Intensive comparative study using X-Ray diffraction for investigating microstructural parameters and crystal defects of the novel nanostructural ZnGa2S4 thin films

• Published in: Superlattices and microstructures Vol. 143; p. 106544
• Main Authors: Akl, Alaa Ahmed, El Radaf, I.M., Hassanien, Ahmed Saeed
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01.07.2020
• Subjects: Crystal defects; Crystal structure; Microstructural parameters; Nanostructure thin films; Spray pyrolysis technique; Williamson-Hall equation; Crystal defects; Microstructural parameters; Spray pyrolysis technique; Nanostructure thin films; Crystal structure; Williamson-Hall equation

This paper is devoted to synthesizing good quality polycrystalline ZnGa2S4 thin films of different thicknesses using inexpensive pyrolysis technology for the first time. Then study the crystal structure, crystal defects and the microstructural properties of these films. The novel ternary ZnGa2S4 thi...