Risk Assessment of Post-Fault Temporary Overvoltage Using Generalized Short-Circuit Ratio - Xin, Huanhai; Liu, Xinyu; Zheng, Di; Chen, Dong; Zhou, Yuhan; Marshall, Benjamin (IEEE transactions on power systems, 2024)
Keywords: Circuit faults; Delays; Electric power systems; Electronic systems; Fault-ride-through; generalized short-circuit ratio; localization; multi-infeed power electronic system; Nodes; Overvoltage; Reactive power; Renewable energy sources; Risk assessment; Risk management; Short circuits; temporary overvoltage (TOV); Transient analysis; Voltage control