Impact of Accelerated Thermal Aging on Electrical Tree Structure and Physicochemical Characteristics of XLPE Insulation

• Published in: IEEE transactions on dielectrics and electrical insulation Vol. 31; no. 1; p. 1
• Main Authors: Sahoo, Rakesh, Karmakar, Subrata
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.02.2024; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Accelerated aging; Aging; Cable insulation; Carbonyls; Contact angle; Cross-linked Polyethylene; Crystal defects; Crystallization; Degree of crystallinity; Electric contacts; Electrical Tree; Enthalpy; Fourier transforms; Hydrophobicity; Insulation; Molecular structure; Oxidation resistance; Physicochemical Analysis; Scanning electron microscopy; Service life; Stress; Temperature; Thermal Aging; Thermal analysis; Thermal resistance; X-ray scattering

Cross-linked polyethylene (XLPE) insulation undergoes thermal aging due to load or environmental stresses over its service life. The aging process causes the XLPE to deteriorate, leading to the production of chemical byproducts that results in insulation defect. In this study, the impact of thermal...