Electrical properties of aluminium island films near the percolation threshold

Electrical properties of Al island films on NaCl substrates are studied. The temperature dependence of the resistance is determined in situ under vacuum conditions for films with various volume fractions q. It has been found that the electrical properties of the film are subject to significant chang...

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Bibliographic Details
Published inSurface science Vol. 200; no. 2; pp. 417 - 423
Main Authors Dobierzewska-Mozrzymas, E., Biegański, P.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.07.1988
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Summary:Electrical properties of Al island films on NaCl substrates are studied. The temperature dependence of the resistance is determined in situ under vacuum conditions for films with various volume fractions q. It has been found that the electrical properties of the film are subject to significant changes near the percolation threshold, when q approaches 0.51. This behaviour is to be attributed to a change in the type of conduction. The temperature coefficient of resistance TCR for the percolation threshold q c is close to zero. For q< q c and q> q c, TCR is smaller than zero or greater than zero, respectively.
ISSN:0039-6028
1879-2758
DOI:10.1016/0039-6028(88)90546-8