Multi-Scale Metric Learning for Few-Shot Learning

• Published in: IEEE transactions on circuits and systems for video technology Vol. 31; no. 3; pp. 1091 - 1102
• Main Authors: Jiang, Wen, Huang, Kai, Geng, Jie, Deng, Xinyang
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.03.2021; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Classification; Feature extraction; Few-shot learning; Image classification; Learning; Learning systems; Measurement; metric learning; multi-scale feature maps; Neural networks; Semantics; Task analysis; Training

Few-shot learning in image classification is developed to learn a model that aims to identify unseen classes with only few training samples for each class. Fewer training samples and new tasks of classification make many traditional classification models no longer applicable. In this paper, a novel...