A Light Field Image Quality Assessment Model Based on Symmetry and Depth Features
This paper presents a new full-reference image quality assessment (IQA) method for conducting the perceptual quality evaluation of the light field (LF) images, called the symmetry and depth feature-based model (SDFM). Specifically, the radial symmetry transform is first employed on the luminance com...
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Published in | IEEE transactions on circuits and systems for video technology Vol. 31; no. 5; pp. 2046 - 2050 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.05.2021
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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Abstract | This paper presents a new full-reference image quality assessment (IQA) method for conducting the perceptual quality evaluation of the light field (LF) images, called the symmetry and depth feature-based model (SDFM). Specifically, the radial symmetry transform is first employed on the luminance components of the reference and distorted LF images to extract their symmetry features for capturing the spatial quality of each view of an LF image. Second, the depth feature extraction scheme is designed to explore the geometry information inherited in an LF image for modeling its LF structural consistency across views. The similarity measurements are subsequently conducted on the comparison of their symmetry and depth features separately, which are further combined to achieve the quality score for the distorted LF image. Note that the proposed SDFM that explores the symmetry and depth features is conformable to the human vision system, which identifies the objects by sensing their structures and geometries. Extensive simulation results on the dense light fields dataset have clearly shown that the proposed SDFM outperforms multiple classical and recently developed IQA algorithms on quality evaluation of the LF images. |
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AbstractList | This paper presents a new full-reference image quality assessment (IQA) method for conducting the perceptual quality evaluation of the light field (LF) images, called the symmetry and depth feature-based model (SDFM). Specifically, the radial symmetry transform is first employed on the luminance components of the reference and distorted LF images to extract their symmetry features for capturing the spatial quality of each view of an LF image. Second, the depth feature extraction scheme is designed to explore the geometry information inherited in an LF image for modeling its LF structural consistency across views. The similarity measurements are subsequently conducted on the comparison of their symmetry and depth features separately, which are further combined to achieve the quality score for the distorted LF image. Note that the proposed SDFM that explores the symmetry and depth features is conformable to the human vision system, which identifies the objects by sensing their structures and geometries. Extensive simulation results on the dense light fields dataset have clearly shown that the proposed SDFM outperforms multiple classical and recently developed IQA algorithms on quality evaluation of the LF images. |
Author | Zeng, Huanqiang Tian, Yu Zhu, Jianqing Hou, Junhui Ma, Kai-Kuang Chen, Jing |
Author_xml | – sequence: 1 givenname: Yu surname: Tian fullname: Tian, Yu email: yu1995h@163.com organization: School of Information Science and Engineering, Huaqiao University, Xiamen, China – sequence: 2 givenname: Huanqiang orcidid: 0000-0002-2802-7745 surname: Zeng fullname: Zeng, Huanqiang email: zeng0043@hqu.edu.cn organization: School of Information Science and Engineering, Huaqiao University, Xiamen, China – sequence: 3 givenname: Junhui orcidid: 0000-0003-3431-2021 surname: Hou fullname: Hou, Junhui email: jh.hou@cityu.edu.hk organization: Department of Computer Science, City University of Hong Kong, Hong Kong – sequence: 4 givenname: Jing surname: Chen fullname: Chen, Jing email: jingzi@hqu.edu.cn organization: School of Information Science and Engineering, Huaqiao University, Xiamen, China – sequence: 5 givenname: Jianqing surname: Zhu fullname: Zhu, Jianqing email: jqzhu@hqu.edu.cn organization: School of Engineering, Huaqiao University, Qunzhou, China – sequence: 6 givenname: Kai-Kuang orcidid: 0000-0003-2932-5709 surname: Ma fullname: Ma, Kai-Kuang email: ekkma@ntu.edu.sg organization: School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore |
BookMark | eNp9kE1PwkAQhjcGEwH9A3rZxHNxdtql7RFRlARjCOi1WdopLOkH7m4P_fcWIR48eJo5vM9M3mfAelVdEWO3AkZCQPywnq4-1yMEhBHGoUA5vmB9IWXkIYLsdTtI4UUo5BUbWLsHEEEUhH22nPCF3u4cn2kqMj4v1Zb4slGFdi2fWEvWllQ5_lZnVPBHZSnjdcVXbVmSMy1XVcaf6OB2fEbKNYbsNbvMVWHp5jyH7GP2vJ6-eov3l_l0svBSjKXz4jASUeiLVASQZwSA5McwzkikCuOIgHKRhpkIFUIKQSAzFQSEGyFxE3RRf8juT3cPpv5qyLpkXzem6l4mKBG7qgjjLhWdUqmprTWUJ6l2yum6ckbpIhGQHAUmPwKTo8DkLLBD8Q96MLpUpv0fujtBmoh-gSgOY79r-w2NMXy_ |
CODEN | ITCTEM |
CitedBy_id | crossref_primary_10_2174_0126662558270259231122040821 crossref_primary_10_3389_frsip_2022_815058 crossref_primary_10_1109_TIP_2022_3175619 crossref_primary_10_1109_TCSVT_2023_3297016 crossref_primary_10_1109_TCSVT_2024_3486336 crossref_primary_10_1109_TCSVT_2024_3485684 crossref_primary_10_1109_TCSVT_2023_3295375 crossref_primary_10_3389_fncom_2021_768021 crossref_primary_10_1109_TMM_2023_3268370 crossref_primary_10_1109_JSTSP_2023_3278452 crossref_primary_10_1007_s11263_024_02239_9 crossref_primary_10_1109_TBC_2023_3308329 crossref_primary_10_1109_TCSVT_2020_3030049 crossref_primary_10_1109_TIP_2020_3018256 crossref_primary_10_1109_TIP_2023_3329663 crossref_primary_10_1109_TMM_2021_3096071 crossref_primary_10_3390_electronics13152985 crossref_primary_10_1016_j_engappai_2023_106015 crossref_primary_10_1109_TCSVT_2022_3179575 crossref_primary_10_3390_electronics11050759 crossref_primary_10_1016_j_displa_2024_102901 crossref_primary_10_1109_TCSVT_2021_3096528 crossref_primary_10_1109_TMM_2023_3330096 crossref_primary_10_1631_FITEE_2100180 crossref_primary_10_1007_s11760_025_04000_2 crossref_primary_10_1109_TBC_2020_3034445 crossref_primary_10_1186_s13640_024_00628_1 crossref_primary_10_1109_TCSVT_2020_3026817 crossref_primary_10_1016_j_jfranklin_2024_107058 crossref_primary_10_1145_3612924 crossref_primary_10_1117_1_JEI_34_1_013008 crossref_primary_10_1109_TCSVT_2023_3237702 crossref_primary_10_1109_TCSVT_2023_3281465 crossref_primary_10_1109_ACCESS_2023_3244088 |
Cites_doi | 10.1109/TIP.2003.819861 10.1364/JOSAA.4.002379 10.1109/TIP.2018.2839890 10.1109/CVPR.2017.396 10.1109/34.877520 10.1109/ACCESS.2019.2940093 10.1109/TPAMI.2003.1217601 10.1109/TIP.2011.2109730 10.1109/TIP.2018.2839524 10.1109/TIP.2010.2092435 10.1109/TCSVT.2018.2802943 10.1117/1.3267105 10.1109/TIP.2014.2346028 10.1109/BigMM.2018.8499086 10.1109/JSTSP.2014.2315716 10.1109/TCSVT.2019.2955011 10.1109/CVPR.2012.6247677 10.1016/j.jvcir.2018.11.005 10.1145/2010324.1964935 10.1109/TCSVT.2018.2854176 10.1109/TIP.2007.901820 10.1109/TIP.2013.2293423 10.1109/TIP.2005.859378 10.1109/TBC.2019.2892092 |
ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021 |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021 |
DBID | 97E RIA RIE AAYXX CITATION 7SC 7SP 8FD JQ2 L7M L~C L~D |
DOI | 10.1109/TCSVT.2020.2971256 |
DatabaseName | IEEE Xplore (IEEE) IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) CrossRef Computer and Information Systems Abstracts Electronics & Communications Abstracts Technology Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional |
DatabaseTitle | CrossRef Technology Research Database Computer and Information Systems Abstracts – Academic Electronics & Communications Abstracts ProQuest Computer Science Collection Computer and Information Systems Abstracts Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Professional |
DatabaseTitleList | Technology Research Database |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 1558-2205 |
EndPage | 2050 |
ExternalDocumentID | 10_1109_TCSVT_2020_2971256 8979387 |
Genre | orig-research |
GrantInformation_xml | – fundername: Key Science and Technology Project of Xiamen City grantid: 3502ZCQ20191005 – fundername: Natural Science Foundation for Outstanding Young Scholars of Fujian Province grantid: 2019J06017 – fundername: High-level Talent Innovation Program of Quanzhou City grantid: 2017G027 – fundername: Hong Kong RGC Early Career Scheme grantid: 9048123 CityU 21211518 – fundername: National Natural Science Foundation of China grantid: 61871434; 61802136; 61871342 funderid: 10.13039/501100001809 |
GroupedDBID | -~X 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACGFO ACGFS ACIWK AENEX AETIX AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD HZ~ H~9 ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P RIA RIE RNS RXW TAE TN5 VH1 AAYXX CITATION RIG 7SC 7SP 8FD JQ2 L7M L~C L~D |
ID | FETCH-LOGICAL-c295t-97818731c140fde002e3906de1ca298e0ef1c7d17a20c0445da44e2b152b4e393 |
IEDL.DBID | RIE |
ISSN | 1051-8215 |
IngestDate | Sun Jun 29 15:50:48 EDT 2025 Thu Apr 24 22:58:43 EDT 2025 Tue Jul 01 00:41:13 EDT 2025 Wed Aug 27 02:27:36 EDT 2025 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 5 |
Language | English |
License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html https://doi.org/10.15223/policy-029 https://doi.org/10.15223/policy-037 |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c295t-97818731c140fde002e3906de1ca298e0ef1c7d17a20c0445da44e2b152b4e393 |
Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
ORCID | 0000-0003-3431-2021 0000-0002-2802-7745 0000-0003-2932-5709 |
PQID | 2522215206 |
PQPubID | 85433 |
PageCount | 5 |
ParticipantIDs | proquest_journals_2522215206 crossref_citationtrail_10_1109_TCSVT_2020_2971256 crossref_primary_10_1109_TCSVT_2020_2971256 ieee_primary_8979387 |
ProviderPackageCode | CITATION AAYXX |
PublicationCentury | 2000 |
PublicationDate | 2021-05-01 |
PublicationDateYYYYMMDD | 2021-05-01 |
PublicationDate_xml | – month: 05 year: 2021 text: 2021-05-01 day: 01 |
PublicationDecade | 2020 |
PublicationPlace | New York |
PublicationPlace_xml | – name: New York |
PublicationTitle | IEEE transactions on circuits and systems for video technology |
PublicationTitleAbbrev | TCSVT |
PublicationYear | 2021 |
Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref13 ref12 ref15 ref14 ref11 ref10 ref2 ref1 ref17 ref16 ref19 ref18 ref24 ref23 ref20 ref22 ref21 ref8 ref7 ref9 ref4 ref3 ref6 ref5 (ref25) 0 |
References_xml | – ident: ref2 doi: 10.1109/TIP.2003.819861 – ident: ref14 doi: 10.1364/JOSAA.4.002379 – ident: ref4 doi: 10.1109/TIP.2018.2839890 – ident: ref6 doi: 10.1109/CVPR.2017.396 – ident: ref12 doi: 10.1109/34.877520 – ident: ref9 doi: 10.1109/ACCESS.2019.2940093 – ident: ref13 doi: 10.1109/TPAMI.2003.1217601 – ident: ref18 doi: 10.1109/TIP.2011.2109730 – ident: ref23 doi: 10.1109/TIP.2018.2839524 – ident: ref17 doi: 10.1109/TIP.2010.2092435 – ident: ref1 doi: 10.1109/TCSVT.2018.2802943 – ident: ref24 doi: 10.1117/1.3267105 – ident: ref20 doi: 10.1109/TIP.2014.2346028 – year: 0 ident: ref25 publication-title: Final report from the video quality experts group on the validation of objective models of video quality assessment – ident: ref11 doi: 10.1109/BigMM.2018.8499086 – ident: ref16 doi: 10.1109/JSTSP.2014.2315716 – ident: ref8 doi: 10.1109/TCSVT.2019.2955011 – ident: ref15 doi: 10.1109/CVPR.2012.6247677 – ident: ref10 doi: 10.1016/j.jvcir.2018.11.005 – ident: ref22 doi: 10.1145/2010324.1964935 – ident: ref5 doi: 10.1109/TCSVT.2018.2854176 – ident: ref21 doi: 10.1109/TIP.2007.901820 – ident: ref3 doi: 10.1109/TIP.2013.2293423 – ident: ref19 doi: 10.1109/TIP.2005.859378 – ident: ref7 doi: 10.1109/TBC.2019.2892092 |
SSID | ssj0014847 |
Score | 2.5155895 |
Snippet | This paper presents a new full-reference image quality assessment (IQA) method for conducting the perceptual quality evaluation of the light field (LF) images,... |
SourceID | proquest crossref ieee |
SourceType | Aggregation Database Enrichment Source Index Database Publisher |
StartPage | 2046 |
SubjectTerms | Algorithms depth feature Distortion Distortion measurement Feature extraction Geometry Image quality image quality assessment Light field image Object recognition Quality assessment Symmetry symmetry feature Vision systems |
Title | A Light Field Image Quality Assessment Model Based on Symmetry and Depth Features |
URI | https://ieeexplore.ieee.org/document/8979387 https://www.proquest.com/docview/2522215206 |
Volume | 31 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Nj9MwEB21e4LDLktBW3ZZ-cAN0jqOk9jHUqh2ESChtqi3yHYcrUSbVt300P31jJ0P8SW0txxsyfKM582Ln2cA3kgtYy2KMFBSJwFPoyJQaaICUSD4IX1Gx_Yq36_JzZJ_WsWrHrzr3sJYa734zI7cp7_Lz7fm4H6VjYVEbxJpH_pI3Oq3Wt2NARe-mRimC2EgEMfaBzJUjhfT-fcFUkFGR0ymiOjJbyDku6r8FYo9vszO4Eu7slpW8mN0qPTIPPxRtPGxS38Gp02iSSa1Z5xDz5bP4ekv5QcH8G1CPjtuTmZOxkZuNxhbSF1U40gmXclO4vqlrcl7xLucbEsyP242ttofiSpz8sHuqjviEskDEvcXsJx9XExvgqbFQmCYjKvAVbwSaRQa5FlFbjE82kjSJLehUUwKS20RmjQPU8WooZzHueLcMo2orzkOjV7CSbkt7QUQyZWICiq006UmcaExMihjpIqZSpjWQwjbPc9MU3_ctcFYZ56HUJl5O2XOTlljpyG87ebs6uob_x09cBvfjWz2fAhXrWmz5oDeZwzzTtfSlyav_j3rEp4wJ1_x2sYrOKn2B_sa849KX3vH-wmhB9RT |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1BT9swFH6C7jBxYBtsWhnbfOAGKbbjJPaxsFVlK0gTZeIW2Y4jpNEUlfRQfj3PThoxNk275WBLlt_z-94XP38P4EAZlRhZskgrk0Yii8tIZ6mOZIngh_QZHTtU-V6k4yvx7Tq53oCj7i2Mcy4Un7mB_wx3-cXcLv2vsmOp0JtktgkvEPcT1rzW6u4MhAztxDBhYJFEJFs_kaHqeHp6-XOKZJDTAVcZYnr6GwyFvip_BOOAMKNXcL5eW1NY8muwrM3APjyTbfzfxb-G7TbVJMPGN97Ahqt2YOuJAOEu_BiSiWfnZOQL2cjZDKMLaWQ1VmTYiXYS3zHtlpwg4hVkXpHL1Wzm6sWK6KogX9xdfUN8KrlE6v4WrkZfp6fjqG2yEFmukjrymlcyi5lFplUWDgOkixVNC8es5ko66kpms4JlmlNLhUgKLYTjBnHfCBwav4NeNa_ceyBKaBmXVBpfmZompcHYoK1VOuE65cb0ga33PLetArlvhHGbByZCVR7slHs75a2d-nDYzblr9Df-OXrXb3w3st3zPuyvTZu3R_Q-55h5-qa-NN37-6zP8HI8PZ_kk7OL7x88n2eyqXTch169WLqPmI3U5lNwwkfhkteg |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+Light+Field+Image+Quality+Assessment+Model+Based+on+Symmetry+and+Depth+Features&rft.jtitle=IEEE+transactions+on+circuits+and+systems+for+video+technology&rft.au=Tian%2C+Yu&rft.au=Zeng%2C+Huanqiang&rft.au=Hou%2C+Junhui&rft.au=Chen%2C+Jing&rft.date=2021-05-01&rft.pub=IEEE&rft.issn=1051-8215&rft.volume=31&rft.issue=5&rft.spage=2046&rft.epage=2050&rft_id=info:doi/10.1109%2FTCSVT.2020.2971256&rft.externalDocID=8979387 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1051-8215&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1051-8215&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1051-8215&client=summon |