APA (7th ed.) Citation

Hassan, S., Ahmed, S., Ali, M., & Fahad, S. (2022). Advanced electrical characterization of AlN/Si based heterogeneous junction for photonic applications. Materials science in semiconductor processing, 138, 106292. https://doi.org/10.1016/j.mssp.2021.106292

Chicago Style (17th ed.) Citation

Hassan, S., S. Ahmed, M. Ali, and S. Fahad. "Advanced Electrical Characterization of AlN/Si Based Heterogeneous Junction for Photonic Applications." Materials Science in Semiconductor Processing 138 (2022): 106292. https://doi.org/10.1016/j.mssp.2021.106292.

MLA (9th ed.) Citation

Hassan, S., et al. "Advanced Electrical Characterization of AlN/Si Based Heterogeneous Junction for Photonic Applications." Materials Science in Semiconductor Processing, vol. 138, 2022, p. 106292, https://doi.org/10.1016/j.mssp.2021.106292.