Influence of spacer thickness reduction on bias level and peak asymmetry in SAL-biased MR heads

• Published in: IEEE transactions on magnetics Vol. 31; no. 6; pp. 2630 - 2632
• Main Authors: Mitsumata, C., Kobayashi, T., Liao, S.H.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01.11.1995; Institute of Electrical and Electronics Engineers
• Subjects: Applied sciences; Coercive force; Current density; Demagnetization; Electronics; Exact sciences and technology; Magnetic devices; Magnetic field measurement; Magnetic heads; Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.); domain-motion devices, etc; Magnetization; Pulse measurements; Rough surfaces; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Surface roughness; Testing; Thin films; Magnetoresistive device; Thickness; Thin film device; Magnetization; Bias voltage; Recording head; Magnetic head; Sensors; Experimental study; Magnetic device; Magnetic recording

The peak asymmetry relates to the bias level of a magnetoresistive sensor. However, the peak asymmetry is affected not only by bias level but also by the shape of the transfer curve. Measured MR bias level and peak asymmetry are less sensitive to bias current variation when the spacer thickness betw...