Structural and optical temperature-dependent properties of PbS thin films deposited by radio frequency sputtering

• Published in: Materials science in semiconductor processing Vol. 91; pp. 188 - 193
• Main Authors: da Silva Filho, José Maria Clemente, Marques, Francisco Chagas
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01.03.2019
• Subjects: Amorphous lead sulfide; Microcrystalline lead sulfide; Sputtering; Thin films; Thin films; Amorphous lead sulfide; Microcrystalline lead sulfide; Sputtering

Lead sulfide (PbS) thin films deposited by radio frequency (RF) sputtering, in the 50–300 °C temperature range, were the subject of our investigation. We characterized the influence of deposition temperature on their structural, morphological, and optical properties by x-ray diffraction (XRD), atomi...