Energy spike induced effects in MeV ion-irradiated nanoislands

Transmission electron microscopy (TEM), atomic force microscopy (AFM) and Rutherford backscattering spectrometry (RBS) have been used to study the modification of Au nanoislands, grown on silicon substrates under high vacuum condition by MeV self-ion irradiation. Upon irradiation with 1.5 MeV Au 2+...

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Bibliographic Details
Published inNuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 212; pp. 157 - 163
Main Authors Satpati, B., Goswami, D.K., Vaishnav, U.D., Som, T., Dev, B.N., Satyam, P.V.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.12.2003
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