Using Transitional Points in the Optical Injection Locking Behavior of a Semiconductor Laser to Extract Its Dimensionless Operating Parameters

The complete set of intrinsic dimensionless parameters of a packaged and fiber-pigtailed distributed feedback (DFB) semiconductor laser are extracted from the non-linear operational stability boundaries of the optical-injection-locking (OIL) architecture. Specifically, this procedure is done by rela...

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Published inIEEE journal of selected topics in quantum electronics Vol. 28; no. 1: Semiconductor Lasers; pp. 1 - 9
Main Authors Herrera, Daniel, Kovanis, Vassilios, Lester, Luke
Format Journal Article
LanguageEnglish
Published New York IEEE 01.01.2022
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Abstract The complete set of intrinsic dimensionless parameters of a packaged and fiber-pigtailed distributed feedback (DFB) semiconductor laser are extracted from the non-linear operational stability boundaries of the optical-injection-locking (OIL) architecture. Specifically, this procedure is done by relating the intrinsic parameters to the injection ratios corresponding to the Hopf bifurcation points at zero detuning, as well as the detuning of the Hopf-Saddle-Node point. The bifurcation points of the injected laser's operational space are found by coupling its output into a high-resolution optical spectrum analyzer. This is enabled by establishing a 30 dB side mode suppression ratio between the central mode and Period 1 oscillations to define the boundaries of Stable Locking. Along with the laser's threshold current and free-running relaxation oscillation frequencies, performing these measurements over a range of pumping values allows for the calculation of the laser's linewidth enhancement factor, irrespective of the device packaging. Utilizing a high pump approximation, the remaining dimensionless parameters are extracted after obtaining the photon lifetime. Using this approach, the operational capabilities of an arbitrarily-packaged laser can be determined, allowing for the analysis of an injected laser's operational space for a variety high-frequency and dynamical applications.
AbstractList The complete set of intrinsic dimensionless parameters of a packaged and fiber-pigtailed distributed feedback (DFB) semiconductor laser are extracted from the non-linear operational stability boundaries of the optical-injection-locking (OIL) architecture. Specifically, this procedure is done by relating the intrinsic parameters to the injection ratios corresponding to the Hopf bifurcation points at zero detuning, as well as the detuning of the Hopf-Saddle-Node point. The bifurcation points of the injected laser's operational space are found by coupling its output into a high-resolution optical spectrum analyzer. This is enabled by establishing a 30 dB side mode suppression ratio between the central mode and Period 1 oscillations to define the boundaries of Stable Locking. Along with the laser's threshold current and free-running relaxation oscillation frequencies, performing these measurements over a range of pumping values allows for the calculation of the laser's linewidth enhancement factor, irrespective of the device packaging. Utilizing a high pump approximation, the remaining dimensionless parameters are extracted after obtaining the photon lifetime. Using this approach, the operational capabilities of an arbitrarily-packaged laser can be determined, allowing for the analysis of an injected laser's operational space for a variety high-frequency and dynamical applications.
The complete set of intrinsic dimensionless parameters of a packaged and fiber-pigtailed distributed feedback (DFB) semiconductor laser are extracted from the non-linear operational stability boundaries of the optical-injection-locking (OIL) architecture. Specifically, this procedure is done by relating the intrinsic parameters to the injection ratios corresponding to the Hopf bifurcation points at zero detuning, as well as the detuning of the Hopf-Saddle-Node point. The bifurcation points of the injected laser's operational space are found by coupling its output into a high-resolution optical spectrum analyzer. This is enabled by establishing a 30 dB side mode suppression ratio between the central mode and Period 1 oscillations to define the boundaries of Stable Locking. Along with the laser's threshold current and free-running relaxation oscillation frequencies, performing these measurements over a range of pumping values allows for the calculation of the laser's linewidth enhancement factor, irrespective of the device packaging. Utilizing a high pump approximation, the remaining dimensionless parameters are extracted after obtaining the photon lifetime. Using this approach, the operational capabilities of an arbitrarily-packaged laser can be determined, allowing for the analysis of an injected laser's operational space for a variety high-frequency and dynamical applications.
Author Herrera, Daniel
Kovanis, Vassilios
Lester, Luke
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Cites_doi 10.1364/OL.42.003181
10.1109/50.541231
10.1063/1.5142449
10.1109/68.920741
10.1364/OE.18.027028
10.1364/OL.34.000812
10.1109/68.475769
10.3390/photonics6040103
10.1109/JPHOT.2013.2267535
10.1109/3.291366
10.1109/CLEOE-IQEC.2013.6800695
10.1364/OL.38.000344
10.1109/JLT.2014.2332415
10.1109/68.623251
10.1016/S0030-4018(02)02192-2
10.1109/JSTQE.2004.835296
10.1109/68.393181
10.1109/JQE.2004.828237
10.1016/j.physrep.2005.06.003
10.1109/MAP.2020.3021391
10.1063/1.4807759
10.1364/OE.20.000101
10.1109/TCSI.2001.972854
10.1364/OL.390401
10.1103/PhysRevA.53.4372
10.1109/LPT.2010.2044501
10.1063/1.353073
10.1016/S0167-2789(01)00375-X
10.1364/OE.21.017315
10.1109/JQE.2012.2212877
10.1109/68.935800
10.1364/OL.32.003373
10.1049/el:20030786
10.1109/LPT.2019.2895049
10.1109/3.89994
10.1109/JLT.2019.2945718
10.1016/S0030-4018(96)00705-5
10.1364/OE.16.006609
10.1109/JSTQE.2012.2237016
10.1117/12.2576865
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References ref13
ref35
ref12
ref34
ref15
ref37
ref14
ref36
ref31
ref30
ref11
ref33
ref10
ref32
ref2
ref1
ref17
ref39
ref16
ref38
ref19
ref18
ref24
ref23
ref26
ref25
ref20
ref22
ref21
ref28
ref27
ref29
ref8
ref7
ref9
ref4
ref3
ref6
ref5
ref40
References_xml – ident: ref10
  doi: 10.1364/OL.42.003181
– ident: ref14
  doi: 10.1109/50.541231
– ident: ref39
  doi: 10.1063/1.5142449
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  doi: 10.1109/68.920741
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  doi: 10.1364/OE.18.027028
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  doi: 10.1364/OL.34.000812
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  doi: 10.1109/68.475769
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  doi: 10.3390/photonics6040103
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  doi: 10.1109/JPHOT.2013.2267535
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  doi: 10.1109/3.291366
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  doi: 10.1109/CLEOE-IQEC.2013.6800695
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  doi: 10.1364/OL.38.000344
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  doi: 10.1109/JLT.2014.2332415
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  doi: 10.1109/68.623251
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  doi: 10.1016/S0030-4018(02)02192-2
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  doi: 10.1109/JSTQE.2004.835296
– ident: ref13
  doi: 10.1109/68.393181
– ident: ref4
  doi: 10.1109/JQE.2004.828237
– ident: ref25
  doi: 10.1016/j.physrep.2005.06.003
– ident: ref28
  doi: 10.1109/MAP.2020.3021391
– ident: ref23
  doi: 10.1063/1.4807759
– ident: ref33
  doi: 10.1364/OE.20.000101
– ident: ref3
  doi: 10.1109/TCSI.2001.972854
– ident: ref40
  doi: 10.1364/OL.390401
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  doi: 10.1103/PhysRevA.53.4372
– ident: ref20
  doi: 10.1109/LPT.2010.2044501
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  doi: 10.1063/1.353073
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  doi: 10.1016/S0167-2789(01)00375-X
– ident: ref37
  doi: 10.1364/OE.21.017315
– ident: ref6
  doi: 10.1109/JQE.2012.2212877
– ident: ref16
  doi: 10.1109/68.935800
– ident: ref8
  doi: 10.1364/OL.32.003373
– ident: ref19
  doi: 10.1049/el:20030786
– ident: ref36
  doi: 10.1109/LPT.2019.2895049
– ident: ref31
  doi: 10.1109/3.89994
– ident: ref1
  doi: 10.1109/JLT.2019.2945718
– ident: ref26
  doi: 10.1016/S0030-4018(96)00705-5
– ident: ref9
  doi: 10.1364/OE.16.006609
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  doi: 10.1109/JSTQE.2012.2237016
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  doi: 10.1117/12.2576865
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Snippet The complete set of intrinsic dimensionless parameters of a packaged and fiber-pigtailed distributed feedback (DFB) semiconductor laser are extracted from the...
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SubjectTerms Boundaries
Distributed feedback devices
Distributed feedback lasers
Frequency locking
Hopf bifurcation
Injection locked oscillators
Laser mode locking
Laser stability
Lasers
Mathematical analysis
Nonlinear optics
Optical feedback
Optical injection
Optical pumping
Parameters
Relaxation oscillations
Semiconductor lasers
Spectrum analysers
Threshold currents
Title Using Transitional Points in the Optical Injection Locking Behavior of a Semiconductor Laser to Extract Its Dimensionless Operating Parameters
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