Special Issue: Characterizations of Three-Dimensional Surfaces at Micro/Nanoscale

• Published in: Applied sciences Vol. 12; no. 15; p. 7729
• Main Author: Ţălu, Ştefan
• Format: Journal Article
• Language: English
• Published: Basel MDPI AG 01.08.2022
• Subjects: Adsorption; Conflicts of interest; Fractals; Ion beams; Morphology; n/a; Scanning electron microscopy; Spectrum analysis; Thin films; Topography; Transmission electron microscopy

[1] compared several platinum–carbon (PtC) nano-tips by focusing ion beam-induced deposition (FIBID) and focused electron beam-induced deposition (FEBID) using high-resolution transmission electron microscopy (HRTEM) analysis. The authors stated that the deposition process of GdMnO3 thin films and t...