A Method for Representing Non-Standard Waveform in Factory Tests Using Impulse Waveforms - Wickert, Humberto Margel; Marchesan, Tiago Bandeira (IEEE transactions on power delivery, 2022)
Keywords: Amplitudes; Entropy; Frequency ranges; high-voltage techniques; impulse testing; Laboratory tests; Lightning; Multiresolution analysis; non-standard waveform; power system transients; Test equipment; Transient analysis; Voltage control; voltage peak amplitude; Waveforms; Wavelet analysis; Wavelet transforms