Bai, J., Hu, B., Huo, S., & Li, M. (2024). Uncertainty Analysis Method for Electromagnetic Compatibility Simulation Based on Random Variable Black Box Model. Progress in electromagnetics research M Pier M, 123, 23-33. https://doi.org/10.2528/PIERM23100704
Chicago Style (17th ed.) CitationBai, Jinjun, Bing Hu, Shenghang Huo, and Ming Li. "Uncertainty Analysis Method for Electromagnetic Compatibility Simulation Based on Random Variable Black Box Model." Progress in Electromagnetics Research M Pier M 123 (2024): 23-33. https://doi.org/10.2528/PIERM23100704.
MLA (9th ed.) CitationBai, Jinjun, et al. "Uncertainty Analysis Method for Electromagnetic Compatibility Simulation Based on Random Variable Black Box Model." Progress in Electromagnetics Research M Pier M, vol. 123, 2024, pp. 23-33, https://doi.org/10.2528/PIERM23100704.