The structure of films formed by γ-aminopropyltriethoxysilane adsorbed onto copper

The structure of thin films formed by γ-aminopropyltriethoxysilane (γ-APS) adsorbed onto copper mirrors from aqueous solutions was determined using reflection-absorption infrared (RAIR) and X-ray photoelectron spectroscopy (XPS). Films formed at pH 10.4 were composed of siloxane polymers containing...

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Bibliographic Details
Published inJournal of colloid and interface science Vol. 91; no. 2; pp. 485 - 495
Main Authors Boerio, F.J, Williams, J.W, Burkstrand, J.M
Format Journal Article
LanguageEnglish
Published Elsevier Inc 01.01.1983
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