Near‐Field Nano‐Optical Imaging of van der Waals Materials - Kwon, Soyeong; Kim, Jin Myung; Ma, Peiwen J.; Guan, Weilin; Nam, SungWoo (Advanced Physics Research, 2023)
Keywords: 2D materials; Chemical bonds; Defects; Electrons; Excitons; Imaging techniques; Investigations; Light microscopy; near‐field optical imaging; Optical microscopy; Optical properties; Photoluminescence; Physical properties; PiFM; Polaritons; Quantum confinement; Raman spectroscopy; Spatial resolution; Spectrum analysis; s‐SNOM; TERS/TEPL; Two dimensional analysis