Energy spike induced effects in MeV ion-irradiated nanoislands
Transmission electron microscopy (TEM), atomic force microscopy (AFM) and Rutherford backscattering spectrometry (RBS) have been used to study the modification of Au nanoislands, grown on silicon substrates under high vacuum condition by MeV self-ion irradiation. Upon irradiation with 1.5 MeV Au 2+...
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Published in | Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 212; pp. 157 - 163 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
01.12.2003
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Subjects | |
Online Access | Get full text |
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