Use of molecular beam epitaxy for high-power AlGaAs laser production
The results of statistical analysis of the characteristics of high-power semiconductor lasers grown by molecular beam epitaxy are presented. Three types of heterostructures are compared. It is shown that widening of a graded refractive index (GRIN) waveguide layer thickness from the standard value o...
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Published in | Journal of crystal growth Vol. 150; pp. 1350 - 1353 |
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Main Authors | , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
01.05.1995
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Online Access | Get full text |
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Summary: | The results of statistical analysis of the characteristics of high-power semiconductor lasers grown by molecular beam epitaxy are presented. Three types of heterostructures are compared. It is shown that widening of a graded refractive index (GRIN) waveguide layer thickness from the standard value of 0.4 to 0.6 μm results in increased average differential quantum efficiency of the lasers. In addition, use of a 100 Å single quantum well decreases the scatter of the laser diode threshold current density as compared with the structures having a quantum well thickness of 200 Å. |
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ISSN: | 0022-0248 1873-5002 |
DOI: | 10.1016/0022-0248(95)80158-9 |