Joint learning system based on semi–pseudo–label reliability assessment for weak–fault diagnosis with few labels

• Published in: Mechanical systems and signal processing Vol. 189; p. 110089
• Main Authors: Gao, Da-wei, Zhu, Yong-sheng, Yan, Ke, Fu, Hong, Ren, Zhi-jun, Kang, Wei, Guedes Soares, C.
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 15.04.2023
• Subjects: Label noise; Pseudo–label; Sample reliability; Semi–supervised learning; Weak–fault diagnosis; Sample reliability; Pseudo–label; Label noise; Weak–fault diagnosis; Semi–supervised learning

•Deep learning method for extracting weak–fault–related features when the labels are insufficient.•Pseudo–label selection mechanism based on reliability assessment.•Joint learning workflow combining the advantages of UL, TL, and SSL.•SSL based on multiple views considering prior knowledge of signal...