Characterization of rare-earth oxysulfide E.L. complex center in ZnS thin film

• Published in: Journal of luminescence Vol. 24; pp. 59 - 62
• Main Authors: Benalloul, P., Benoit, J., Barthou, C., Blanzat, B.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.01.1981

This presentation of new rare-earth oxysulfide complex center in ZnS thin film opens future properties of the high field E.L. devices mainly because the new possibilities to carry out the trichromic. The properties of these new centers have been investigated with ZnS : Y 2O 2S(Eu) by F.L.N. and T.R....