Tungsten Target Optimization for Photon Fluence Maximization of a Transmission-Type Flat-Panel X-Ray Source by Monte Carlo Simulation and Experimental Measurement

The cold cathode flat-panel X-ray source is a new type of X-ray source with advantage of smaller footprint and lower-dose imaging than current sources. In this paper, we optimized the thickness of the anode target of a flat-panel X-ray source to maximize the photon fluence of X-rays generated from t...

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on radiation and plasma medical sciences Vol. 2; no. 5; pp. 452 - 458
Main Authors Wang, Kun, Xu, Yuan, Chen, Daokun, Zhang, Guofu, Zhang, Zhipeng, She, Juncong, Deng, Shaozhi, Xu, Ningsheng, Chen, Jun
Format Journal Article
LanguageEnglish
Published Piscataway IEEE 01.09.2018
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Anodes
Cathode rays
Cold cathodes
Computer simulation
Current sources
Detectors
Electric potential
Figure of merit
Flat-panel X-ray source
Fluence
Glass
II-VI semiconductor materials
Image resolution
Monte Carlo (MC) simulation
Monte Carlo simulation
Nanotechnology
Nanowires
Optimization
Photonics
Photons
Target thickness
Thin films
transmission-type target
Tungsten
Voltage
X ray absorption
X ray sources
X-ray imaging
X-rays
Zinc oxide
Online AccessGet full text
ISSN2469-7311
2469-7303
DOI10.1109/TRPMS.2018.2849099

Cover

Abstract The cold cathode flat-panel X-ray source is a new type of X-ray source with advantage of smaller footprint and lower-dose imaging than current sources. In this paper, we optimized the thickness of the anode target of a flat-panel X-ray source to maximize the photon fluence of X-rays generated from the device. Utilizing EGSnrc-based Monte Carlo code, X-ray fluence was calculate from the simulated photons deposited in the virtual detector. These results revealed an optimal target thickness at a specific anode voltage to maximize the output of X-ray intensity. For experimental validation, tungsten thin film anodes with different thicknesses were prepared, and a flat-panel X-ray source was fabricated using a ZnO nanowire cold cathode. A figure of merit was introduced to characterize the output efficiency of the X-rays. The experimental results agree well with the simulation results, showing an optimal tungsten-target thickness of 1200 nm at an anode voltage of 40 kV. Using a flat-panel X-ray source with the optimized anode thickness, we took X-ray absorption images of both biological and nonbiological subjects, and high-resolution images were demonstrated.
AbstractList The cold cathode flat-panel X-ray source is a new type of X-ray source with advantage of smaller footprint and lower-dose imaging than current sources. In this paper, we optimized the thickness of the anode target of a flat-panel X-ray source to maximize the photon fluence of X-rays generated from the device. Utilizing EGSnrc-based Monte Carlo code, X-ray fluence was calculate from the simulated photons deposited in the virtual detector. These results revealed an optimal target thickness at a specific anode voltage to maximize the output of X-ray intensity. For experimental validation, tungsten thin film anodes with different thicknesses were prepared, and a flat-panel X-ray source was fabricated using a ZnO nanowire cold cathode. A figure of merit was introduced to characterize the output efficiency of the X-rays. The experimental results agree well with the simulation results, showing an optimal tungsten-target thickness of 1200 nm at an anode voltage of 40 kV. Using a flat-panel X-ray source with the optimized anode thickness, we took X-ray absorption images of both biological and nonbiological subjects, and high-resolution images were demonstrated.
Author She, Juncong
Chen, Daokun
Xu, Ningsheng
Xu, Yuan
Chen, Jun
Zhang, Zhipeng
Deng, Shaozhi
Wang, Kun
Zhang, Guofu
Author_xml – sequence: 1
  givenname: Kun
  surname: Wang
  fullname: Wang, Kun
  organization: State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou, China
– sequence: 2
  givenname: Yuan
  surname: Xu
  fullname: Xu, Yuan
  email: yuanxu@smu.edu.cn
  organization: Department of Biomedical Engineering, Southern Medical University, Guangzhou, China
– sequence: 3
  givenname: Daokun
  surname: Chen
  fullname: Chen, Daokun
  organization: State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou, China
– sequence: 4
  givenname: Guofu
  surname: Zhang
  fullname: Zhang, Guofu
  organization: State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou, China
– sequence: 5
  givenname: Zhipeng
  surname: Zhang
  fullname: Zhang, Zhipeng
  organization: State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou, China
– sequence: 6
  givenname: Juncong
  surname: She
  fullname: She, Juncong
  organization: State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou, China
– sequence: 7
  givenname: Shaozhi
  surname: Deng
  fullname: Deng, Shaozhi
  organization: State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou, China
– sequence: 8
  givenname: Ningsheng
  surname: Xu
  fullname: Xu, Ningsheng
  organization: State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou, China
– sequence: 9
  givenname: Jun
  orcidid: 0000-0001-7397-2714
  surname: Chen
  fullname: Chen, Jun
  email: stscjun@mail.sysu.edu.cn
  organization: State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou, China
BookMark eNp9kc9q3DAQxkVJoWmaF2gvgp690R_Llo5lSdJAlixZF3ozs_Y4VfBKriRDto_TJ602G1LooaeZ0Xy_GQ3fe3LivENCPnK24JyZi-Z-vdosBON6IXRpmDFvyKkoK1PUksmT15zzd-Q8xkfGGK-1MKU6Jb-b2T3EhI42EB4w0bsp2Z39Bcl6Rwcf6PqHTzm9Gmd0HdIVPP3t-4ECbQK4uLMx5pei2U-YtZCKNTgc6ffiHvZ04-eQ2e2errxLSJcQRk83djePx0Hgenr5NGGwO3QJRrpCiHPAQ_WBvB1gjHj-Es_It6vLZvm1uL27vll-uS06YVQqKqwYCKxNN6Cu5CBQKcGUlBXgYPq61FBXPddcK4YDsJ4rqXi5lUpBL7a1PCOfj3On4H_OGFP7mL_t8spWCKNlyQ2rskofVV3wMQYc2s6m5yNSADu2nLUHU9pnU9qDKe2LKRkV_6BTvhfC_v_QpyNkEfEV0DI3y1L-AWLQnRk
CODEN ITRPFI
CitedBy_id crossref_primary_10_1016_j_ejmp_2023_102607
crossref_primary_10_1007_s41365_024_01489_z
crossref_primary_10_1021_acsanm_9b01074
crossref_primary_10_1109_TNS_2021_3051008
crossref_primary_10_1007_s12043_019_1718_2
Cites_doi 10.1063/1.1791313
10.1063/1.4938006
10.1016/j.matlet.2006.05.031
10.1126/science.1158573
10.1016/j.net.2016.01.006
10.1016/S0065-2539(08)61226-3
10.2172/1453993
10.1109/JMEMS.2016.2640344
10.1116/1.3680112
10.1016/j.sab.2006.12.002
10.1016/j.vacuum.2017.08.015
10.1016/0168-583X(95)00349-5
10.1117/12.929354
10.1088/0957-4484/27/8/082501
10.1063/1.1689757
10.1186/s40580-014-0034-2
10.1118/1.1644532
10.1088/0031-9155/51/13/R17
10.1063/1.1832733
10.1063/1.2345829
10.1016/j.nimb.2007.09.023
10.1002/sia.1934
10.1002/adma.200602467
10.1016/j.apradiso.2013.06.009
10.1016/j.apradiso.2012.04.011
10.1063/1.3475213
10.1021/cg400318f
10.1016/j.nima.2017.05.038
10.1039/C7JA90035J
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2018
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2018
DBID 97E
RIA
RIE
AAYXX
CITATION
7QO
8FD
F28
FR3
K9.
NAPCQ
P64
DOI 10.1109/TRPMS.2018.2849099
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Biotechnology Research Abstracts
Technology Research Database
ANTE: Abstracts in New Technology & Engineering
Engineering Research Database
ProQuest Health & Medical Complete (Alumni)
Nursing & Allied Health Premium
Biotechnology and BioEngineering Abstracts
DatabaseTitle CrossRef
Nursing & Allied Health Premium
Biotechnology Research Abstracts
Technology Research Database
ProQuest Health & Medical Complete (Alumni)
Engineering Research Database
ANTE: Abstracts in New Technology & Engineering
Biotechnology and BioEngineering Abstracts
DatabaseTitleList
Nursing & Allied Health Premium
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Physics
EISSN 2469-7303
EndPage 458
ExternalDocumentID 10_1109_TRPMS_2018_2849099
8390944
Genre orig-research
GrantInformation_xml – fundername: Guangzhou Science Technology and Innovation Commission
  grantid: 201504010012
– fundername: National Key Research and Development Program of China
  grantid: 2016YFA0202001; 2016YFA0202003
– fundername: Fundamental Research Funds for the Central Universities
– fundername: Science and Technology Department of Guangdong Province
GroupedDBID 0R~
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABJNI
ABQJQ
ABVLG
ACGFS
AGQYO
AHBIQ
AKJIK
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
EBS
EJD
IFIPE
IPLJI
JAVBF
OCL
RIA
RIE
AAYXX
CITATION
RIG
7QO
8FD
F28
FR3
K9.
NAPCQ
P64
ID FETCH-LOGICAL-c295t-6e60a2e79cfe863f2e55205336aef9d748a76d181850efa0d153514b355ad2b73
IEDL.DBID RIE
ISSN 2469-7311
IngestDate Mon Jun 30 17:46:17 EDT 2025
Thu Apr 24 22:52:04 EDT 2025
Tue Jul 01 03:04:13 EDT 2025
Wed Aug 27 02:56:05 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 5
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c295t-6e60a2e79cfe863f2e55205336aef9d748a76d181850efa0d153514b355ad2b73
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ORCID 0000-0001-7397-2714
PQID 2298341906
PQPubID 4437208
PageCount 7
ParticipantIDs crossref_citationtrail_10_1109_TRPMS_2018_2849099
crossref_primary_10_1109_TRPMS_2018_2849099
ieee_primary_8390944
proquest_journals_2298341906
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2018-09-01
PublicationDateYYYYMMDD 2018-09-01
PublicationDate_xml – month: 09
  year: 2018
  text: 2018-09-01
  day: 01
PublicationDecade 2010
PublicationPlace Piscataway
PublicationPlace_xml – name: Piscataway
PublicationTitle IEEE transactions on radiation and plasma medical sciences
PublicationTitleAbbrev TRPMS
PublicationYear 2018
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References ref13
ref12
ref15
ref36
ref14
ref31
ref30
ref11
(ref33) 2005
ref32
ref10
ref2
ref1
hasan (ref21) 0
ref17
ref18
scarfe (ref5) 2006; 72
ref24
ref23
ref26
ref25
ref20
nelson (ref34) 1985
ref22
ref28
kawrakow (ref35) 2007
ref27
arbelaìez (ref19) 2011; 566
ref29
ref8
ref7
ref9
ref4
könig (ref6) 1999
ref3
castaño (ref16) 2011; 11
References_xml – ident: ref13
  doi: 10.1063/1.1791313
– start-page: 588
  year: 1999
  ident: ref6
  article-title: Application of neural networks for automated X-ray image inspection in electronics manufacturing
  publication-title: Proc Int Conf Artificial Neural Network
– ident: ref25
  doi: 10.1063/1.4938006
– year: 2005
  ident: ref33
  article-title: MCNP-A general Monte Carlo N-particle transport code, version 5
– ident: ref22
  doi: 10.1016/j.matlet.2006.05.031
– ident: ref2
  doi: 10.1126/science.1158573
– ident: ref27
  doi: 10.1016/j.net.2016.01.006
– ident: ref9
  doi: 10.1016/S0065-2539(08)61226-3
– year: 1985
  ident: ref34
  publication-title: The EGS4 code system
  doi: 10.2172/1453993
– ident: ref12
  doi: 10.1109/JMEMS.2016.2640344
– ident: ref17
  doi: 10.1116/1.3680112
– ident: ref1
  doi: 10.1016/j.sab.2006.12.002
– ident: ref36
  doi: 10.1016/j.vacuum.2017.08.015
– ident: ref32
  doi: 10.1016/0168-583X(95)00349-5
– year: 0
  ident: ref21
  article-title: Denoising low-dose CT images using multi-frame blind source separation and block matching filter
  publication-title: IEEE Trans Radiat Plasma Med Sci
– ident: ref18
  doi: 10.1117/12.929354
– ident: ref7
  doi: 10.1088/0957-4484/27/8/082501
– volume: 566
  start-page: 253
  year: 2011
  ident: ref19
  article-title: Simulation of the field electron emission characteristics of a flat panel X-ray source
  publication-title: Biochimica et Biophysica Acta
– year: 2007
  ident: ref35
  article-title: The EGSnrc code system: Monte Carlo simulation of electron and photon transport
– ident: ref10
  doi: 10.1063/1.1689757
– ident: ref8
  doi: 10.1186/s40580-014-0034-2
– ident: ref31
  doi: 10.1118/1.1644532
– ident: ref30
  doi: 10.1088/0031-9155/51/13/R17
– ident: ref11
  doi: 10.1063/1.1832733
– ident: ref14
  doi: 10.1063/1.2345829
– ident: ref26
  doi: 10.1016/j.nimb.2007.09.023
– ident: ref28
  doi: 10.1002/sia.1934
– ident: ref23
  doi: 10.1002/adma.200602467
– ident: ref29
  doi: 10.1016/j.apradiso.2013.06.009
– ident: ref20
  doi: 10.1016/j.apradiso.2012.04.011
– ident: ref15
  doi: 10.1063/1.3475213
– ident: ref24
  doi: 10.1021/cg400318f
– volume: 11
  year: 2011
  ident: ref16
  article-title: Electron field emission particle-in-cell (PIC) coupled with MCNPX simulation of a CNT-based flat-panel X-ray source
  publication-title: Proc SPIE Int Soc Opt Eng
– ident: ref4
  doi: 10.1016/j.nima.2017.05.038
– ident: ref3
  doi: 10.1039/C7JA90035J
– volume: 72
  start-page: 75
  year: 2006
  ident: ref5
  article-title: Clinical applications of cone-beam computed tomography in dental practice
  publication-title: J Can Dental Assoc
SSID ssj0001782945
Score 2.1048625
Snippet The cold cathode flat-panel X-ray source is a new type of X-ray source with advantage of smaller footprint and lower-dose imaging than current sources. In this...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 452
SubjectTerms Anodes
Cathode rays
Cold cathodes
Computer simulation
Current sources
Detectors
Electric potential
Figure of merit
Flat-panel X-ray source
Fluence
Glass
II-VI semiconductor materials
Image resolution
Monte Carlo (MC) simulation
Monte Carlo simulation
Nanotechnology
Nanowires
Optimization
Photonics
Photons
Target thickness
Thin films
transmission-type target
Tungsten
Voltage
X ray absorption
X ray sources
X-ray imaging
X-rays
Zinc oxide
Title Tungsten Target Optimization for Photon Fluence Maximization of a Transmission-Type Flat-Panel X-Ray Source by Monte Carlo Simulation and Experimental Measurement
URI https://ieeexplore.ieee.org/document/8390944
https://www.proquest.com/docview/2298341906
Volume 2
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3daxQxEB_aguCLtVbxapV58E1z3c_s5lFKj1I4Ld4V7m1JNhMUr7ul3QPrn-Nf6iS7d-cX4ssS2CQEZjLzm8l8ALzWbDLIzEaiUPzJNF8pHddKlDk5ktaQ0aHa53t5fpVdLPLFDrzd5MIQUQg-o7Efhrd829Yr7yo7YWXOW2e7sMuGW5-rtfWnsKpToSdxwhafKNI4XufIROpkzkb8zAdylWOWx7yL-kUPhcYqf0jjoGIm-zBdH66PLPkyXnVmXH_7rW7j_57-MTwasCa-65njAHaoeQIPQsxnfXcI3-d80ZnIDc5DODh-YPFxPeRlIoNZvPzUMjTESd_GBKf66_Z_61Bj0HTMKd7lJrxJy3N1Jy51Q0tciI_6HmfhdQDNPU59ISw81bfLFmefr4e-Yagbi2c_9RnA6dZt-RSuJmfz03MxtGwQdaLyTkiSkU6oULWjUqYuoTxPfLqv1OSULbJSF9LGHiVE5HRkWeAyZDOMerRNTJE-g72mbeg5YG6lY3TIiCRymSqcYlvauNRmhoVQlpoRxGsCVvVQz9y31VhWwa6JVBWIXnmiVwPRR_Bms-amr-bxz9mHnoqbmQMBR3C85pNquPB3VZKo0pfGi-TR31e9gId-7z487Rj2utsVvWQ805lXgZF_AOgC80s
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Lb9QwEB6VIgQXChTEQoE5cANv83TiY1V1tUBTKjaV9hbZsS2qbhPUZiXKz-GXMnayu7yEuESRYjuWZjzzzXgeAK8lmQw80QHLBD0SSUdKhrVgeWqs4VoZJX21zxM-PUvez9P5Frxd58IYY3zwmRm7V3-Xr9t66Vxl-6TMaenkFtwmvZ-GfbbWxqNCyk74rsQR2Xwsi8NwlSUTiP2SzPiZC-XKxySRaR3xiybyrVX-kMdeyUx2oFhtr48tuRgvOzWuv_1WufF_9_8A7g9oEw969ngIW6Z5BHd81Gd9vQvfSzrqROYGSx8Qjh9JgFwOmZlIcBZPP7cEDnHSNzLBQn7dfG8tSvS6jnjFOd2YM2pprOzYqWzMAufsk7zBmb8fQHWDhSuFhYfyatHi7Pxy6ByGstF49FOnASw2jsvHcDY5Kg-nbGjawOpIpB3jhgcyMpmorcl5bCOTppFL-OXSWKGzJJcZ16HDCYGxMtAkcgm0KcI9Ukcqi5_AdtM25ilgqrklfEiYJLCJyKwga1rZWCeKxFASqxGEKwJW9VDR3DXWWFTesglE5YleOaJXA9FH8GY950tfz-Ofo3cdFdcjBwKOYG_FJ9Vw5K-rKBK5K44X8Gd_n_UK7k7L4rg6fnfy4Tncc__pg9X2YLu7WpoXhG469dIz9Q-6uPaU
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Tungsten+Target+Optimization+for+Photon+Fluence+Maximization+of+a+Transmission-Type+Flat-Panel+X-Ray+Source+by+Monte+Carlo+Simulation+and+Experimental+Measurement&rft.jtitle=IEEE+transactions+on+radiation+and+plasma+medical+sciences&rft.au=Wang%2C+Kun&rft.au=Xu%2C+Yuan&rft.au=Chen%2C+Daokun&rft.au=Zhang%2C+Guofu&rft.date=2018-09-01&rft.issn=2469-7311&rft.eissn=2469-7303&rft.volume=2&rft.issue=5&rft.spage=452&rft.epage=458&rft_id=info:doi/10.1109%2FTRPMS.2018.2849099&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TRPMS_2018_2849099
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2469-7311&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2469-7311&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2469-7311&client=summon