Robustness of radial basis functions

• Published in: Neurocomputing (Amsterdam) Vol. 70; no. 16; pp. 2758 - 2767
• Main Authors: Eickhoff, Ralf, Rückert, Ulrich
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.10.2007
• Subjects: Equicontinuity; Nanoelectronics; Radial basis function; Robustness; Sensitivity analysis; Radial basis function; Robustness; Equicontinuity; Sensitivity analysis; Nanoelectronics

Neural networks are intended to be used in future nanoelectronic technology since these architectures seem to be robust to malfunctioning elements and noise in its inputs and parameters. In this work, the robustness of radial basis function networks is analyzed in order to operate in noisy and unrel...