Quantification of discharge gas to optimize discharge parameters for relative sensitivity factors (RSFs) determination by slow-flow glow discharge mass spectrometry (GDMS)

Accurate determination of impurities present in a matrix by glow discharge mass spectrometry (GDMS) requires use of relative sensitivity factors (RSFs). In general, RSFs are obtained from reference materials with a comparable matrix composition as that of the sample being measured. Further, RSFs are...

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Published inJournal of analytical atomic spectrometry Vol. 35; no. 11; pp. 2748 - 2757
Main Authors Paudel, Gagan, Di Sabatino, Marisa
Format Journal Article
LanguageEnglish
Published London Royal Society of Chemistry 04.11.2020
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Abstract Accurate determination of impurities present in a matrix by glow discharge mass spectrometry (GDMS) requires use of relative sensitivity factors (RSFs). In general, RSFs are obtained from reference materials with a comparable matrix composition as that of the sample being measured. Further, RSFs are sensitive to variation in discharge conditions. Thus, in the present study, various combinations of glow discharge parameters, namely current, voltage and argon flow are studied on a powder certified reference material, NIST silicon 57b, using indium sheets. Likewise, quantification of discharge gas, argon is carried out to facilitate the optimization of GDMS parameters. Furthermore, discharge parameters leading to optimum crater in a flat silicon sample is also considered before selecting optimum discharge condition for RSFs determination. As a result, two sets of RSFs are built - one based on calibrated values reported by NIST and the other based on values obtained after analysis of the same powder by inductively coupled plasma mass spectrometry (ICP-MS). Both sets of RSFs are tested further using another powder certified reference material, NIST 195, using both certified and ICP-MS values. The results of this study indicate that there is no considerable variation in concentration for most of the elements/isotopes including argon when discharge current and voltage are in range of 2-3 mA and 1.2-1.4 kV, respectively. It is found that for most of the elements, RSFs built based on both ICP-MS analysis and certified NIST values give comparable result with error below 20%. However, calcium showed ∼80% discrepancy based on certified values as compared to ∼10% based on ICP-MS values. It is likely that plotting of variation in quantification of discharge gas can be used to optimize and select discharge condition that can eventually help for RSFs determination.
AbstractList Accurate determination of impurities present in a matrix by glow discharge mass spectrometry (GDMS) requires use of relative sensitivity factors (RSFs). In general, RSFs are obtained from reference materials with a comparable matrix composition as that of the sample being measured. Further, RSFs are sensitive to variation in discharge conditions. Thus, in the present study, various combinations of glow discharge parameters, namely current, voltage and argon flow are studied on a powder certified reference material, NIST silicon 57b, using indium sheets. Likewise, quantification of discharge gas, argon is carried out to facilitate the optimization of GDMS parameters. Furthermore, discharge parameters leading to optimum crater in a flat silicon sample is also considered before selecting optimum discharge condition for RSFs determination. As a result, two sets of RSFs are built – one based on calibrated values reported by NIST and the other based on values obtained after analysis of the same powder by inductively coupled plasma mass spectrometry (ICP-MS). Both sets of RSFs are tested further using another powder certified reference material, NIST 195, using both certified and ICP-MS values. The results of this study indicate that there is no considerable variation in concentration for most of the elements/isotopes including argon when discharge current and voltage are in range of 2–3 mA and 1.2–1.4 kV, respectively. It is found that for most of the elements, RSFs built based on both ICP-MS analysis and certified NIST values give comparable result with error below 20%. However, calcium showed ∼80% discrepancy based on certified values as compared to ∼10% based on ICP-MS values.
Accurate determination of impurities present in a matrix by glow discharge mass spectrometry (GDMS) requires use of relative sensitivity factors (RSFs). In general, RSFs are obtained from reference materials with a comparable matrix composition as that of the sample being measured. Further, RSFs are sensitive to variation in discharge conditions. Thus, in the present study, various combinations of glow discharge parameters, namely current, voltage and argon flow are studied on a powder certified reference material, NIST silicon 57b, using indium sheets. Likewise, quantification of discharge gas, argon is carried out to facilitate the optimization of GDMS parameters. Furthermore, discharge parameters leading to optimum crater in a flat silicon sample is also considered before selecting optimum discharge condition for RSFs determination. As a result, two sets of RSFs are built - one based on calibrated values reported by NIST and the other based on values obtained after analysis of the same powder by inductively coupled plasma mass spectrometry (ICP-MS). Both sets of RSFs are tested further using another powder certified reference material, NIST 195, using both certified and ICP-MS values. The results of this study indicate that there is no considerable variation in concentration for most of the elements/isotopes including argon when discharge current and voltage are in range of 2-3 mA and 1.2-1.4 kV, respectively. It is found that for most of the elements, RSFs built based on both ICP-MS analysis and certified NIST values give comparable result with error below 20%. However, calcium showed ∼80% discrepancy based on certified values as compared to ∼10% based on ICP-MS values. It is likely that plotting of variation in quantification of discharge gas can be used to optimize and select discharge condition that can eventually help for RSFs determination.
Author Paudel, Gagan
Di Sabatino, Marisa
AuthorAffiliation Department of Materials Science and Engineering
Norwegian University of Science and Technology
AuthorAffiliation_xml – name: Norwegian University of Science and Technology
– name: Department of Materials Science and Engineering
Author_xml – sequence: 1
  givenname: Gagan
  surname: Paudel
  fullname: Paudel, Gagan
– sequence: 2
  givenname: Marisa
  surname: Di Sabatino
  fullname: Di Sabatino, Marisa
BookMark eNp90U9P2zAYBnBrKtJaxoU7kqddACnDTpw4OaJ2wBAT4t85cpzXnasmDn7dTd1X4kviUgScdnltyT-_z-GZkFHveiBkn7PvnGXVScsWirG05ItPZMyzQiR5LsSIjFlayKQSUn4mE8QFY0zkaT4mTzcr1QdrrFbBup46Q1uL-rfyc6BzhTQ46oZgO_sPPrwMyqsOAnikxnnqYRm__wGK0KONNxvW1CgdXASHt3dneETbDe9sv81p1hSX7m9i4qDzzXhf3ilEigPo4F0M8Wt6eD77dXf0hewYtUTYez13ycPZj_vpRXJ1ff5zenqV6IzJkLSqaZWABtoG0qyUqpRVkeqi4IJLzpnWUmYtyDK6AhgYk0pVAW8aKYSSZbZLvm33Dt49rgBDvXAr38fIOhW5TKWQRRXV8VZp7xA9mHrwtlN-XXNWb8qoZ-zy9KWMy4i_brFH_ebey6qH1kRz8D-TPQO-mpga
CitedBy_id crossref_primary_10_1039_D1JA90049H
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ContentType Journal Article
Copyright Copyright Royal Society of Chemistry 2020
Copyright_xml – notice: Copyright Royal Society of Chemistry 2020
DBID AAYXX
CITATION
7SR
7U5
8BQ
8FD
JG9
L7M
DOI 10.1039/d0ja00281j
DatabaseName CrossRef
Engineered Materials Abstracts
Solid State and Superconductivity Abstracts
METADEX
Technology Research Database
Materials Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Materials Research Database
Engineered Materials Abstracts
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
METADEX
DatabaseTitleList CrossRef

Materials Research Database
DeliveryMethod fulltext_linktorsrc
Discipline Chemistry
Physics
EISSN 1364-5544
EndPage 2757
ExternalDocumentID 10_1039_D0JA00281J
d0ja00281j
GroupedDBID 0-7
02
0R
1TJ
29J
4.4
5GY
70
705
70J
7~J
AAEMU
AAGNR
AAIWI
AANOJ
ABDVN
ABGFH
ABPTK
ABRYZ
ACGFS
ACIWK
ACLDK
ADMRA
ADSRN
AENEX
AFVBQ
AGKEF
AGSTE
AGSWI
ALMA_UNASSIGNED_HOLDINGS
ASKNT
AUDPV
BLAPV
BSQNT
C6K
CKLOX
CS3
DU5
EBS
ECGLT
EE0
EF-
F5P
GNO
HZ
H~N
IDZ
J3I
JG
N9A
O9-
OK1
P2P
R7B
RCNCU
RIG
RPMJG
RRA
RRC
RSCEA
SKM
SLF
TN5
TWZ
UPT
VH6
-JG
0R~
2WC
70~
AAJAE
AAMEH
AAWGC
AAXHV
AAXPP
AAYXX
ABASK
ABEMK
ABJNI
ABPDG
ABXOH
ACGFO
AEFDR
AENGV
AESAV
AETIL
AFLYV
AFOGI
AGEGJ
AGRSR
AHGCF
ANUXI
APEMP
CITATION
GGIMP
H13
HZ~
R7E
RAOCF
YQT
~02
7SR
7U5
8BQ
8FD
JG9
L7M
ID FETCH-LOGICAL-c307t-dabda4ebedbe2387a87962c661417110cc773de78abd6e0eff27a9e1bb744a783
ISSN 0267-9477
IngestDate Fri Sep 13 07:02:46 EDT 2024
Fri Aug 23 02:34:22 EDT 2024
Sat Jan 08 03:54:44 EST 2022
Wed Nov 11 00:36:14 EST 2020
IsPeerReviewed true
IsScholarly true
Issue 11
Language English
LinkModel OpenURL
MergedId FETCHMERGED-LOGICAL-c307t-dabda4ebedbe2387a87962c661417110cc773de78abd6e0eff27a9e1bb744a783
Notes 10.1039/d0ja00281j
Electronic supplementary information (ESI) available. See DOI
ORCID 0000-0001-7309-1060
PQID 2457274769
PQPubID 2047501
PageCount 1
ParticipantIDs proquest_journals_2457274769
crossref_primary_10_1039_D0JA00281J
rsc_primary_d0ja00281j
PublicationCentury 2000
PublicationDate 20201104
PublicationDateYYYYMMDD 2020-11-04
PublicationDate_xml – month: 11
  year: 2020
  text: 20201104
  day: 4
PublicationDecade 2020
PublicationPlace London
PublicationPlace_xml – name: London
PublicationTitle Journal of analytical atomic spectrometry
PublicationYear 2020
Publisher Royal Society of Chemistry
Publisher_xml – name: Royal Society of Chemistry
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SSID ssj0004525
Score 2.3752837
Snippet Accurate determination of impurities present in a matrix by glow discharge mass spectrometry (GDMS) requires use of relative sensitivity factors (RSFs). In...
SourceID proquest
crossref
rsc
SourceType Aggregation Database
Enrichment Source
Publisher
StartPage 2748
SubjectTerms Argon
Electric potential
Emission spectroscopy
Glow discharges
Inductively coupled plasma mass spectrometry
Mass spectrometry
Optimization
Parameter sensitivity
Reference materials
Scientific imaging
Silicon
Voltage
Title Quantification of discharge gas to optimize discharge parameters for relative sensitivity factors (RSFs) determination by slow-flow glow discharge mass spectrometry (GDMS)
URI https://www.proquest.com/docview/2457274769/abstract/
Volume 35
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1Nb9NAEF2lrRBcEBSqphS0EhxaRQbHX2sfo6YfVBQJJZV6s3a96yoVSarYoaJ_iT_BT2PG67U3pIfCxYrsrNfRvMy-Hc-8IeRDHshYxYI5YaiEE8jIc7jnho4MmfQy38tdhvXOF1-js8vg_Cq86nR-W1lLy1J8zO4frCv5H6vCObArVsn-g2Wbm8IJ-Az2hSNYGI6PsvG3Jde5Pg3vwyJb1D5SvWteaTfMwSVMJ_fKuoJq31PMgqmkGOpqlh-qV2Aue91MwrThwQDD6KTA2IE0iTPVXMBai-_zOyeHA6qK3FkTTIGQ96oSTtRCKBdVQsHp8GJkwg7rZJijNooOq_MSC6VXxrfvuZZSZxWc8usW1sNJb8QFPFfVRhzLjyYFt8MZsHfFEG1geT0PPHcS1L1dlPbKfhQAmLRQpHHbWuXEwLNvO2GmxTvrBd1jWgJ7bbFwfdRaHbrnA9x59s_bJdGkAfy1Ujb5i9Wbez9J27EbZMtjSQjb_63B8fjzF1uxPtRxPv2zjESun3xqR6-Sonans7EwbWgqujN-QZ7XpqEDDbqXpKNm2-TpkWkPuE2eVLnDWfGK_FqFIZ3ntMECBRjSck4NDK0rLQwpwJAaGFILhrSGIT1AEB7SFQhS8ZM2EKQIQevmCEFqQ4geIAAPX5PLk-Px0ZlT9wBxMlh9SkdyIXkAnkYKBeyS8ZglkZchq-wzoK5ZxpgvFYvhe5FyVZ57jCeqLwQLAs5if4dszuYztUtoxoF7h30RR7CHBibO4zBiGQO-nPuM-3GXvDdGSG-11Eu6bugu2Tf2SWtXUKReEDIM70RJl-yAzZrx0r3h1bibLtl7-EJ6K_O9R039hjxr_zH7ZLNcLNVboMSleFej7g__lb3K
link.rule.ids 315,786,790,27957,27958
linkProvider Royal Society of Chemistry
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Quantification+of+discharge+gas+to+optimize+discharge+parameters+for+relative+sensitivity+factors+%28RSFs%29+determination+by+slow-flow+glow+discharge+mass+spectrometry+%28GDMS%29&rft.jtitle=Journal+of+analytical+atomic+spectrometry&rft.au=Paudel%2C+Gagan&rft.au=Di+Sabatino%2C+Marisa&rft.date=2020-11-04&rft.issn=0267-9477&rft.eissn=1364-5544&rft.volume=35&rft.issue=11&rft.spage=2748&rft.epage=2757&rft_id=info:doi/10.1039%2FD0JA00281J&rft.externalDBID=n%2Fa&rft.externalDocID=10_1039_D0JA00281J
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0267-9477&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0267-9477&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0267-9477&client=summon