APA (7th ed.) Citation

Yi, L., McTigue, M., Gines, D., Doerr, B., & Moon, J. (2023). Minimally Invasive Direct In-situ Magnetic Loss Measurement in Power Electronic Circuits. IEEE transactions on power electronics, 38(11), 1-11. https://doi.org/10.1109/TPEL.2023.3298211

Chicago Style (17th ed.) Citation

Yi, Lifang, Mike McTigue, David Gines, Brad Doerr, and Jinyeong Moon. "Minimally Invasive Direct In-situ Magnetic Loss Measurement in Power Electronic Circuits." IEEE Transactions on Power Electronics 38, no. 11 (2023): 1-11. https://doi.org/10.1109/TPEL.2023.3298211.

MLA (9th ed.) Citation

Yi, Lifang, et al. "Minimally Invasive Direct In-situ Magnetic Loss Measurement in Power Electronic Circuits." IEEE Transactions on Power Electronics, vol. 38, no. 11, 2023, pp. 1-11, https://doi.org/10.1109/TPEL.2023.3298211.