Reliability Evaluation and Failure Behavior Modeling of IMS Considering Functional and Physical Isolation Effects

Due to the integration of complex structure and artificial intelligence, the failure behavior of intelligent mechatronic system (IMS) is characterized by functional and physical dependences. In this article, the functional isolation and physical isolation (PI) effects caused by these dependences are...

Full description

Saved in:
Bibliographic Details
Published inIEEE/ASME transactions on mechatronics Vol. 24; no. 6; pp. 2441 - 2452
Main Authors Chen, Ying, Wang, Ze, Ma, Qichao, Liang, Kun
Format Journal Article
LanguageEnglish
Published New York IEEE 01.12.2019
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Artificial intelligence
Collision avoidance
Degradation
Design optimization
Failure analysis
Failure behavior
failure isolation
Failure mechanisms
Frequency modulation
functional dependence (FDEP)
intelligent mechatronic system (IMS)
Mechatronics
Modelling
Reliability analysis
Reliability engineering
reliability modeling
Stress
Online AccessGet full text
ISSN1083-4435
1941-014X
DOI10.1109/TMECH.2019.2950893

Cover

Abstract Due to the integration of complex structure and artificial intelligence, the failure behavior of intelligent mechatronic system (IMS) is characterized by functional and physical dependences. In this article, the functional isolation and physical isolation (PI) effects caused by these dependences are studied. We not only analyze the PI effect affecting the failure behaviors of components through failure mechanisms, but also propose a hierarchical method based on binary decision diagram for modeling system failure behavior affected by the PI and functional isolation effect. In the case study, an automatic collision avoidance system as an example of IMS is evaluated for the analysis of failure behavior, which is helpful for more realistic reliability assessment and design optimization.
AbstractList Due to the integration of complex structure and artificial intelligence, the failure behavior of intelligent mechatronic system (IMS) is characterized by functional and physical dependences. In this article, the functional isolation and physical isolation (PI) effects caused by these dependences are studied. We not only analyze the PI effect affecting the failure behaviors of components through failure mechanisms, but also propose a hierarchical method based on binary decision diagram for modeling system failure behavior affected by the PI and functional isolation effect. In the case study, an automatic collision avoidance system as an example of IMS is evaluated for the analysis of failure behavior, which is helpful for more realistic reliability assessment and design optimization.
Author Wang, Ze
Ma, Qichao
Liang, Kun
Chen, Ying
Author_xml – sequence: 1
  givenname: Ying
  orcidid: 0000-0002-6527-4251
  surname: Chen
  fullname: Chen, Ying
  email: cheny@buaa.edu.cn
  organization: Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and System Engineering, Beihang University, Beijing, China
– sequence: 2
  givenname: Ze
  orcidid: 0000-0002-0918-5342
  surname: Wang
  fullname: Wang, Ze
  email: wangze0409@buaa.edu.cn
  organization: Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and System Engineering, Beihang University, Beijing, China
– sequence: 3
  givenname: Qichao
  orcidid: 0000-0002-4736-9388
  surname: Ma
  fullname: Ma, Qichao
  email: maqichao@buaa.edu.cn
  organization: Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and System Engineering, Beihang University, Beijing, China
– sequence: 4
  givenname: Kun
  orcidid: 0000-0001-9319-397X
  surname: Liang
  fullname: Liang, Kun
  email: liangkun@mtrc.ac.cn
  organization: Microsystem & Terahertz Research Center, China Academy of Engineering Physics, Chengdu, China
BookMark eNp9kFFPwjAQgBuDiYD-AX1Z4vOwt26jfVQCQgLRKCa-LbW7Sslcsd1I-PdujPjggy_Xa3PfXe8bkF5pSyTkGugIgIq79Wo6mY8iCmIUiYRywc5IH0QMIYX4vdfklLMwjllyQQbebymlMVDok-8XLIz8MIWpDsF0L4taVsaWgSzzYCZNUTsMHnAj98a6YGXzprr8DKwOFqvXYGJLb3J07dOsLlVLyuLIPm8O3qjmsvC26FpOtUZV-UtyrmXh8ep0DsnbbLqezMPl0-Nicr8MVbNBFeZpOmZpzqRgCfCcRmIMeqxziLXCWLIUJEUhmVIgE4wiJZOUp7lAQB2LBNmQ3HZ9d85-1-irbGtr1_zPZxFjLGECmjAkUVelnPXeoc52znxJd8iAZq3a7Kg2a9VmJ7UNxP9AylTHJSvXOPsfvelQg4i_szjnYpxw9gOms4oR
CODEN IATEFW
CitedBy_id crossref_primary_10_1016_j_anucene_2021_108812
crossref_primary_10_1016_j_anucene_2024_110841
crossref_primary_10_1109_TMECH_2023_3341851
crossref_primary_10_1109_TR_2022_3172565
crossref_primary_10_1177_1748006X211041848
crossref_primary_10_1016_j_cja_2021_06_012
crossref_primary_10_1016_j_cja_2021_12_009
Cites_doi 10.1016/S0957-4158(03)00041-2
10.1016/j.ress.2016.06.013
10.1109/RAMS.2011.5754429
10.1109/3516.828590
10.1016/j.ress.2011.05.007
10.1109/RAMS.2006.1677364
10.1016/j.ress.2003.10.009
10.1109/RAMS.2006.1677413
10.1109/RAMS.2015.7105169
10.1109/ACCESS.2018.2865239
10.1109/RAM.2018.8463129
10.1109/TSMCA.2011.2170415
10.1109/RAMS.2010.5447994
10.1109/TMECH.2014.2312795
10.1016/j.ress.2010.02.003
10.1016/j.ress.2018.06.022
10.1016/j.ress.2016.11.007
10.1016/j.ress.2006.09.004
10.1177/1748006X17709376
10.1109/AIM.2001.936467
10.1016/j.ress.2018.03.031
10.1109/TR.2014.2299431
10.1109/TR.2008.2011855
10.1109/TMECH.2004.834655
10.1016/j.ress.2015.07.012
10.1201/b19094-290
10.1109/TMECH.2003.820021
10.1016/j.ress.2015.02.002
10.1109/TR.2013.2285045
10.1109/TMECH.2014.2316211
10.1109/RAM.2018.8463106
10.1109/TMECH.2009.2029572
10.1016/S1367-5788(98)00002-9
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019
DBID 97E
RIA
RIE
AAYXX
CITATION
7SC
7SP
7TB
8FD
FR3
JQ2
L7M
L~C
L~D
DOI 10.1109/TMECH.2019.2950893
DatabaseName IEEE Xplore (IEEE)
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Computer and Information Systems Abstracts
Electronics & Communications Abstracts
Mechanical & Transportation Engineering Abstracts
Technology Research Database
Engineering Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
DatabaseTitle CrossRef
Technology Research Database
Computer and Information Systems Abstracts – Academic
Mechanical & Transportation Engineering Abstracts
Electronics & Communications Abstracts
ProQuest Computer Science Collection
Computer and Information Systems Abstracts
Engineering Research Database
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts Professional
DatabaseTitleList
Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1941-014X
EndPage 2452
ExternalDocumentID 10_1109_TMECH_2019_2950893
8889758
Genre orig-research
GrantInformation_xml – fundername: National Natural Science Foundation of China
  grantid: 61503014; 61573043; 71671009
  funderid: 10.13039/501100001809
GroupedDBID -~X
0R~
29I
4.4
5GY
5VS
6IK
97E
9M8
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFS
ACIWK
ACKIV
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
EBS
EJD
F5P
H~9
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
OCL
RIA
RIE
RNS
TN5
VH1
AAYXX
CITATION
RIG
7SC
7SP
7TB
8FD
FR3
JQ2
L7M
L~C
L~D
ID FETCH-LOGICAL-c295t-d66736d3a93518d02971f7fd14fce4a361a0e9a3cc1a5e22ca5686d9e1ef495e3
IEDL.DBID RIE
ISSN 1083-4435
IngestDate Mon Jun 30 10:22:56 EDT 2025
Tue Jul 01 04:23:18 EDT 2025
Thu Apr 24 23:03:23 EDT 2025
Wed Aug 27 02:38:56 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 6
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
https://doi.org/10.15223/policy-029
https://doi.org/10.15223/policy-037
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c295t-d66736d3a93518d02971f7fd14fce4a361a0e9a3cc1a5e22ca5686d9e1ef495e3
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ORCID 0000-0002-6527-4251
0000-0002-4736-9388
0000-0001-9319-397X
0000-0002-0918-5342
PQID 2333539135
PQPubID 85420
PageCount 12
ParticipantIDs crossref_citationtrail_10_1109_TMECH_2019_2950893
ieee_primary_8889758
proquest_journals_2333539135
crossref_primary_10_1109_TMECH_2019_2950893
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2019-Dec.
2019-12-00
20191201
PublicationDateYYYYMMDD 2019-12-01
PublicationDate_xml – month: 12
  year: 2019
  text: 2019-Dec.
PublicationDecade 2010
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE/ASME transactions on mechatronics
PublicationTitleAbbrev TMECH
PublicationYear 2019
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References ref35
ref13
ref34
ref12
ref37
ref15
ref36
ref14
ref31
ref30
ref33
ref11
ref32
ref2
ref1
ref17
ref16
ref18
norell bergendahl (ref10) 2009
ref26
ref25
ref20
xing (ref23) 2006
ref22
ref21
ref28
ref27
ref29
zhao (ref19) 2017; 34
ref8
ref7
xu (ref6) 2010; 15
ref9
ref4
ref3
ref5
wang (ref24) 2017; 4
References_xml – ident: ref1
  doi: 10.1016/S0957-4158(03)00041-2
– ident: ref13
  doi: 10.1016/j.ress.2016.06.013
– ident: ref33
  doi: 10.1109/RAMS.2011.5754429
– ident: ref7
  doi: 10.1109/3516.828590
– ident: ref16
  doi: 10.1016/j.ress.2011.05.007
– start-page: 594
  year: 2006
  ident: ref23
  article-title: Integrated modeling for wireless sensor networks reliability and security
  publication-title: Proc Annu Rel Maintainability Symp
– volume: 4
  start-page: 241
  year: 2017
  ident: ref24
  article-title: Reliability of systems subject to competing failure propagation and probabilistic
  publication-title: Int J Syst Sci Oper Logist
– ident: ref11
  doi: 10.1109/RAMS.2006.1677364
– ident: ref36
  doi: 10.1016/j.ress.2003.10.009
– ident: ref21
  doi: 10.1109/RAMS.2006.1677413
– ident: ref25
  doi: 10.1109/RAMS.2015.7105169
– ident: ref29
  doi: 10.1109/ACCESS.2018.2865239
– ident: ref26
  doi: 10.1109/RAM.2018.8463129
– ident: ref34
  doi: 10.1109/TSMCA.2011.2170415
– ident: ref32
  doi: 10.1109/RAMS.2010.5447994
– ident: ref9
  doi: 10.1109/TMECH.2014.2312795
– ident: ref15
  doi: 10.1016/j.ress.2010.02.003
– start-page: 55
  year: 2009
  ident: ref10
  article-title: Modeling and analyzing fault-tolerant mechatronic systems
  publication-title: Proc 17th Int Conf Eng Des
– ident: ref30
  doi: 10.1016/j.ress.2018.06.022
– ident: ref28
  doi: 10.1016/j.ress.2016.11.007
– ident: ref17
  doi: 10.1016/j.ress.2006.09.004
– ident: ref14
  doi: 10.1177/1748006X17709376
– ident: ref3
  doi: 10.1109/AIM.2001.936467
– ident: ref22
  doi: 10.1016/j.ress.2018.03.031
– ident: ref31
  doi: 10.1109/TR.2014.2299431
– ident: ref18
  doi: 10.1109/TR.2008.2011855
– ident: ref5
  doi: 10.1109/TMECH.2004.834655
– ident: ref35
  doi: 10.1016/j.ress.2015.07.012
– ident: ref2
  doi: 10.1201/b19094-290
– ident: ref4
  doi: 10.1109/TMECH.2003.820021
– ident: ref27
  doi: 10.1016/j.ress.2015.02.002
– ident: ref37
  doi: 10.1109/TR.2013.2285045
– ident: ref12
  doi: 10.1109/TMECH.2014.2316211
– volume: 34
  start-page: 27
  year: 2017
  ident: ref19
  article-title: A hierarchical combinatorial reliability model for smart home systems
  publication-title: Qual Rel Eng Int
– ident: ref20
  doi: 10.1109/RAM.2018.8463106
– volume: 15
  start-page: 652
  year: 2010
  ident: ref6
  article-title: Magnetic sensing system design for intelligent vehicle guidance
  publication-title: IEEE/ASME Trans Mechatronics
  doi: 10.1109/TMECH.2009.2029572
– ident: ref8
  doi: 10.1016/S1367-5788(98)00002-9
SSID ssj0004101
Score 2.330041
Snippet Due to the integration of complex structure and artificial intelligence, the failure behavior of intelligent mechatronic system (IMS) is characterized by...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 2441
SubjectTerms Artificial intelligence
Collision avoidance
Degradation
Design optimization
Failure analysis
Failure behavior
failure isolation
Failure mechanisms
Frequency modulation
functional dependence (FDEP)
intelligent mechatronic system (IMS)
Mechatronics
Modelling
Reliability analysis
Reliability engineering
reliability modeling
Stress
Title Reliability Evaluation and Failure Behavior Modeling of IMS Considering Functional and Physical Isolation Effects
URI https://ieeexplore.ieee.org/document/8889758
https://www.proquest.com/docview/2333539135
Volume 24
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1bS8MwGP3Y9qQP3qY4nZIH37Td0ly6PMrY2ISJ4AZ7K2magiib7vKgv95c2nlFfCslCaEnbc6Xft85ABeUZLEUkgVUpLEJUBgNJI9tEoDkNNWGkzv54tEtH0zozZRNK3C1qYXRWrvkMx3aS_cvP5urtT0qa5loTRh-W4WqCdx8rdZHDSR2VsfYUIqAGg5QFsi0RWs86nUHNotLhJE1PRXkyybkXFV-fIrd_tLfhVE5M59W8hiuV2mo3r6JNv536nuwUxBNdO1Xxj5U9OwAtj_JD9bhxeYje53uV9TbyH4jOctQXz7YhHVU6CcukDVNs6XraJ6j4egelU6f9lbfbI7-TNH1vSuwR0OzsP2QXiR5eQiTfm_cHQSFBUOgzKNaBZl1BeUZkYIw3Mms0xXO4zzDNFeaSsKxbGshiVJYMh1FSjLe4ZnQWOcm9NLkCGqz-UwfA-ImclGaCKwUpx0ZCRVhLqlQlBgWQ-MG4BKTRBX65NYm4ylxcUpbJA7HxOKYFDg24HLT59mrc_zZum6B2bQsMGlAs4Q-KV7gZRIRQpiZLGEnv_c6hS07ts9saUJttVjrM8NPVum5W5jvKB_gjA
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3JTsMwEB2xHIADO6KsPnCDlDpeUh9R1agFUiFRJG6R6zgSArXQ5QBfj5ckrELcosiTWHlOZsaZeQ_ghJIskkKygIpBZBIURgPJI1sEIDkdaBOTO_ripMc7d_Tynt3PwVnVC6O1dsVnum4P3b_8bKRmdqvs3GRrwsS387Bo_D7DvlvrowsSO7FjbIKKgJoooGyRaYjzftJudWwdl6iHVvZUkC9uyOmq_PgYOw8Tr0FSzs0XljzWZ9NBXb19o2387-TXYbUINdGFXxsbMKeHm7DyiYBwC15sRbJn6n5F7Yr4G8lhhmL5YEvWUcGgOEZWNs02r6NRjrrJLSq1Pu2p2LhHv6vobG8K9FHXLG1_SU-TPNmGu7jdb3WCQoQhUOZRTYPM6oLyjEhBGG5mVusK51GeYZorTSXhWDa0kEQpLJkOQyUZb_JMaKxzk3xpsgMLw9FQ7wLiJndRmgisFKdNGQoVYi6pUJSYOIZGNcAlJqkqGMqtUMZT6jKVhkgdjqnFMS1wrMFpZfPs-Tn-HL1lgalGFpjU4KCEPi1e4UkaEkKYmSxhe79bHcNSp59cp9fd3tU-LNv7-DqXA1iYjmf60EQr08GRW6TvBgbj1Q
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Reliability+Evaluation+and+Failure+Behavior+Modeling+of+IMS+Considering+Functional+and+Physical+Isolation+Effects&rft.jtitle=IEEE%2FASME+transactions+on+mechatronics&rft.au=Chen%2C+Ying&rft.au=Wang%2C+Ze&rft.au=Ma%2C+Qichao&rft.au=Liang%2C+Kun&rft.date=2019-12-01&rft.issn=1083-4435&rft.eissn=1941-014X&rft.volume=24&rft.issue=6&rft.spage=2441&rft.epage=2452&rft_id=info:doi/10.1109%2FTMECH.2019.2950893&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TMECH_2019_2950893
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1083-4435&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1083-4435&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1083-4435&client=summon