Joint learning system based on semi–pseudo–label reliability assessment for weak–fault diagnosis with few labels - Gao, Da-wei; Zhu, Yong-sheng; Yan, Ke; Fu, Hong; Ren, Zhi-jun; Kang, Wei; Guedes Soares, C. (Mechanical systems and signal processing, 2023)
Keywords: Label noise; Pseudo–label; Sample reliability; Semi–supervised learning; Weak–fault diagnosis; Sample reliability; Pseudo–label; Label noise; Weak–fault diagnosis; Semi–supervised learning