage intercomparison was conducted by the National Institute of Standards and Technology (NIST) to determine the consistency of AC voltage...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Publisher
StartPage 6
SubjectTerms Decision support systems
Frequency
Laboratories
Measurement standards
Missiles
NIST
Space technology
Standards development
Testing
Voltage measurement
Title An intercomparison of AC voltage using a digitally synthesized source
URI https://ieeexplore.ieee.org/document/50405
https://search.proquest.com/docview/28466996
Volume 39
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEF5sQdCD2qpYnyt4TZp3ssciLUXQk4Xewj4mpSiJNMmh_fXObtLi6yDkELIsJDOTeezMfEPIQ-Dx2OMitkKVgRVw1IMCdbGldIqJOUowg935_BJNZ8HTPJy3MDmmFwYATPEZ2PrW5PJVIWt9VDYMUeLCDunEjDWdWjudG0dBg47p4u-LPkELM-s6bOgy2-z7ZnjMJJVf6tfYlMlxM5yoNFCEupTkza4rYcvND6DG_73uCTlqXUs6amShR_Yg75PDL4CDfbJvCj5leUrGo5xqqIiV3A0ipEVGR48U9VWFSobqivgF5VQtF3qwyPualusc3cVyuQFFm0P_MzKbjF8fp1Y7UsGSvpNUlgDgOgaRgIzQfbPo_TEPmE4_Cx-UL7lAq54xjpz1Eq58xjPXw6hHhZBkrn9OunmRwwWhjoBQCC_yo1BhVOhzkDFeTDkq8ByWDMj9lt7pR4OckZqIw2Gpy1JDnAHpabLt1tuHd1u2pCjrOoHBcyjqMkVTGkUYoF3-te2KHLj4UU1F9TXpVqsabtBhqMStkZVPH5W_qg
link.rule.ids 315,783,787,799,27936,27937,55086
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT8JAEN4oxqgHFdSIL9bEa6FvukdCIKjACRJuzW53SoimGNoe4Nc7uy3E18Gkh6abTdqZ6Tx2Zr4h5Mm1edvmom14MgbD5agHBepiQ6oUEzOlYBq7czT2B1P3ZebNSpgc3QsDALr4DJrqVufy5TLK1VFZy0OJ8_bJAXrVgV_0au20btt3C3xMC39g9ApKoFnLZC2LNfXOb6ZHz1L5pYC1VemfFeOJUg1GqIpJ3pp5JprR5gdU4_9e-Jycls4l7RTSUCV7kNTIyRfIwRo51CWfUXpBep2EKrCIVbQbRUiXMe10KWqsDNUMVTXxc8qpXMzVaJH3NU3XCTqM6WIDkhbH_pdk2u9NugOjHKpgRI4ZZIYA4CoKiQBZoTpn0f9jNjCVgBYOSCfiAu16zDjy1g64dBiPLRvjHulBEFvOFakkywSuCTUFeELYvuN7EuNCh0PUxotJU7q2yYI6edzSO_wosDNCHXOYLLRYqIlTJ1VFtt16-bCxZUuI0q5SGDyBZZ6GaEx9H0O0m7-2NcjRYDIahsPn8estObbwA4v66jtSyVY53KP7kIkHLTefT8bC9Q
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=An+intercomparison+of+AC+voltage+using+a+digitally+synthesized+source&rft.jtitle=IEEE+transactions+on+instrumentation+and+measurement&rft.au=Oldham%2C+N+M&rft.au=Bruce%2C+W+F&rft.au=Fu%2C+C+M&rft.au=Cohee%2C+A&rft.date=1990-02-01&rft.issn=0018-9456&rft.volume=39&rft.issue=1&rft.spage=6&rft.epage=9&rft_id=info:doi/10.1109%2F19.50405&rft.externalDBID=NO_FULL_TEXT
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9456&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9456&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9456&client=summon