Influence of spacer thickness reduction on bias level and peak asymmetry in SAL-biased MR heads
The peak asymmetry relates to the bias level of a magnetoresistive sensor. However, the peak asymmetry is affected not only by bias level but also by the shape of the transfer curve. Measured MR bias level and peak asymmetry are less sensitive to bias current variation when the spacer thickness betw...
Saved in:
Published in | IEEE transactions on magnetics Vol. 31; no. 6; pp. 2630 - 2632 |
---|---|
Main Authors | , , |
Format | Journal Article Conference Proceeding |
Language | English |
Published |
New York, NY
IEEE
01.11.1995
Institute of Electrical and Electronics Engineers |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | The peak asymmetry relates to the bias level of a magnetoresistive sensor. However, the peak asymmetry is affected not only by bias level but also by the shape of the transfer curve. Measured MR bias level and peak asymmetry are less sensitive to bias current variation when the spacer thickness between MR and SAL is reduced. The numerical calculation shows that the magnetization distribution in the MR film becomes more uniform when a thinner spacer is used, indicating stronger magnetostatic coupling between layers. Calculated results of the peak asymmetry and the bias level versus bias current are in good agreement with the experimental data. |
---|---|
AbstractList | The peak asymmetry relates to the bias level of a magnetoresistive sensor. However, the peak asymmetry is affected not only by bias level but also by the shape of the transfer curve. Measured MR bias level and peak asymmetry are less sensitive to bias current variation when the spacer thickness between MR and SAL is reduced. The numerical calculation shows that the magnetization distribution in the MR film becomes more uniform when a thinner spacer is used, indicating stronger magnetostatic coupling between layers. Calculated results of the peak asymmetry and the bias level versus bias current are in good agreement with the experimental data. The peak asymmetry relates to a bias level of magnetoresistive sensor. However, the peak asymmetry is not only affected by a bias level, but is also influenced by the shape of transfer curve. Measured MR bias level and the peak asymmetry are less sensitive to the bias current variation when the spacer thickness between MR and SAL is reduced. The numerical calculation shows that the magnetization distribution in MR film becomes more uniform when a thinner spacer is used, indicating stronger magnetostatic coupling occurs between layers. Calculated results of the peak asymmetry and the bias level versus bias current is found in good agreement with the experimental data. The peak asymmetry relates to the bias level of a magnetoresistive sensor. However, the peak asymmetry is affected not only by bias level but also by the shape of the transfer curve. Measured MR bias level and peak asymmetry are less sensitive to bias current variation when the spacer thickness between MR and SAL is reduced. The numerical calculation shows that the magnetization distribution in the MR film becomes more uniform when a thinner spacer is used, indicating stronger magnetostatic coupling between layers. Calculated results of the peak asymmetry and the bias level versus bias current are in good agreement with the experimental data |
Author | Kobayashi, T. Liao, S.H. Mitsumata, C. |
Author_xml | – sequence: 1 givenname: C. surname: Mitsumata fullname: Mitsumata, C. organization: Magnetic & Electron. Mater. Res. Lab., Hitachi Metals Ltd., Saitama, Japan – sequence: 2 givenname: T. surname: Kobayashi fullname: Kobayashi, T. organization: Magnetic & Electron. Mater. Res. Lab., Hitachi Metals Ltd., Saitama, Japan – sequence: 3 givenname: S.H. surname: Liao fullname: Liao, S.H. |
BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=2911709$$DView record in Pascal Francis |
BookMark | eNqFkMtLw0AQhxepYFs9ePW0BxE8pM5unnsU8VGoCD7OYTuZ0NhkE3cTof-9W1J6FQaGYb75wXwzNjGtIcYuBSyEAHUnYREpgDQ-YVOhIhEAJGrCpgAiC1SURGds5ty3H6NYwJTlS1PWAxkk3pbcdRrJ8n5T4daQc9xSMWBftYb7Wlfa8Zp-qebaFLwjveXa7ZqGervjleEf96tgD1HBX9_5hnThztlpqWtHF4c-Z19Pj58PL8Hq7Xn54HmUKu2DUKSRDMOkoBIyRBmvVaLTMtZKKPA9I0yl_0dnEUJMQJigQpIJFAnCWodzdjPmdrb9Gcj1eVM5pLrWhtrB5TKLvB-Z_Q-Gibck9uDtCKJtnbNU5p2tGm13uYB87zqXkI-uPXt9CNUOdV1abbByxwOphEhBeexqxCoiOm4PGX-6I4bh |
CODEN | IEMGAQ |
Cites_doi | 10.1109/20.281327 10.1109/20.3399 10.1109/20.281308 10.1143/JJAP.28.2485 |
ContentType | Journal Article Conference Proceeding |
Copyright | 1996 INIST-CNRS |
Copyright_xml | – notice: 1996 INIST-CNRS |
DBID | IQODW AAYXX CITATION 7SC 7U5 8FD JQ2 L7M L~C L~D 7SP |
DOI | 10.1109/20.490075 |
DatabaseName | Pascal-Francis CrossRef Computer and Information Systems Abstracts Solid State and Superconductivity Abstracts Technology Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional Electronics & Communications Abstracts |
DatabaseTitle | CrossRef Technology Research Database Computer and Information Systems Abstracts – Academic ProQuest Computer Science Collection Computer and Information Systems Abstracts Solid State and Superconductivity Abstracts Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Professional Electronics & Communications Abstracts |
DatabaseTitleList | Technology Research Database Technology Research Database |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Physics Applied Sciences |
EISSN | 1941-0069 |
EndPage | 2632 |
ExternalDocumentID | 10_1109_20_490075 2911709 490075 |
GrantInformation_xml | – fundername: IEEE ; Magnetics Society |
GroupedDBID | -~X 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AASAJ ABQJQ ABVLG ACGFO ACGFS ACIWK ACNCT AENEX AETIX AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ H~9 IAAWW IBMZZ ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 MS~ O9- OCL P2P RIA RIE RIG RNS TN5 TWZ VH1 VJK XFK XXG ABPTK IQODW AAYXX CITATION 7SC 7U5 8FD JQ2 L7M L~C L~D 7SP |
ID | FETCH-LOGICAL-c297t-31742336def08cc25b96a7f5a91907f58ec72194a84c05e0ec6c9ce260d6c0ba3 |
IEDL.DBID | RIE |
ISSN | 0018-9464 |
IngestDate | Thu Aug 15 23:30:24 EDT 2024 Fri Aug 16 12:23:33 EDT 2024 Fri Aug 23 02:01:45 EDT 2024 Sun Oct 22 16:06:57 EDT 2023 Wed Jun 26 19:25:54 EDT 2024 |
IsPeerReviewed | false |
IsScholarly | true |
Issue | 6 |
Keywords | Thin films Magnetoresistive device Thickness Thin film device Magnetization Bias voltage Recording head Magnetic head Sensors Experimental study Magnetic device Magnetic recording |
Language | English |
License | CC BY 4.0 |
LinkModel | DirectLink |
MeetingName | INTERMAG'95 : IEEE international magnetics conference |
MergedId | FETCHMERGED-LOGICAL-c297t-31742336def08cc25b96a7f5a91907f58ec72194a84c05e0ec6c9ce260d6c0ba3 |
Notes | SourceType-Scholarly Journals-2 ObjectType-Feature-2 ObjectType-Conference Paper-1 content type line 23 SourceType-Conference Papers & Proceedings-1 ObjectType-Article-3 ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 |
PQID | 23646418 |
PQPubID | 23500 |
PageCount | 3 |
ParticipantIDs | proquest_miscellaneous_28411028 proquest_miscellaneous_23646418 crossref_primary_10_1109_20_490075 pascalfrancis_primary_2911709 ieee_primary_490075 |
PublicationCentury | 1900 |
PublicationDate | 1995-11-01 |
PublicationDateYYYYMMDD | 1995-11-01 |
PublicationDate_xml | – month: 11 year: 1995 text: 1995-11-01 day: 01 |
PublicationDecade | 1990 |
PublicationPlace | New York, NY |
PublicationPlace_xml | – name: New York, NY |
PublicationTitle | IEEE transactions on magnetics |
PublicationTitleAbbrev | TMAG |
PublicationYear | 1995 |
Publisher | IEEE Institute of Electrical and Electronics Engineers |
Publisher_xml | – name: IEEE – name: Institute of Electrical and Electronics Engineers |
References | ref2 ref1 ref4 ref3 |
References_xml | – ident: ref4 doi: 10.1109/20.281327 – ident: ref1 doi: 10.1109/20.3399 – ident: ref3 doi: 10.1109/20.281308 – ident: ref2 doi: 10.1143/JJAP.28.2485 |
SSID | ssj0014510 |
Score | 1.5052103 |
Snippet | The peak asymmetry relates to the bias level of a magnetoresistive sensor. However, the peak asymmetry is affected not only by bias level but also by the shape... The peak asymmetry relates to a bias level of magnetoresistive sensor. However, the peak asymmetry is not only affected by a bias level, but is also influenced... |
SourceID | proquest crossref pascalfrancis ieee |
SourceType | Aggregation Database Index Database Publisher |
StartPage | 2630 |
SubjectTerms | Applied sciences Coercive force Current density Demagnetization Electronics Exact sciences and technology Magnetic devices Magnetic field measurement Magnetic heads Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.); domain-motion devices, etc Magnetization Pulse measurements Rough surfaces Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Surface roughness Testing |
Title | Influence of spacer thickness reduction on bias level and peak asymmetry in SAL-biased MR heads |
URI | https://ieeexplore.ieee.org/document/490075 https://search.proquest.com/docview/23646418 https://search.proquest.com/docview/28411028 |
Volume | 31 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3dS9xAEF9UEOxDW09Lz2pdxNecm7jZ230UqdiiPvgBvoXdyQTkejm55B7sX-_M5u5QW6QQSEg2hOxs5iPzm98IcUg2awgmHyYOvE50FUziyctOjGa-NwCjI4jm8sqc3-lf9_n9nGc71sIgYgSf4YAPYy6_nMCMf5UdaccWblWsWpV1pVrLhIHO067aJLXcNV7PSYRS5Si8H3Q3vjI9sZcKIyF9Q5NRdV0s_lLI0cqcferKt5tITsjgktFg1oYB_HlD3fifL_BZfJx7m_KkWx6bYgXrnvjwgoOwJ9YjBhSaLVH8XDQskZNKkqYBnEqGw49YHcopk7yyGCVt4cE38jcDjqSvS_mIfiR98zQeYzt9kg-1vDm5SHgQlvLyWpLGL5ttcXf24_b0PJn3X0ggc8OW1DOncY9NiZWyAFkenPHDKveOvAjaWwSKH532VoPKUSEYcIAUIZUGVPDHX8RaPanxq5BkiivjgvKVpXjP-6DRBnKGyspbCJD1xcFCNMVjR7NRxPBEuSJTRTdvfdHjKV0OWJzdeyXD5eXMcVcd1xf7C5kW9OlwPsTXOJk1BXPnG53ad0ZYnbIHtvPPJ38TG7HAPVYm7oq1djrDPXJR2vA9Ls5nn3DlHA |
link.rule.ids | 310,311,315,786,790,795,796,802,23958,23959,25170,27955,27956,55107 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3fb9MwELbGJgQ8DCggyhizEK8pTuY49uM0beqg3QNs0t4i-3KRpm7p1KQP46_nzmkrBgghRUqUOIric-5H7rvvhPhENqsAkxeJA68TXQeTePKyE6OZ7w3A6AiimZ6b8aX-cpVfrXi2Yy0MIkbwGY74MObyqzks-VfZZ-3Ywj0SO2TmVdEXa21SBjpP-3qT1HLfeL2iEUqVowB_1N_6wPjEbiqMhfQtTUfd97H4QyVHO3P6vC_gbiM9IcNLZqNlF0bw4zfyxv98hRdid-VvyqN-gbwUW9gMxLNfWAgH4nFEgUL7SpRn65Ylcl5L0jWAC8mA-BkrRLlgmlcWpKQtXPtW3jDkSPqmknfoZ9K397e32C3u5XUjvx9NEh6ElZx-k6Tzq_a1uDw9uTgeJ6sODAlkruhIQXMi99BUWCsLkOXBGV_UuXfkR9DeIlAE6bS3GlSOCsGAA6QYqTKggj98I7abeYNvhSRjXBsXlK8tRXzeB402kDtU1d5CgGwoPq5FU971RBtlDFCUKzNV9vM2FAOe0s2A9dn9BzLcXM4c99VxQ3GwlmlJHw9nRHyD82VbMnu-0an9xwirU_bB3v31yQfiyfhiOiknZ-df98TTWO4e6xTfi-1uscR9cli68CEu1J_SGehw |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=IEEE+transactions+on+magnetics&rft.atitle=Influence+of+spacer+thickness+reduction+on+bias+level+and+peak+asymmetry+in+sal-biased+MR+heads&rft.au=MITSUMATA%2C+C&rft.au=KOBAYASHI%2C+T&rft.au=LIAO%2C+S.+H&rft.date=1995-11-01&rft.pub=Institute+of+Electrical+and+Electronics+Engineers&rft.issn=0018-9464&rft.eissn=1941-0069&rft.volume=31&rft.issue=6&rft.spage=2630&rft.epage=2632&rft_id=info:doi/10.1109%2F20.490075&rft.externalDBID=n%2Fa&rft.externalDocID=2911709 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9464&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9464&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9464&client=summon |