APA (7th ed.) Citation

Yoon, S., Kim, M. K., Kim, T. U., Jeon, D., Song, H., Suh, J., . . . Kim, D. J. (2024). Enhancing image resolution in single-side electrical resistance tomography (ERT) by utilizing theoretical sensitivity analysis: Experimental validation and application to cement mortar. Journal of Building Engineering, 84, 108480. https://doi.org/10.1016/j.jobe.2024.108480

Chicago Style (17th ed.) Citation

Yoon, Seyoon, Min Kyoung Kim, Tae Uk Kim, Dongho Jeon, Haemin Song, Jung-Il Suh, Jae Eun Oh, and Dong Joo Kim. "Enhancing Image Resolution in Single-side Electrical Resistance Tomography (ERT) by Utilizing Theoretical Sensitivity Analysis: Experimental Validation and Application to Cement Mortar." Journal of Building Engineering 84 (2024): 108480. https://doi.org/10.1016/j.jobe.2024.108480.

MLA (9th ed.) Citation

Yoon, Seyoon, et al. "Enhancing Image Resolution in Single-side Electrical Resistance Tomography (ERT) by Utilizing Theoretical Sensitivity Analysis: Experimental Validation and Application to Cement Mortar." Journal of Building Engineering, vol. 84, 2024, p. 108480, https://doi.org/10.1016/j.jobe.2024.108480.