Suppression of ambipolar current in tunnel FETs using drain-pocket: Proposal and analysis
In this paper, we investigate the impact of a drain-pocket (DP) adjacent to the drain region in Tunnel Field-Effect Transistors (TFETs) to effectively suppress the ambipolar current. Using calibrated two-dimensional device simulation, we examine the impact of DP in Double Gate TFET (DGTFET). We demo...
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Published in | Superlattices and microstructures Vol. 113; pp. 261 - 270 |
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Format | Journal Article |
Language | English |
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Elsevier Ltd
01.01.2018
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Abstract | In this paper, we investigate the impact of a drain-pocket (DP) adjacent to the drain region in Tunnel Field-Effect Transistors (TFETs) to effectively suppress the ambipolar current. Using calibrated two-dimensional device simulation, we examine the impact of DP in Double Gate TFET (DGTFET). We demonstrate the superiority of the DP technique over the existing techniques in controlling the ambipolar current. In particular, the addition of DP to a TFET is able to fully suppress the ambipolar current even when TFET is biased at high negative gate voltages and drain doping is kept as high as the source doping. Moreover, adding DP is complementary to the well-known technique of employ-ing source-pocket (SP) in a TFET since both need similar doping type and doping concentration.
•Addition of a drain-pocket adjacent to the drain region in TFETs is proposed.•Suppress the ambipolar current even at high negative VGS and high drain doping.•Complementary to source-pocket since both need same doping type & concentration.•The technique of addition of DP is general in nature. |
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AbstractList | In this paper, we investigate the impact of a drain-pocket (DP) adjacent to the drain region in Tunnel Field-Effect Transistors (TFETs) to effectively suppress the ambipolar current. Using calibrated two-dimensional device simulation, we examine the impact of DP in Double Gate TFET (DGTFET). We demonstrate the superiority of the DP technique over the existing techniques in controlling the ambipolar current. In particular, the addition of DP to a TFET is able to fully suppress the ambipolar current even when TFET is biased at high negative gate voltages and drain doping is kept as high as the source doping. Moreover, adding DP is complementary to the well-known technique of employ-ing source-pocket (SP) in a TFET since both need similar doping type and doping concentration.
•Addition of a drain-pocket adjacent to the drain region in TFETs is proposed.•Suppress the ambipolar current even at high negative VGS and high drain doping.•Complementary to source-pocket since both need same doping type & concentration.•The technique of addition of DP is general in nature. |
Author | Garg, Shelly Saurabh, Sneh |
Author_xml | – sequence: 1 givenname: Shelly surname: Garg fullname: Garg, Shelly email: shellyg@iiitd.ac.in – sequence: 2 givenname: Sneh surname: Saurabh fullname: Saurabh, Sneh email: sneh@iiitd.ac.in |
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Cites_doi | 10.1109/LED.2007.901273 10.1109/LED.2014.2362926 10.1109/TED.2016.2577589 10.1109/TED.2010.2047066 10.1109/TED.2014.2365805 10.1109/TED.2009.2030831 10.1038/nature10679 10.1143/JJAP.48.064503 10.1103/PhysRevLett.93.196805 10.1109/JEDS.2014.2377576 10.1109/TED.2011.2128320 10.1109/TED.2013.2289739 10.1109/TED.2011.2144987 10.1109/TED.2010.2089525 10.1109/TED.2016.2619372 10.1109/LED.2009.2028907 10.1109/JPROC.2010.2066530 10.1109/TDMR.2010.2054095 10.1109/16.293351 10.1109/LED.2011.2165331 10.1109/TED.2016.2572610 10.1109/TED.2008.916711 10.1016/j.sse.2007.09.014 10.1109/TED.2015.2478955 10.1109/JEDS.2015.2390643 10.1109/TED.2004.842716 10.1109/TED.2010.2093142 10.1109/TED.2007.899389 10.1109/JPROC.2010.2070470 10.1109/JETCAS.2014.2361054 10.1109/T-ED.1986.22739 10.1109/TED.2013.2294792 10.1109/TED.2017.2656630 10.1109/TED.2015.2489844 10.1109/EDL.1984.25959 10.1109/TED.2013.2260237 10.1109/JEDS.2015.2390591 10.1038/nature15387 10.1063/1.2757593 10.1109/LED.2008.2005650 10.1109/JEDS.2014.2327626 |
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References | Silvaco (bib37) 2015 Baglee, Duvvury (bib32) Oct 1984; 5 Baravelli, Gnani, Gnudi, Reggiani, Baccarani (bib26) Feb. 2014; 61 Lee, Park, Lee, Nam, Shin (bib42) June 2015; 62 Khatami, Banerjee (bib5) Nov. 2009; 56 Boucart, Ionescu (bib14) July 2007; 54 Wu, Taur (bib28) Aug. 2016; 63 Wei, Oh, Wong (bib19) 2010 Saurabh, Kumar (bib41) September 2010; 10 Zhang, Fang, Xing, Seabaugh, Jena (bib16) Dec. 2008; 29 Ionescu, Riel (bib8) Nov. 2011; 479 Luisier, Klimeck (bib18) 2009 Yamaguchi, Iwamatsu, Joachim, Oda, Inoue, Nishimura, Tsukamoto (bib34) Jul 1994; 41 Abdi, Jagadesh Kumar (bib30) Nov. 2014; 2 Cao, Yao, Jiao, Huang, Yu, Li (bib43) July 2011; 58 Ko, Lee, Park, Shin (bib36) Dec. 2016; 63 Jhaveri, Nagavarapu, Woo (bib44) Jan. 2011; 58 Seabaugh, Zhang (bib7) Dec. 2010; 98 Saurabh, Kumar (bib31) Jun. 2009; 48 Kumar, Goel, Singh, Singh, Singh, Baral, Jit (bib29) Feb. 2017; 64 Li, Esseni, Nahas, Jena, Xing (bib20) May 2015; 3 Anghel, Hraziia, Gupta, Amara, Vladimirescu (bib24) June 2011; 58 Gandhi, Chen, Singh, Banerjee, Lee (bib35) Nov. 2011; 32 Saurabh, Kumar (bib13) 2016 Sant, Schenk (bib21) May 2016; 63 Bampi, Plummer (bib33) Nov 1986; 33 Bjrk, Knoch, Schmid, Riel, Riess (bib17) 2008; 92 Dagtekin, Ionescu (bib12) May 2015; 3 Choi, Park, Lee, Liu (bib2) Aug. 2007; 28 Mookerjea, Krishnan, Datta, Narayanan (bib47) Oct. 2009; 30 Saurabh, Kumar (bib38) Feb. 2011; 58 Bernstein, Cavin, Porod, Seabaugh, Welser (bib6) Dec. 2010; 98 Nagavarapu, Jhaveri, Woo (bib15) April 2008; 55 Tura, Woo (bib3) June 2010; 57 Morris, Avci, Rios, Young (bib10) Dec. 2014; 4 Avci, Morris, Young (bib11) May 2015; 3 Boucart, Ionescu (bib46) Nov 2007; 51 Kumar, Goel, Singh, Singh, Kumar, Jit (bib22) June 2016; 63 Verhulst, Vandenberghe, Maex, Groeseneken (bib23) Jul. 2007; 91 Appenzeller, Lin, Knoch, Avouris (bib1) Nov. 2004; 93 Sarkar, Xie, Liu, Cao, Kang, Gong, Kraemer, Ajayan, Banerjee (bib4) Oct. 2015; 526 Zhang, Fossum (bib40) Feb. 2005; 52 Baravelli, Gnani, Grassi, Gnudi, Reggiani, Baccarani (bib25) Jan. 2014; 61 Verreck, Verhulst, Kao, Vandenberghe, De Meyer, Groeseneken (bib45) July 2013; 60 Lu, Seabaugh (bib9) May 2014 Sahay, Kumar (bib27) Nov. 2015; 62 Abdi, Kumar (bib39) Dec. 2014; 35 Boucart (10.1016/j.spmi.2017.11.002_bib46) 2007; 51 Appenzeller (10.1016/j.spmi.2017.11.002_bib1) 2004; 93 Nagavarapu (10.1016/j.spmi.2017.11.002_bib15) 2008; 55 Verhulst (10.1016/j.spmi.2017.11.002_bib23) 2007; 91 Abdi (10.1016/j.spmi.2017.11.002_bib30) 2014; 2 Wei (10.1016/j.spmi.2017.11.002_bib19) 2010 Bampi (10.1016/j.spmi.2017.11.002_bib33) 1986; 33 Saurabh (10.1016/j.spmi.2017.11.002_bib13) 2016 Ko (10.1016/j.spmi.2017.11.002_bib36) 2016; 63 Zhang (10.1016/j.spmi.2017.11.002_bib40) 2005; 52 Verreck (10.1016/j.spmi.2017.11.002_bib45) 2013; 60 Lu (10.1016/j.spmi.2017.11.002_bib9) 2014 Boucart (10.1016/j.spmi.2017.11.002_bib14) 2007; 54 Sahay (10.1016/j.spmi.2017.11.002_bib27) 2015; 62 Choi (10.1016/j.spmi.2017.11.002_bib2) 2007; 28 Abdi (10.1016/j.spmi.2017.11.002_bib39) 2014; 35 Sant (10.1016/j.spmi.2017.11.002_bib21) 2016; 63 Gandhi (10.1016/j.spmi.2017.11.002_bib35) 2011; 32 Luisier (10.1016/j.spmi.2017.11.002_bib18) 2009 Kumar (10.1016/j.spmi.2017.11.002_bib29) 2017; 64 Khatami (10.1016/j.spmi.2017.11.002_bib5) 2009; 56 Baravelli (10.1016/j.spmi.2017.11.002_bib26) 2014; 61 Sarkar (10.1016/j.spmi.2017.11.002_bib4) 2015; 526 Wu (10.1016/j.spmi.2017.11.002_bib28) 2016; 63 Jhaveri (10.1016/j.spmi.2017.11.002_bib44) 2011; 58 Silvaco (10.1016/j.spmi.2017.11.002_bib37) 2015 Bjrk (10.1016/j.spmi.2017.11.002_bib17) 2008; 92 Yamaguchi (10.1016/j.spmi.2017.11.002_bib34) 1994; 41 Dagtekin (10.1016/j.spmi.2017.11.002_bib12) 2015; 3 Saurabh (10.1016/j.spmi.2017.11.002_bib38) 2011; 58 Ionescu (10.1016/j.spmi.2017.11.002_bib8) 2011; 479 Zhang (10.1016/j.spmi.2017.11.002_bib16) 2008; 29 Cao (10.1016/j.spmi.2017.11.002_bib43) 2011; 58 Morris (10.1016/j.spmi.2017.11.002_bib10) 2014; 4 Mookerjea (10.1016/j.spmi.2017.11.002_bib47) 2009; 30 Li (10.1016/j.spmi.2017.11.002_bib20) 2015; 3 Seabaugh (10.1016/j.spmi.2017.11.002_bib7) 2010; 98 Baglee (10.1016/j.spmi.2017.11.002_bib32) 1984; 5 Kumar (10.1016/j.spmi.2017.11.002_bib22) 2016; 63 Tura (10.1016/j.spmi.2017.11.002_bib3) 2010; 57 Bernstein (10.1016/j.spmi.2017.11.002_bib6) 2010; 98 Anghel (10.1016/j.spmi.2017.11.002_bib24) 2011; 58 Avci (10.1016/j.spmi.2017.11.002_bib11) 2015; 3 Saurabh (10.1016/j.spmi.2017.11.002_bib31) 2009; 48 Baravelli (10.1016/j.spmi.2017.11.002_bib25) 2014; 61 Lee (10.1016/j.spmi.2017.11.002_bib42) 2015; 62 Saurabh (10.1016/j.spmi.2017.11.002_bib41) 2010; 10 |
References_xml | – volume: 3 start-page: 88 year: May 2015 end-page: 95 ident: bib11 article-title: Tunnel field-effect transistors: prospects and challenges publication-title: IEEE J. Electron Dev. Soc. – volume: 54 start-page: 1725 year: July 2007 end-page: 1733 ident: bib14 article-title: Double-gate tunnel FET with high- gate dielectric publication-title: IEEE Trans. Electron Dev. – volume: 63 start-page: 3291 year: June 2016 end-page: 3299 ident: bib22 article-title: A compact 2D analytical model for electrical characteristics of double-gate tunnel field-effect transistors with a SiO2/high-k stacked gate-oxide structure publication-title: IEEE Trans. Electron Dev. – volume: 33 start-page: 1769 year: Nov 1986 end-page: 1779 ident: bib33 article-title: A modified lightly doped drain structure for VLSI MOSFET's publication-title: IEEE Trans. Electron Dev. – volume: 98 start-page: 2169 year: Dec. 2010 end-page: 2184 ident: bib6 article-title: De- vice and architecture outlook for beyond CMOS switches publication-title: Proc. IEEE – volume: 10 start-page: 390 year: September 2010 end-page: 395 ident: bib41 article-title: Estimation and compensation of process in- duced variations in nanoscale tunnel field effect transistors (TFETs) for im- proved reliability publication-title: IEEE Trans. Dev. Mater. Reliab. – volume: 2 start-page: 187 year: Nov. 2014 end-page: 190 ident: bib30 article-title: Controlling ambipolar current in tunneling FETs using overlapping gate-on-drain publication-title: IEEE J. Electron Dev. Soc. – volume: 62 start-page: 1778 year: June 2015 end-page: 1783 ident: bib42 article-title: Random variation anal- ysis and variation-aware design of symmetric tunnel field-effect transistor publication-title: IEEE Trans. Electron Dev. – volume: 58 start-page: 80 year: Jan. 2011 end-page: 86 ident: bib44 article-title: Effect of pocket doping and annealing schemes on the source-pocket tunnel field-effect transistor publication-title: IEEE Trans. Electron Dev. – volume: 91 start-page: 053102 year: Jul. 2007 end-page: 053103 ident: bib23 article-title: Tun- nel field-effect transistor without gate-drain overlap publication-title: Appl. Phys. Lett. – volume: 92 year: 2008 ident: bib17 article-title: Silicon nanowire tunneling field-effect transistors publication-title: Appl. Phys. Lett. – volume: 58 start-page: 1649 year: June 2011 end-page: 1654 ident: bib24 article-title: 30-nm Tunnel FET with improved performance and reduced ambipolar current publication-title: IEEE Trans. Electron Dev. – volume: 61 start-page: 178 year: Jan. 2014 end-page: 185 ident: bib25 article-title: Optimization of n- and p-type TFETs integrated on the same publication-title: IEEE Trans. Electron Dev. – volume: 5 start-page: 389 year: Oct 1984 end-page: 391 ident: bib32 article-title: Reduced hot-electron effects in MOSFET's with an optimized LDD Structure publication-title: IEEE Electron Dev. Lett. – start-page: 16.2.1 year: 2010 end-page: 16.2.4 ident: bib19 article-title: Performance benchmarks for Si, IIIV, TFET, and carbon nanotube FET - rethinking the technology assess- ment methodology for complementary logic applications publication-title: International Electron Devices Meeting – volume: 56 start-page: 2752 year: Nov. 2009 end-page: 2761 ident: bib5 article-title: Steep subthreshold slope n- and p-Type Tunnel-FET devices for low-power and energy-efficient digital circuits publication-title: IEEE Trans. Electron Dev. – volume: 60 start-page: 2128 year: July 2013 end-page: 2134 ident: bib45 article-title: Quantum mechanical performance predictions of p- n-i-n versus pocketed line tunnel field-effect transistors publication-title: IEEE Trans. Electron Dev. – volume: 30 start-page: 1102 year: Oct. 2009 end-page: 1104 ident: bib47 article-title: On enhanced miller capacitance effect in interband tunnel transistors publication-title: IEEE Electron Dev. Lett. – year: 2015 ident: bib37 article-title: Atlas Users Manual – volume: 4 start-page: 380 year: Dec. 2014 end-page: 388 ident: bib10 article-title: Design of low voltage tunneling-FET logic circuits considering asymmetric conduction character- istics publication-title: IEEE J. Emerg. Sel. Top. Circ. Syst. – volume: 63 start-page: 5030 year: Dec. 2016 end-page: 5035 ident: bib36 article-title: Vertical tunnel FET: de- sign optimization with triple metal-gate layers publication-title: IEEE Trans. Electron Dev. – volume: 3 start-page: 233 year: May 2015 end-page: 239 ident: bib12 article-title: Impact of super-linear onset, off-region due to uni-directional conductance and dominant publication-title: IEEE J. Electron Dev. Soc. – volume: 58 start-page: 404 year: Feb. 2011 end-page: 410 ident: bib38 article-title: Novel attributes of a dual mate- rial gate nanoscale tunnel field effect transistor publication-title: IEEE Trans. Electron Dev. – volume: 479 start-page: 329337 year: Nov. 2011 ident: bib8 article-title: Tunnel field-effect transistors as energy efficient electronic switches publication-title: Nature – volume: 35 start-page: 1170 year: Dec. 2014 end-page: 1172 ident: bib39 article-title: In-Built publication-title: IEEE Electron Dev. Lett. – volume: 526 start-page: 91 year: Oct. 2015 end-page: 95 ident: bib4 article-title: A subthermionic tunnel field-effect transistor with an atomically thin channel publication-title: Nature – year: 2016 ident: bib13 article-title: Fundamentals of Tunnel Field-effect Transis- Tors – volume: 28 start-page: 743 year: Aug. 2007 end-page: 745 ident: bib2 article-title: Tunneling field-effect transistors (TFETs) with subthreshold swing (SS) less than 60mV/dec publication-title: IEEE Electron Dev. Lett. – volume: 3 start-page: 200 year: May 2015 end-page: 207 ident: bib20 article-title: Two-Dimensional heterojunction interlayer tunneling field effect transistors (Thin-TFETs) publication-title: IEEE J. Electron Dev. Soc. – volume: 29 start-page: 1344 year: Dec. 2008 end-page: 1346 ident: bib16 article-title: Graphene nanorib- bon tunnel transistors publication-title: IEEE Electron Dev. Lett. – volume: 63 start-page: 2169 year: May 2016 end-page: 2175 ident: bib21 article-title: Methods to enhance the performance of InGaAs/InP heterojunction tunnel FETs publication-title: IEEE Trans. Electron Dev. – volume: 55 start-page: 1013 year: April 2008 end-page: 1019 ident: bib15 article-title: The tunnel source (PNPN) n-MOSFET: a novel high performance transistor publication-title: IEEE Trans. Electron Dev. – start-page: 1 year: 2009 end-page: 4 ident: bib18 article-title: Performance comparisons of tunneling field- effect transistors made of InSb, Carbon, and GaSb-InAs broken gap het- erostructures publication-title: IEEE International Electron Devices Meeting (IEDM) – volume: 48 year: Jun. 2009 ident: bib31 article-title: Impact of strain on drain current and thresh- old voltage of nanoscale double gate tunnel field effect transistor: theoretical investigation and analysis publication-title: Jpn. J. Appl. Phys. – volume: 41 start-page: 1222 year: Jul 1994 end-page: 1226 ident: bib34 article-title: Source-to-drain breakdown voltage im- provement in ultrathin-film SOI MOSFET's using a gate-overlapped LDD structure publication-title: IEEE Trans. Electron Dev. – volume: 63 start-page: 3342 year: Aug. 2016 end-page: 3345 ident: bib28 article-title: Reduction of TFET OFF-current and subthreshold swing by lightly doped drain publication-title: IEEE Trans. Electron Dev. – volume: 61 start-page: 473 year: Feb. 2014 end-page: 478 ident: bib26 article-title: TFET inverters with n-/p-Devices on the same technology platform for low- voltage/low-power applications publication-title: IEEE Trans. Electron Dev. – volume: 64 start-page: 960 year: Feb. 2017 end-page: 968 ident: bib29 article-title: 2D analytical modeling of the electrical characteristics of dual-material double-gate TFETs with a SiO2/HfO2 stacked gate-oxide structure publication-title: IEEE Trans. Electron Dev. – volume: 52 start-page: 263 year: Feb. 2005 end-page: 268 ident: bib40 article-title: On the threshold voltage of strained-Si- publication-title: IEEE Trans. Electron Dev. – volume: 57 start-page: 1362 year: June 2010 end-page: 1368 ident: bib3 article-title: Performance comparison of silicon steep sub- threshold FETs publication-title: IEEE Trans. Electron Dev. – volume: 98 start-page: 2095 year: Dec. 2010 end-page: 2110 ident: bib7 article-title: Low-Voltage tunnel transistors for beyond CMOS logic publication-title: Proc. IEEE – volume: 62 start-page: 3882 year: Nov. 2015 end-page: 3886 ident: bib27 article-title: Controlling the drain side tunneling width to reduce ambipolar current in tunnel FETs using heterodielectric BOX publication-title: IEEE Trans. Electron Dev. – volume: 32 start-page: 1504 year: Nov. 2011 end-page: 1506 ident: bib35 article-title: CMOS-compatible vertical-silicon-nanowire gate-all-around p-type tunneling FETs with publication-title: IEEE Electron Device Lett. – volume: 93 start-page: 196805-1 year: Nov. 2004 end-page: 196805-4 ident: bib1 article-title: Band- to-Band tunneling in carbon nanotube field-effect transistors publication-title: Phys. Rev. Lett. – start-page: 44 year: May 2014 end-page: 49 ident: bib9 article-title: Tunnel field-effect transistors: state-of-the-Art publication-title: J. Electron Dev. Soc. – volume: 58 start-page: 2122 year: July 2011 end-page: 2126 ident: bib43 article-title: Improve- ment in reliability of tunneling field-effect transistor with p-n-i-n Structure publication-title: IEEE Trans. Electron Dev. – volume: 51 start-page: 1500 year: Nov 2007 end-page: 1507 ident: bib46 article-title: Length scaling of the double gate tunnel FET with a High- Gate Dielectric publication-title: Solid State Electron. – start-page: 16.2.1 year: 2010 ident: 10.1016/j.spmi.2017.11.002_bib19 article-title: Performance benchmarks for Si, IIIV, TFET, and carbon nanotube FET - rethinking the technology assess- ment methodology for complementary logic applications – volume: 28 start-page: 743 issue: 8 year: 2007 ident: 10.1016/j.spmi.2017.11.002_bib2 article-title: Tunneling field-effect transistors (TFETs) with subthreshold swing (SS) less than 60mV/dec publication-title: IEEE Electron Dev. Lett. doi: 10.1109/LED.2007.901273 – volume: 35 start-page: 1170 issue: 12 year: 2014 ident: 10.1016/j.spmi.2017.11.002_bib39 article-title: In-Built N + pocket p-n-p-n tunnel field- effect transistor publication-title: IEEE Electron Dev. Lett. doi: 10.1109/LED.2014.2362926 – volume: 63 start-page: 3342 issue: 8 year: 2016 ident: 10.1016/j.spmi.2017.11.002_bib28 article-title: Reduction of TFET OFF-current and subthreshold swing by lightly doped drain publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2016.2577589 – volume: 57 start-page: 1362 year: 2010 ident: 10.1016/j.spmi.2017.11.002_bib3 article-title: Performance comparison of silicon steep sub- threshold FETs publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2010.2047066 – volume: 62 start-page: 1778 year: 2015 ident: 10.1016/j.spmi.2017.11.002_bib42 article-title: Random variation anal- ysis and variation-aware design of symmetric tunnel field-effect transistor publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2014.2365805 – volume: 56 start-page: 2752 year: 2009 ident: 10.1016/j.spmi.2017.11.002_bib5 article-title: Steep subthreshold slope n- and p-Type Tunnel-FET devices for low-power and energy-efficient digital circuits publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2009.2030831 – volume: 479 start-page: 329337 issue: 7373 year: 2011 ident: 10.1016/j.spmi.2017.11.002_bib8 article-title: Tunnel field-effect transistors as energy efficient electronic switches publication-title: Nature doi: 10.1038/nature10679 – volume: 48 year: 2009 ident: 10.1016/j.spmi.2017.11.002_bib31 article-title: Impact of strain on drain current and thresh- old voltage of nanoscale double gate tunnel field effect transistor: theoretical investigation and analysis publication-title: Jpn. J. Appl. Phys. doi: 10.1143/JJAP.48.064503 – volume: 93 start-page: 196805-1 year: 2004 ident: 10.1016/j.spmi.2017.11.002_bib1 article-title: Band- to-Band tunneling in carbon nanotube field-effect transistors publication-title: Phys. Rev. Lett. doi: 10.1103/PhysRevLett.93.196805 – volume: 3 start-page: 233 issue: 3 year: 2015 ident: 10.1016/j.spmi.2017.11.002_bib12 article-title: Impact of super-linear onset, off-region due to uni-directional conductance and dominant CGD on performance of TFET-based circuits publication-title: IEEE J. Electron Dev. Soc. doi: 10.1109/JEDS.2014.2377576 – volume: 58 start-page: 1649 year: 2011 ident: 10.1016/j.spmi.2017.11.002_bib24 article-title: 30-nm Tunnel FET with improved performance and reduced ambipolar current publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2011.2128320 – volume: 61 start-page: 178 issue: 1 year: 2014 ident: 10.1016/j.spmi.2017.11.002_bib25 article-title: Optimization of n- and p-type TFETs integrated on the same InAs/Alxtta1−xSb technology platform publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2013.2289739 – volume: 58 start-page: 2122 issue: 7 year: 2011 ident: 10.1016/j.spmi.2017.11.002_bib43 article-title: Improve- ment in reliability of tunneling field-effect transistor with p-n-i-n Structure publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2011.2144987 – volume: 58 start-page: 80 issue: 1 year: 2011 ident: 10.1016/j.spmi.2017.11.002_bib44 article-title: Effect of pocket doping and annealing schemes on the source-pocket tunnel field-effect transistor publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2010.2089525 – volume: 63 start-page: 5030 issue: 12 year: 2016 ident: 10.1016/j.spmi.2017.11.002_bib36 article-title: Vertical tunnel FET: de- sign optimization with triple metal-gate layers publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2016.2619372 – volume: 30 start-page: 1102 issue: 10 year: 2009 ident: 10.1016/j.spmi.2017.11.002_bib47 article-title: On enhanced miller capacitance effect in interband tunnel transistors publication-title: IEEE Electron Dev. Lett. doi: 10.1109/LED.2009.2028907 – volume: 98 start-page: 2169 issue: 12 year: 2010 ident: 10.1016/j.spmi.2017.11.002_bib6 article-title: De- vice and architecture outlook for beyond CMOS switches publication-title: Proc. IEEE doi: 10.1109/JPROC.2010.2066530 – volume: 10 start-page: 390 year: 2010 ident: 10.1016/j.spmi.2017.11.002_bib41 article-title: Estimation and compensation of process in- duced variations in nanoscale tunnel field effect transistors (TFETs) for im- proved reliability publication-title: IEEE Trans. Dev. Mater. Reliab. doi: 10.1109/TDMR.2010.2054095 – volume: 41 start-page: 1222 issue: 7 year: 1994 ident: 10.1016/j.spmi.2017.11.002_bib34 article-title: Source-to-drain breakdown voltage im- provement in ultrathin-film SOI MOSFET's using a gate-overlapped LDD structure publication-title: IEEE Trans. Electron Dev. doi: 10.1109/16.293351 – volume: 32 start-page: 1504 issue: 11 year: 2011 ident: 10.1016/j.spmi.2017.11.002_bib35 article-title: CMOS-compatible vertical-silicon-nanowire gate-all-around p-type tunneling FETs with <= 50-mV/decade subthreshold swing publication-title: IEEE Electron Device Lett. doi: 10.1109/LED.2011.2165331 – start-page: 1 year: 2009 ident: 10.1016/j.spmi.2017.11.002_bib18 article-title: Performance comparisons of tunneling field- effect transistors made of InSb, Carbon, and GaSb-InAs broken gap het- erostructures – volume: 63 start-page: 3291 issue: 8 year: 2016 ident: 10.1016/j.spmi.2017.11.002_bib22 article-title: A compact 2D analytical model for electrical characteristics of double-gate tunnel field-effect transistors with a SiO2/high-k stacked gate-oxide structure publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2016.2572610 – volume: 55 start-page: 1013 issue: 4 year: 2008 ident: 10.1016/j.spmi.2017.11.002_bib15 article-title: The tunnel source (PNPN) n-MOSFET: a novel high performance transistor publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2008.916711 – volume: 51 start-page: 1500 year: 2007 ident: 10.1016/j.spmi.2017.11.002_bib46 article-title: Length scaling of the double gate tunnel FET with a High- Gate Dielectric publication-title: Solid State Electron. doi: 10.1016/j.sse.2007.09.014 – volume: 62 start-page: 3882 issue: 11 year: 2015 ident: 10.1016/j.spmi.2017.11.002_bib27 article-title: Controlling the drain side tunneling width to reduce ambipolar current in tunnel FETs using heterodielectric BOX publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2015.2478955 – volume: 3 start-page: 200 issue: 3 year: 2015 ident: 10.1016/j.spmi.2017.11.002_bib20 article-title: Two-Dimensional heterojunction interlayer tunneling field effect transistors (Thin-TFETs) publication-title: IEEE J. Electron Dev. Soc. doi: 10.1109/JEDS.2015.2390643 – volume: 52 start-page: 263 issue: 2 year: 2005 ident: 10.1016/j.spmi.2017.11.002_bib40 article-title: On the threshold voltage of strained-Si- Si1−xttex MOSFETs publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2004.842716 – start-page: 44 year: 2014 ident: 10.1016/j.spmi.2017.11.002_bib9 article-title: Tunnel field-effect transistors: state-of-the-Art publication-title: J. Electron Dev. Soc. – volume: 58 start-page: 404 issue: 2 year: 2011 ident: 10.1016/j.spmi.2017.11.002_bib38 article-title: Novel attributes of a dual mate- rial gate nanoscale tunnel field effect transistor publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2010.2093142 – volume: 54 start-page: 1725 issue: 7 year: 2007 ident: 10.1016/j.spmi.2017.11.002_bib14 article-title: Double-gate tunnel FET with high- gate dielectric publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2007.899389 – volume: 98 start-page: 2095 issue: 12 year: 2010 ident: 10.1016/j.spmi.2017.11.002_bib7 article-title: Low-Voltage tunnel transistors for beyond CMOS logic publication-title: Proc. IEEE doi: 10.1109/JPROC.2010.2070470 – volume: 4 start-page: 380 year: 2014 ident: 10.1016/j.spmi.2017.11.002_bib10 article-title: Design of low voltage tunneling-FET logic circuits considering asymmetric conduction character- istics publication-title: IEEE J. Emerg. Sel. Top. Circ. Syst. doi: 10.1109/JETCAS.2014.2361054 – volume: 33 start-page: 1769 issue: 11 year: 1986 ident: 10.1016/j.spmi.2017.11.002_bib33 article-title: A modified lightly doped drain structure for VLSI MOSFET's publication-title: IEEE Trans. Electron Dev. doi: 10.1109/T-ED.1986.22739 – volume: 92 year: 2008 ident: 10.1016/j.spmi.2017.11.002_bib17 article-title: Silicon nanowire tunneling field-effect transistors publication-title: Appl. Phys. Lett. – volume: 61 start-page: 473 issue: 2 year: 2014 ident: 10.1016/j.spmi.2017.11.002_bib26 article-title: TFET inverters with n-/p-Devices on the same technology platform for low- voltage/low-power applications publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2013.2294792 – volume: 64 start-page: 960 issue: 3 year: 2017 ident: 10.1016/j.spmi.2017.11.002_bib29 article-title: 2D analytical modeling of the electrical characteristics of dual-material double-gate TFETs with a SiO2/HfO2 stacked gate-oxide structure publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2017.2656630 – volume: 63 start-page: 2169 issue: 5 year: 2016 ident: 10.1016/j.spmi.2017.11.002_bib21 article-title: Methods to enhance the performance of InGaAs/InP heterojunction tunnel FETs publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2015.2489844 – volume: 5 start-page: 389 issue: 10 year: 1984 ident: 10.1016/j.spmi.2017.11.002_bib32 article-title: Reduced hot-electron effects in MOSFET's with an optimized LDD Structure publication-title: IEEE Electron Dev. Lett. doi: 10.1109/EDL.1984.25959 – volume: 60 start-page: 2128 issue: 7 year: 2013 ident: 10.1016/j.spmi.2017.11.002_bib45 article-title: Quantum mechanical performance predictions of p- n-i-n versus pocketed line tunnel field-effect transistors publication-title: IEEE Trans. Electron Dev. doi: 10.1109/TED.2013.2260237 – year: 2016 ident: 10.1016/j.spmi.2017.11.002_bib13 – volume: 3 start-page: 88 issue: 3 year: 2015 ident: 10.1016/j.spmi.2017.11.002_bib11 article-title: Tunnel field-effect transistors: prospects and challenges publication-title: IEEE J. Electron Dev. Soc. doi: 10.1109/JEDS.2015.2390591 – year: 2015 ident: 10.1016/j.spmi.2017.11.002_bib37 – volume: 526 start-page: 91 year: 2015 ident: 10.1016/j.spmi.2017.11.002_bib4 article-title: A subthermionic tunnel field-effect transistor with an atomically thin channel publication-title: Nature doi: 10.1038/nature15387 – volume: 91 start-page: 053102 issue: 5 year: 2007 ident: 10.1016/j.spmi.2017.11.002_bib23 article-title: Tun- nel field-effect transistor without gate-drain overlap publication-title: Appl. Phys. Lett. doi: 10.1063/1.2757593 – volume: 29 start-page: 1344 year: 2008 ident: 10.1016/j.spmi.2017.11.002_bib16 article-title: Graphene nanorib- bon tunnel transistors publication-title: IEEE Electron Dev. Lett. doi: 10.1109/LED.2008.2005650 – volume: 2 start-page: 187 issue: 6 year: 2014 ident: 10.1016/j.spmi.2017.11.002_bib30 article-title: Controlling ambipolar current in tunneling FETs using overlapping gate-on-drain publication-title: IEEE J. Electron Dev. Soc. doi: 10.1109/JEDS.2014.2327626 |
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Snippet | In this paper, we investigate the impact of a drain-pocket (DP) adjacent to the drain region in Tunnel Field-Effect Transistors (TFETs) to effectively suppress... |
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SubjectTerms | Ambipolar current BTBT Drain pocket TFET Tunneling barrier width |
Title | Suppression of ambipolar current in tunnel FETs using drain-pocket: Proposal and analysis |
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