Enhanced photoluminescence from strained Ge-on-Insulator surface-passivated with hydrogenated amorphous Si

We study influences of the Ge-on-Insulator (GOI) fabrication and its surface passivation by deposition of a hydrogenated amorphous Si (a-Si:H) layer on light emission properties from a strained Ge. It is shown that the GOI fabrication leads to drastic enhancements of room temperature photoluminescen...

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Bibliographic Details
Published inMaterials science in semiconductor processing Vol. 115; p. 105104
Main Authors Niikura, Kenta, Yamahata, Natsuki, Hoshi, Yusuke, Takamura, Tsukasa, Saito, Kimihiko, Konagai, Makoto, Sawano, Kentarou
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 15.08.2020
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