A Junction Temperature Monitoring Method for IGBT Modules Based on Turn-Off Voltage With Convolutional Neural Networks - Wang, Huimin; Xu, Zhiliang; Ge, Xinglai; Liao, Yongkang; Yang, Yongheng; Zhang, Yi; Yao, Bo; Chai, Yuheng (IEEE transactions on power electronics, 2023)
Keywords: Artificial neural networks; Convolutional neural networks; Electric potential; Feature recognition; Insulated gate bipolar transistors; insulated-gate bipolar transistor (IGBT) modules; junction temperature monitoring (JTM); Junctions; load current dependence; Logic gates; Modules; Monitoring; Neural networks; Reliability analysis; Semiconductor devices; Temperature measurement; Temperature sensors; turn-off voltage; Voltage