Gao, D., Zhu, Y., Yan, K., Fu, H., Ren, Z., Kang, W., & Guedes Soares, C. (2023). Joint learning system based on semi–pseudo–label reliability assessment for weak–fault diagnosis with few labels. Mechanical systems and signal processing, 189, 110089. https://doi.org/10.1016/j.ymssp.2022.110089
Chicago Style (17th ed.) CitationGao, Da-wei, Yong-sheng Zhu, Ke Yan, Hong Fu, Zhi-jun Ren, Wei Kang, and C. Guedes Soares. "Joint Learning System Based on Semi–pseudo–label Reliability Assessment for Weak–fault Diagnosis with Few Labels." Mechanical Systems and Signal Processing 189 (2023): 110089. https://doi.org/10.1016/j.ymssp.2022.110089.
MLA (9th ed.) CitationGao, Da-wei, et al. "Joint Learning System Based on Semi–pseudo–label Reliability Assessment for Weak–fault Diagnosis with Few Labels." Mechanical Systems and Signal Processing, vol. 189, 2023, p. 110089, https://doi.org/10.1016/j.ymssp.2022.110089.