Enhanced photoluminescence from strained Ge-on-Insulator surface-passivated with hydrogenated amorphous Si
We study influences of the Ge-on-Insulator (GOI) fabrication and its surface passivation by deposition of a hydrogenated amorphous Si (a-Si:H) layer on light emission properties from a strained Ge. It is shown that the GOI fabrication leads to drastic enhancements of room temperature photoluminescen...
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Published in | Materials science in semiconductor processing Vol. 115; p. 105104 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier Ltd
15.08.2020
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Online Access | Get full text |
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