APA (7th ed.) Citation

Douglass, D., Lawry, D., Edris, A., & Bascom, E. (2000). Dynamic thermal ratings realize circuit load limits. IEEE computer applications in power, 13(1), 38-44. https://doi.org/10.1109/67.814665

Chicago Style (17th ed.) Citation

Douglass, D.A, D.C Lawry, A.-A Edris, and E.C Bascom. "Dynamic Thermal Ratings Realize Circuit Load Limits." IEEE Computer Applications in Power 13, no. 1 (2000): 38-44. https://doi.org/10.1109/67.814665.

MLA (9th ed.) Citation

Douglass, D.A, et al. "Dynamic Thermal Ratings Realize Circuit Load Limits." IEEE Computer Applications in Power, vol. 13, no. 1, 2000, pp. 38-44, https://doi.org/10.1109/67.814665.