Towards Robust Pattern Recognition: A Review

• Published in: Proceedings of the IEEE Vol. 108; no. 6; pp. 894 - 922
• Main Authors: Zhang, Xu-Yao, Liu, Cheng-Lin, Suen, Ching Y.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.06.2020; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Accuracy; Big Data; Changing environments; Clean and big data; closed world; Distributed control; Human performance; Identification methods; independent and identically distributed; Machine intelligence; Machine learning; Neural networks; Pattern recognition; Pattern recognition systems; robust pattern recognition; Robustness; Task analysis; Task complexity

The accuracies for many pattern recognition tasks have increased rapidly year by year, achieving or even outperforming human performance. From the perspective of accuracy, pattern recognition seems to be a nearly solved problem. However, once launched in real applications, the high-accuracy pattern...