Semiconductor surface study by transverse acoustoelectric voltage using surface acoustic waves

• Published in: Solid-state electronics Vol. 19; no. 2; pp. 121 - 123
• Main Authors: Das, P., Motamedi, M.E., Webster, R.T.
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01.01.1976

Electrical properties of semiconductor surfaces can be determined by measuring the transverse acoustoelectric voltage. This voltage is produced by the interaction of the surface acoustic wave propagating on a piezoelectric substrate and the carriers on semiconductor surface placed in proximity. Usin...