Comprehensive review on electrical noise analysis of TFET structures

• Published in: Superlattices and microstructures Vol. 161; p. 107101
• Main Authors: Chander, Sweta, Sinha, Sanjeet Kumar, Chaudhary, Rekha
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01.01.2022
• Subjects: Flicker noise; Random telegraph noise; Shot noise; Thermal noise; Tunneling; Tunneling; Thermal noise; Shot noise; Flicker noise; Random telegraph noise

Tunnel Filed Effect Transistors (TFETs) have appeared as an alternative for conventional CMOS due to their advantages like very low leakage current and steep sub-threshold slope. In semiconductor devices, noise is considered an undesired signal that can deteriorate the desired signal. In TFET struct...