Brundle, C. R., Crist, B. V., & Bagus, P. S. (2021). Accuracy limitations for composition analysis by XPS using relative peak intensities: LiF as an example. Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 39(1), . https://doi.org/10.1116/6.0000674
Chicago Style (17th ed.) CitationBrundle, Christopher Richard, Bruce Vincent Crist, and Paul S. Bagus. "Accuracy Limitations for Composition Analysis by XPS Using Relative Peak Intensities: LiF as an Example." Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films 39, no. 1 (2021). https://doi.org/10.1116/6.0000674.
MLA (9th ed.) CitationBrundle, Christopher Richard, et al. "Accuracy Limitations for Composition Analysis by XPS Using Relative Peak Intensities: LiF as an Example." Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, vol. 39, no. 1, 2021, https://doi.org/10.1116/6.0000674.