Software reliability-engineered testing

Software testing often results in delays to market and high cost without assuring product reliability. Software reliability engineered testing (SRET), an AT&T best practice, carefully engineers testing to overcome these weaknesses. The article describes SRET in the context of an actual project a...

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Published inComputer (Long Beach, Calif.) Vol. 29; no. 11; pp. 61 - 68
Main Author Musa, J.D.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.11.1996
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Online AccessGet full text
ISSN0018-9162
1558-0814
DOI10.1109/2.544239

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Abstract Software testing often results in delays to market and high cost without assuring product reliability. Software reliability engineered testing (SRET), an AT&T best practice, carefully engineers testing to overcome these weaknesses. The article describes SRET in the context of an actual project at AT&T, which is called Fone Follower. The author selected this example because of its simplicity; it in no way implies that SRET is limited to telecommunications systems. SRET is based on the AT&T Best Current Practice of Software Reliability Engineering, approved in May 1991. Qualification as an AT&T best current practice requires use on typically eight to 10 projects with documented large benefit/cost ratios, as well as a probing review by two boards of high level managers. Some 70 project managers also reviewed this particular practice. Standards for approval as a best current practice are high; only five of 30 proposed best current practices were approved in 1991.
AbstractList Software testing often results in delays to market and high cost without assuring product reliability. Software reliability engineered testing (SRET), an AT&T best practice, carefully engineers testing to overcome these weaknesses. The article describes SRET in the context of an actual project at AT&T, which is called Fone Follower. The author selected this example because of its simplicity; it in no way implies that SRET is limited to telecommunications systems. SRET is based on the AT&T Best Current Practice of Software Reliability Engineering, approved in May 1991. Qualification as an AT&T best current practice requires use on typically eight to 10 projects with documented large benefit/cost ratios, as well as a probing review by two boards of high level managers. Some 70 project managers also reviewed this particular practice. Standards for approval as a best current practice are high; only five of 30 proposed best current practices were approved in 1991
Software testing often results in delays to market and high cost without assuring product reliability. Software reliability engineered testing (SRET), an AT&T best practice, carefully engineers testing to overcome these weaknesses. The article describes SRET in the context of an actual project at AT&T, which is called Fone Follower. The author selected this example because of its simplicity; it in no way implies that SRET is limited to telecommunications systems. SRET is based on the AT&T Best Current Practice of Software Reliability Engineering, approved in May 1991. Qualification as an AT&T best current practice requires use on typically eight to 10 projects with documented large benefit/cost ratios, as well as a probing review by two boards of high level managers. Some 70 project managers also reviewed this particular practice. Standards for approval as a best current practice are high; only five of 30 proposed best current practices were approved in 1991.
Software testing often results in delays to market and high cost without assuring product reliability. Software-reliability-engineered testing carefully engineers testing to overcome these weaknesses.
Author Musa, J.D.
Author_xml – sequence: 1
  givenname: J.D.
  surname: Musa
  fullname: Musa, J.D.
  organization: Software Reliability Eng., AT&T Bell Labs., Murray Hill, NJ, USA
BookMark eNptkM1LAzEQxYNUsK2CZ0_Fg3rZmq_NJkcpfkHBg3oO2eykpGyzNUmR_veubPFQPA3D_N6bx5ugUegCIHRJ8JwQrO7pvOScMnWCxqQsZYEl4SM0xpjIQhFBz9AkpXW_clmyMbp971z-NhFmEVpvat_6vC8grHwAiNDMMqTsw-ocnTrTJrg4zCn6fHr8WLwUy7fn18XDsrAM01zUDkNTS9w0whImQZlGSHAWWM0rcLTGonLcKgElL6VVTHLrlHGkMYxZUbEpuhl8t7H72vW_9cYnC21rAnS7pKmUVFSE9-D1EbjudjH02TRRFceEYtVDdwNkY5dSBKe30W9M3GuC9W9dmuqhrh6dH6HWZ5N9F3I0vv1PcDUIPAD8-R6OPxmedWI
CODEN CPTRB4
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Cites_doi 10.1145/253228.253538
10.1109/52.199724
ContentType Journal Article
Copyright Copyright Institute of Electrical and Electronics Engineers, Inc. (IEEE) Nov 1996
Copyright_xml – notice: Copyright Institute of Electrical and Electronics Engineers, Inc. (IEEE) Nov 1996
DBID AAYXX
CITATION
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
DOI 10.1109/2.544239
DatabaseName CrossRef
Computer and Information Systems Abstracts
Electronics & Communications Abstracts
Technology Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
DatabaseTitle CrossRef
Technology Research Database
Computer and Information Systems Abstracts – Academic
Electronics & Communications Abstracts
ProQuest Computer Science Collection
Computer and Information Systems Abstracts
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts Professional
DatabaseTitleList Technology Research Database

Technology Research Database
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Computer Science
EISSN 1558-0814
EndPage 68
ExternalDocumentID 10946980
10_1109_2_544239
544239
Genre orig-research
Feature
GroupedDBID -DZ
-~X
.DC
0R~
29F
4.4
41~
5GY
5VS
6IK
85S
97E
9M8
AAJGR
AARMG
AASAJ
AAUTI
AAVXG
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFS
ACGOD
ACIWK
ACNCT
ACPVT
ADRHT
AENEX
AETEA
AETIX
AFFNX
AFOGA
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ATWAV
AZLTO
BEFXN
BFFAM
BGNUA
BKEBE
BKOMP
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
H~9
IAAWW
IBMZZ
ICLAB
IEDLZ
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
MVM
O9-
OCL
P2P
PQQKQ
RIA
RIE
RNI
RNS
RZB
S10
TAE
TN5
TWZ
UKR
UPT
UQL
VH1
WH7
XJT
XOL
XWC
XZL
YZZ
ZCG
AAYXX
CITATION
RIG
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
ID FETCH-LOGICAL-c302t-bf0edb80dd6c138e9ad68efce3b47ef2b067f4c96e5458c9384cf9af1da33c673
IEDL.DBID RIE
ISSN 0018-9162
IngestDate Sun Aug 24 03:56:55 EDT 2025
Mon Jun 30 04:33:07 EDT 2025
Thu Apr 24 23:05:18 EDT 2025
Tue Jul 01 03:18:18 EDT 2025
Wed Aug 27 02:40:45 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 11
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
https://doi.org/10.15223/policy-029
https://doi.org/10.15223/policy-037
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c302t-bf0edb80dd6c138e9ad68efce3b47ef2b067f4c96e5458c9384cf9af1da33c673
Notes SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 14
ObjectType-Article-2
content type line 23
PQID 197401209
PQPubID 36684
PageCount 8
ParticipantIDs proquest_journals_197401209
crossref_citationtrail_10_1109_2_544239
proquest_miscellaneous_28826714
crossref_primary_10_1109_2_544239
ieee_primary_544239
ProviderPackageCode CITATION
AAYXX
PublicationCentury 1900
PublicationDate 1996-Nov.
1996-11-00
19961101
PublicationDateYYYYMMDD 1996-11-01
PublicationDate_xml – month: 11
  year: 1996
  text: 1996-Nov.
PublicationDecade 1990
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle Computer (Long Beach, Calif.)
PublicationTitleAbbrev MC
PublicationYear 1996
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References bibry0611
musa (bibry0612) 1987
bibry0613
lyu (bibry0614) 0
lyu (bibry0611A) 0
References_xml – year: 0
  ident: bibry0614
  publication-title: Handbook of Software Reliability Engineering
– year: 1987
  ident: bibry0612
  publication-title: Software Reliability Measurement Prediction Application
– ident: bibry0613
  doi: 10.1145/253228.253538
– ident: bibry0611
  doi: 10.1109/52.199724
– year: 0
  ident: bibry0611A
  publication-title: Handbook of Software Reliability Engineering
SSID ssj0014853
Score 1.6948106
SecondaryResourceType review_article
Snippet Software testing often results in delays to market and high cost without assuring product reliability. Software reliability engineered testing (SRET), an AT&T...
Software testing often results in delays to market and high cost without assuring product reliability. Software-reliability-engineered testing carefully...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 61
SubjectTerms Application software
Automatic testing
Certification
Hardware
Life testing
Product testing
Reliability engineering
Software
Software systems
Software testing
System testing
Systems engineering and theory
Title Software reliability-engineered testing
URI https://ieeexplore.ieee.org/document/544239
https://www.proquest.com/docview/197401209
https://www.proquest.com/docview/28826714
Volume 29
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3dS8MwEA9uT_rgdCrO-VFB2FO35qNp-ijiGIK-6GBvpUkuIo5Otg7Rv94mzYYfe_Ct9C6lXO5ySe7udwhdyQRIjiUNWUxZyKQ0oRCxCqlKMJaGM-0u3O4f-GjM7ibxxONsu1oYAHDJZ9C3jy6Wr2dqaa_KBjGzcHUN1Ki0rC7VWgcMmPCAk9jaLyceZxZH6YD063E_PI9rpfJn_XVOZdiqq7UXDovQ5pK89pel7KvPX0iN__zfPbTrN5fBda0N-2gLijZqrRo3BN6O22jnGwrhAeo9Vkvxez6HYA7Tlxq3-yMEzwI6KC0SR_F8iMbD26ebUej7J4SKRqQMpYlASxFpzRWmAtJccwFGAZUsAUNk5akMUykHGz1TKRVMmTQ3WOeUKp7QI9QsZgUco0AlRILgimlVjYggjRMDhhsjIqETjTuot5Jtpjy4uO1xMc3cISNKM5LV0uigyzXnWw2osYGnbYW5pq_edlezlXlDW2Q4tS0FSVRRL9bUykJs2CMvYLZcZKQ6RPAEs5ONX-2ibZeI7coLT1GznC_hrNpnlPLcadgXgvXR-g
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT8MwDI5gHIADjwFiDFiRkDh1NI-m6REh0HheGBK3qkkchJg6tHVC8Otp0mzisQO3KnaiyonjJLY_I3QsEyA5ljRkMWUhk9KEQsQqpCrBWBrOtHtwu7vnvUd2_RQ_eZxtlwsDAC74DLr20_ny9VBN7FPZacwsXN0iWqrMPovrZK2Zy4AJDzmJrQZz4pFmcZSekm7d84ftccVU_uzAzqxcrtf52mOHRmijSV67k1J21ecvrMZ__vEGWvPHy-CsXg-baAGKJlqflm4IvCY30eo3HMItdPJQbcbv-QiCEQxeauTujxA8C-igtFgcxfM2ery86J_3Ql9BIVQ0ImUoTQRaikhrrjAVkOaaCzAKqGQJGCIrW2WYSjlY_5lKqWDKpLnBOqdU8YTuoEYxLGAXBSohEgRXTKuqRwRpnBgw3BgRCZ1o3EInU9lmysOL2yoXg8xdM6I0I1ktjRY6mnG-1ZAac3iaVpgz-rS1PZ2tzKvaOMOpLSpIooramVErHbGOj7yA4WSckeoawRPM9uaO2kHLvf7dbXZ7dX_TRisuLNslG-6jRjmawEF16ijloVttX6fD1Uc
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Software+reliability-engineered+testing&rft.jtitle=Computer+%28Long+Beach%2C+Calif.%29&rft.au=Musa%2C+J.D.&rft.date=1996-11-01&rft.pub=IEEE&rft.issn=0018-9162&rft.volume=29&rft.issue=11&rft.spage=61&rft.epage=68&rft_id=info:doi/10.1109%2F2.544239&rft.externalDocID=544239
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9162&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9162&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9162&client=summon