APA (7th ed.) Citation

Ma, L., Dong, J., Hu, C., & Peng, K. (2021). A novel decentralized detection framework for quality-related faults in manufacturing industrial processes. Neurocomputing (Amsterdam), 428, 30-41. https://doi.org/10.1016/j.neucom.2020.11.045

Chicago Style (17th ed.) Citation

Ma, Liang, Jie Dong, Changjun Hu, and Kaixiang Peng. "A Novel Decentralized Detection Framework for Quality-related Faults in Manufacturing Industrial Processes." Neurocomputing (Amsterdam) 428 (2021): 30-41. https://doi.org/10.1016/j.neucom.2020.11.045.

MLA (9th ed.) Citation

Ma, Liang, et al. "A Novel Decentralized Detection Framework for Quality-related Faults in Manufacturing Industrial Processes." Neurocomputing (Amsterdam), vol. 428, 2021, pp. 30-41, https://doi.org/10.1016/j.neucom.2020.11.045.