Fatigue Behavior Analysis and Life Prediction of Overhead Conductors Subject to Narrowband Vibration

• Published in: IEEE transactions on power delivery Vol. 38; no. 2; pp. 1 - 9
• Main Authors: Ferreira, Jorge, Badibanga, Remy, Araujo, Jose Alexander, Silva, Cosme
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.04.2023; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Conductors; Fatigue life; fatigue life prediction; Fatigue tests; Frequency domain analysis; Hip; Life prediction; Narrowband; Power spectral density; Random vibration; S N diagrams; stochastic loading; Time domain analysis; Vibration analysis

This paper aims to present a contribution to the study of the effect of random vibration on the useful life of overhead conductors. This study compares two approaches based on an acquired vibration signal. The first one is the time-domain approach (based on rainflow cycle counting), while the second...