A Weibull distribution-based new approach to represent hot carrier degradation in threshold voltage of MOS transistors - Kuntman, Ayten; Ardalı, Arda; Kuntman, Hakan; Kaçar, Firat (Solid-state electronics, 2004)
Keywords: Hot carriers; Measurement and evaluation; Modeling and simulation of solid-state devices and processes; MOS transistors; Weibull distribution; Hot carriers; Measurement and evaluation; Weibull distribution; Modeling and simulation of solid-state devices and processes; MOS transistors