The Original Correlations in the Structural Properties and Surface Activity Changes of the CdSe-CdTe System Semiconductors

The influence of the number-average diameter and the average number of the most represented particles on surface-active (acid-base) properties using the semiconductor CdSe-CdTe system is traced. The correlations between structural characteristics (dav, nav) and the acid sites strength (pH of a surfa...

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Bibliographic Details
Published inProcedia engineering Vol. 152; pp. 627 - 633
Main Authors Kirovskaya, I.A., Bukashkina, T.L., Polonyankin, D.A.
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 2016
Subjects
acid-base characteristics
optimal materials
original correlations
semiconductor gas analysis
Semiconductors
structural
original correlations
Semiconductors
structural
optimal materials
semiconductor gas analysis
acid-base characteristics
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Summary:The influence of the number-average diameter and the average number of the most represented particles on surface-active (acid-base) properties using the semiconductor CdSe-CdTe system is traced. The correlations between structural characteristics (dav, nav) and the acid sites strength (pH of a surface isoelectric state-pHisi) attract the attention, representing a doubtless practical interest.
ISSN:1877-7058
1877-7058
DOI:10.1016/j.proeng.2016.07.666