Near‐Field Nano‐Optical Imaging of van der Waals Materials

• Published in: Advanced Physics Research Vol. 2; no. 10
• Main Authors: Kwon, Soyeong, Kim, Jin Myung, Ma, Peiwen J., Guan, Weilin, Nam, SungWoo
• Format: Journal Article
• Language: English
• Published: Edinburgh John Wiley & Sons, Inc 01.10.2023; Wiley-VCH
• Subjects: 2D materials; Chemical bonds; Defects; Electrons; Excitons; Imaging techniques; Investigations; Light microscopy; near‐field optical imaging; Optical microscopy; Optical properties; Photoluminescence; Physical properties; PiFM; Polaritons; Quantum confinement; Raman spectroscopy; Spatial resolution; Spectrum analysis; s‐SNOM; TERS/TEPL; Two dimensional analysis

2D van der Waals (vdW) materials are emerging as the next generation platform for optical and electronic devices with their wide coverage of the energy bandgaps. The strong light–matter interactions in 2D vdW layers allow for exploring novel optical and electronic phenomena such as 2D polaritons exh...