APA (7th ed.) Citation

Raad, B. R., Nigam, K., Sharma, D., & Kondekar, P. (2016). Performance investigation of bandgap, gate material work function and gate dielectric engineered TFET with device reliability improvement. Superlattices and microstructures, 94, 138-146. https://doi.org/10.1016/j.spmi.2016.04.016

Chicago Style (17th ed.) Citation

Raad, Bhagwan Ram, Kaushal Nigam, Dheeraj Sharma, and P.N Kondekar. "Performance Investigation of Bandgap, Gate Material Work Function and Gate Dielectric Engineered TFET with Device Reliability Improvement." Superlattices and Microstructures 94 (2016): 138-146. https://doi.org/10.1016/j.spmi.2016.04.016.

MLA (9th ed.) Citation

Raad, Bhagwan Ram, et al. "Performance Investigation of Bandgap, Gate Material Work Function and Gate Dielectric Engineered TFET with Device Reliability Improvement." Superlattices and Microstructures, vol. 94, 2016, pp. 138-146, https://doi.org/10.1016/j.spmi.2016.04.016.