Fault Analysis and Clearance in FL-APC DC-AC Converter
The traditional active neutral-point-clamped (APC) dc-ac converter maintains great common-mode voltage with high-frequency (CMV-HF) reduction capability, so it has limited voltage gain. This article presents a new five-level APC (FL-APC) dc-ac converter capable of voltage step-up in a single-stage i...
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Published in | Canadian journal of electrical and computer engineering Vol. 46; no. 1; pp. 1 - 6 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
Montreal
IEEE
01.01.2023
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
ISSN | 2694-1783 0840-8688 2694-1783 |
DOI | 10.1109/ICJECE.2022.3220090 |
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Abstract | The traditional active neutral-point-clamped (APC) dc-ac converter maintains great common-mode voltage with high-frequency (CMV-HF) reduction capability, so it has limited voltage gain. This article presents a new five-level APC (FL-APC) dc-ac converter capable of voltage step-up in a single-stage inversion. In the suggested design, a common ground not only reduces the CMV-HF but also improves dc-link voltage usage. While comparing with traditional two-stage FL-APC dc-ac converter, the proposed design has lower voltage stresses and greater uniformity. While improving overall efficiency, the suggested clamped dc-ac converter saves three power switches and a capacitor. Modeling and actual tests have proven the suggested APC inverter's overall operation, efficacy, and achievability. The proposed circuit is finally tested with fault clearance capability. |
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AbstractList | The traditional active neutral-point-clamped (APC) dc–ac converter maintains great common-mode voltage with high-frequency (CMV-HF) reduction capability, so it has limited voltage gain. This article presents a new five-level APC (FL-APC) dc–ac converter capable of voltage step-up in a single-stage inversion. In the suggested design, a common ground not only reduces the CMV-HF but also improves dc-link voltage usage. While comparing with traditional two-stage FL-APC dc–ac converter, the proposed design has lower voltage stresses and greater uniformity. While improving overall efficiency, the suggested clamped dc–ac converter saves three power switches and a capacitor. Modeling and actual tests have proven the suggested APC inverter’s overall operation, efficacy, and achievability. The proposed circuit is finally tested with fault clearance capability. |
Author | Suresh, K. Parimalasundar, E. |
Author_xml | – sequence: 1 givenname: K. orcidid: 0000-0003-3824-1304 surname: Suresh fullname: Suresh, K. email: sureshk340@gmail.com organization: Department of Electrical and Electronics Engineering (EEE), Christ (Deemed to be University), Bengaluru, India – sequence: 2 givenname: E. orcidid: 0000-0001-6124-2685 surname: Parimalasundar fullname: Parimalasundar, E. organization: Department of Electrical and Electronics Engineering (EEE), Sree Vidyanikethan Engineering College, Tirupati, India |
BookMark | eNqFkD1PwzAQhi1UJNrCL4DBEnPK-SOJPUamLUWVYIDZchxHShWcYqdI_fekSoeKhelOp_e5Oz0zNPGddwjdE1gQAvJpo16XarmgQOmCUQog4QpNaSZ5QnLBJhf9DZrFuANgAlI-RdnKHNoeF960x9hEbHyFVetMMN463Hi82ibFu8LPKikUVp3_caF34RZd16aN7u5c5-hztfxQL8n2bb1RxTaxVIo-ydKsZEZQUtcpMTkHZpnN8lwOowxKW9I0tU4CYbVgNq9KIUA6m1MueFXRks3R47h3H7rvg4u93nWHMDwbNc0FEZwIIYcUG1M2dDEGV-t9aL5MOGoC-iRIj4L0SZA-Cxoo-YeyTW_6pvN9ME37D_swso1z7uIapMB4xn4BeeFx_w |
CODEN | ICJEAP |
CitedBy_id | crossref_primary_10_1002_cta_3709 |
Cites_doi | 10.1109/TIE.2016.2598804 10.1109/TCSII.2015.2433351 10.1109/TPEL.2006.880351 10.1109/TIE.2014.2300063 10.1109/TCSI.2005.852919 10.1109/TIA.2016.2535099 10.1109/TPEL.2011.2157939 10.1109/TCSII.2008.2011609 10.1109/TPEL.2017.2688382 10.1109/81.852940 10.1109/TCSII.2008.922467 10.1109/TCSI.2006.879052 10.1109/63.903987 10.1109/TIE.2008.2009561 10.1049/iet-pel.2009.0339 10.1109/TPEL.2013.2245683 10.1109/28.833774 10.1109/TPEL.2017.2705705 10.1109/TIE.2005.862253 |
ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2023 |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2023 |
DBID | 97E RIA RIE AAYXX CITATION 7SC 7SP 8FD F28 FR3 JQ2 L7M L~C L~D |
DOI | 10.1109/ICJECE.2022.3220090 |
DatabaseName | IEEE Xplore (IEEE) IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) CrossRef Computer and Information Systems Abstracts Electronics & Communications Abstracts Technology Research Database ANTE: Abstracts in New Technology & Engineering Engineering Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional |
DatabaseTitle | CrossRef Technology Research Database Computer and Information Systems Abstracts – Academic Electronics & Communications Abstracts ProQuest Computer Science Collection Computer and Information Systems Abstracts Engineering Research Database Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering Computer and Information Systems Abstracts Professional |
DatabaseTitleList | Technology Research Database |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 2694-1783 |
EndPage | 6 |
ExternalDocumentID | 10_1109_ICJECE_2022_3220090 10050346 |
Genre | orig-research |
GroupedDBID | 0R~ 29B 4.4 5GY 6IK 97E AAJGR AASAJ AAWTH ABAZT ABJNI ABQJQ ABVLG ACGFS ACIWK AETIX AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 EBS EJD HZ~ ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL PQQKQ RIA RIE RNS TN5 VH1 AAYXX CITATION 7SC 7SP 8FD F28 FR3 JQ2 L7M L~C L~D |
ID | FETCH-LOGICAL-c298t-656b3a821ff51a7403c3c677982160bcb255ce9013f83c7db8809ec72484dd2b3 |
IEDL.DBID | RIE |
ISSN | 2694-1783 0840-8688 |
IngestDate | Mon Jun 30 05:25:28 EDT 2025 Tue Jul 01 01:59:51 EDT 2025 Thu Apr 24 22:59:39 EDT 2025 Wed Aug 27 02:14:28 EDT 2025 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 1 |
Language | English |
License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html https://doi.org/10.15223/policy-029 https://doi.org/10.15223/policy-037 |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c298t-656b3a821ff51a7403c3c677982160bcb255ce9013f83c7db8809ec72484dd2b3 |
Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
ORCID | 0000-0003-3824-1304 0000-0001-6124-2685 |
PQID | 2781841889 |
PQPubID | 46078 |
PageCount | 6 |
ParticipantIDs | ieee_primary_10050346 proquest_journals_2781841889 crossref_citationtrail_10_1109_ICJECE_2022_3220090 crossref_primary_10_1109_ICJECE_2022_3220090 |
ProviderPackageCode | CITATION AAYXX |
PublicationCentury | 2000 |
PublicationDate | 2023-01-01 |
PublicationDateYYYYMMDD | 2023-01-01 |
PublicationDate_xml | – month: 01 year: 2023 text: 2023-01-01 day: 01 |
PublicationDecade | 2020 |
PublicationPlace | Montreal |
PublicationPlace_xml | – name: Montreal |
PublicationTitle | Canadian journal of electrical and computer engineering |
PublicationTitleAbbrev | ICJECE |
PublicationYear | 2023 |
Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref13 ref12 ref15 ref14 ref20 ref11 ref10 ref2 ref1 ref17 ref16 ref19 ref18 ref8 ref7 ref9 ref4 ref3 ref6 ref5 |
References_xml | – ident: ref4 doi: 10.1109/TIE.2016.2598804 – ident: ref12 doi: 10.1109/TCSII.2015.2433351 – ident: ref10 doi: 10.1109/TPEL.2006.880351 – ident: ref3 doi: 10.1109/TIE.2014.2300063 – ident: ref8 doi: 10.1109/TCSI.2005.852919 – ident: ref15 doi: 10.1109/TIA.2016.2535099 – ident: ref19 doi: 10.1109/TIE.2016.2598804 – ident: ref11 doi: 10.1109/TPEL.2011.2157939 – ident: ref5 doi: 10.1109/TCSII.2008.2011609 – ident: ref14 doi: 10.1109/TPEL.2017.2688382 – ident: ref6 doi: 10.1109/81.852940 – ident: ref2 doi: 10.1109/TCSII.2008.922467 – ident: ref9 doi: 10.1109/TCSI.2006.879052 – ident: ref20 doi: 10.1109/63.903987 – ident: ref13 doi: 10.1109/TIE.2008.2009561 – ident: ref18 doi: 10.1049/iet-pel.2009.0339 – ident: ref7 doi: 10.1109/TPEL.2013.2245683 – ident: ref17 doi: 10.1109/28.833774 – ident: ref1 doi: 10.1109/TPEL.2017.2705705 – ident: ref16 doi: 10.1109/TIE.2005.862253 |
SSID | ssj0038054 |
Score | 2.3678768 |
Snippet | The traditional active neutral-point-clamped (APC) dc-ac converter maintains great common-mode voltage with high-frequency (CMV-HF) reduction capability, so it... The traditional active neutral-point-clamped (APC) dc–ac converter maintains great common-mode voltage with high-frequency (CMV-HF) reduction capability, so it... |
SourceID | proquest crossref ieee |
SourceType | Aggregation Database Enrichment Source Index Database Publisher |
StartPage | 1 |
SubjectTerms | Capacitors Circuit faults Circuits Clamping Clearances Common-mode voltage with high frequency (CMV-HF) Convertibility Design Electric power Energy efficiency fault analysis fault clearance five-level active neutral-point-clamped (FL-APC) dc-ac converter Stress Switches Topology Voltage Voltage control Voltage gain |
Title | Fault Analysis and Clearance in FL-APC DC-AC Converter |
URI | https://ieeexplore.ieee.org/document/10050346 https://www.proquest.com/docview/2781841889 |
Volume | 46 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3NS8MwFA9uJz34OXE6JQePtrZJmibHUVfm0OHBwW6lSVMQRyfaXvzrfemHTEXxUkqbQHkfye-l7_0eQpc5FQEgh9DxaRA6LM1zR3DOwN0lC7IQrMaz1cj3cz5dsNkyWLbF6nUtjDGmTj4zrr2t_-Vna13ZozLwcMtewngP9SBya4q1umWXCgAfLa2Q78nr22g2iSYQABLigtEClPC-bD11L5UfC3C9q8R7aN59T5NM8uxWpXL1-zeqxn9_8D7abfElHjcGcYC2THGIdjZYB48Qj9NqVeKOjgSnRYYj2z3CGgB-KnB854wfInwTOeMIRzYt3eZ9DtAinjxGU6dtn-BoIkXpAFJTNBXEz_PAT0HsVFPNw1DCI-4prSCa0AbwAM0F1WGmwJWl0SFhgmUZUfQY9Yt1YU4QzkBnHN4onWpQYSAAk2vfXnImfSWHiHSSTXTLLW5bXKySOsbwZNKoI7HqSFp1DNHV56SXhlrj7-EDK-CNoY1sh2jU6TBp_e8tISEAEeYLIU9_mXaGtm3n-OY0ZYT65WtlzgFflOqitqsPExHHAQ |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwED5BGYCBN6JQwAMjKUnsJPZYhVZtaSuGVuoWxY4jIaoUQbrw6znngQoIxBJFiS1Z97A_23ffAdyklHuIHALLoV5gsThNLe77DN1dMC8J0Gpsk408nvj9GRvOvXmVrF7kwmiti-Az3TavxV1-slQrc1SGHm7YS5i_CVu48HtOma5VT7yUI_yoiIUcW9wNwmE37OIW0HXbaLYIJuwvi09RTeXHFFysK719mNQjKsNJnturXLbV-zeyxn8P-QD2KoRJOqVJHMKGzo5gd4138Bj8Xrxa5KQmJCFxlpDQ1I8wJkCeMtIbWZ3HkNyHVickoQlMN5GfJzDrdadh36oKKFjKFTy3EKtJGnPXSVPPiVHwVFHlB4HAT74tlcT9hNKICGjKqQoSic4stApcxlmSuJKeQiNbZvoMSIJa8_GPVLFCJXocUblyzCNlwpGiCW4t2UhV7OKmyMUiKnYZtohKdURGHVGljibcfnZ6Kck1_m5-YgS81rSUbRNatQ6jygPfIjdAKMIczsX5L92uYbs_HY-i0WDycAE7po58ebbSgkb-utKXiDZyeVXY2AemBcpK |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Fault+Analysis+and+Clearance+in+FL-APC+DC%E2%80%93AC+Converter&rft.jtitle=Canadian+journal+of+electrical+and+computer+engineering&rft.au=Suresh%2C+K.&rft.au=Parimalasundar%2C+E.&rft.date=2023-01-01&rft.issn=2694-1783&rft.eissn=2694-1783&rft.volume=46&rft.issue=1&rft.spage=1&rft.epage=6&rft_id=info:doi/10.1109%2FICJECE.2022.3220090&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_ICJECE_2022_3220090 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2694-1783&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2694-1783&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2694-1783&client=summon |