Modeling and simulating of V-shaped piezoelectric micro-cantilevers using MCS theory considering the various surface geometries

Atomic force microscopy (AFM) is widely used as a tool in studying surfaces and mechanical properties of materials at nanoscale. This paper deals with mechanical and vibration analysis of AFM vibration in the non-contact and tapping modes for V-shaped piezoelectric micro-cantilever (MC) with geometr...

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Published inPhysica. E, Low-dimensional systems & nanostructures Vol. 84; pp. 268 - 279
Main Authors Korayem, A.H., Kianfar, A., Korayem, M.H.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.10.2016
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Abstract Atomic force microscopy (AFM) is widely used as a tool in studying surfaces and mechanical properties of materials at nanoscale. This paper deals with mechanical and vibration analysis of AFM vibration in the non-contact and tapping modes for V-shaped piezoelectric micro-cantilever (MC) with geometric discontinuities and cross section variation in the air ambient. In the vibration analysis, Euler-Bernoulli beam theory based on modified couple stress (MCS) theory has been used. The governing equation of motion has been derived by using Hamilton's principle. By adopting finite element method (FEM), the MC differential equation has been solved. Damping matrix was considered in the modal space. Frequency response was obtained by using Laplace transform, and it has been compared with experimental results. Newmark algorithm has been used based on constant average acceleration to analyze time response of MC, and then time response results in the vibration mode, far from the sample surface have been compared with experimental data. In vicinity of sample surface, MC is influenced by various nonlinear forces between the probe tip and sample surface, including van der Waals, contact, and capillary forces. Time response was examined at different distances between MC base and sample surface, and the best distance was selected for topography. Topography results of different types of roughness showed that piezoelectric MC has been improved in the air ambient. Topography showed more accurate forms of roughness, when MC passes through sample surface at higher frequencies. The surface topography investigation for tapping and non-contact modes showed that using of these two modes are suitable for topography. •Different types of surface roughness effect are investigated in Nano scale.•The micro cantilever modeling is based on the modified couple stress Theory.•The effect of roughness radius on the amplitude of Piezoelectric MC is studied in air.
AbstractList Atomic force microscopy (AFM) is widely used as a tool in studying surfaces and mechanical properties of materials at nanoscale. This paper deals with mechanical and vibration analysis of AFM vibration in the non-contact and tapping modes for V-shaped piezoelectric micro-cantilever (MC) with geometric discontinuities and cross section variation in the air ambient. In the vibration analysis, Euler-Bernoulli beam theory based on modified couple stress (MCS) theory has been used. The governing equation of motion has been derived by using Hamilton's principle. By adopting finite element method (FEM), the MC differential equation has been solved. Damping matrix was considered in the modal space. Frequency response was obtained by using Laplace transform, and it has been compared with experimental results. Newmark algorithm has been used based on constant average acceleration to analyze time response of MC, and then time response results in the vibration mode, far from the sample surface have been compared with experimental data. In vicinity of sample surface, MC is influenced by various nonlinear forces between the probe tip and sample surface, including van der Waals, contact, and capillary forces. Time response was examined at different distances between MC base and sample surface, and the best distance was selected for topography. Topography results of different types of roughness showed that piezoelectric MC has been improved in the air ambient. Topography showed more accurate forms of roughness, when MC passes through sample surface at higher frequencies. The surface topography investigation for tapping and non-contact modes showed that using of these two modes are suitable for topography. •Different types of surface roughness effect are investigated in Nano scale.•The micro cantilever modeling is based on the modified couple stress Theory.•The effect of roughness radius on the amplitude of Piezoelectric MC is studied in air.
Author Korayem, A.H.
Kianfar, A.
Korayem, M.H.
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Keywords Air ambient
AFM piezoelectric micro-cantilever
Tapping mode
Non-contact mode
Modified couple stress theory
Surface topography
Language English
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Snippet Atomic force microscopy (AFM) is widely used as a tool in studying surfaces and mechanical properties of materials at nanoscale. This paper deals with...
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StartPage 268
SubjectTerms AFM piezoelectric micro-cantilever
Air ambient
Modified couple stress theory
Non-contact mode
Surface topography
Tapping mode
Title Modeling and simulating of V-shaped piezoelectric micro-cantilevers using MCS theory considering the various surface geometries
URI https://dx.doi.org/10.1016/j.physe.2016.06.014
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