Special Issue: Characterizations of Three-Dimensional Surfaces at Micro/Nanoscale

[1] compared several platinum–carbon (PtC) nano-tips by focusing ion beam-induced deposition (FIBID) and focused electron beam-induced deposition (FEBID) using high-resolution transmission electron microscopy (HRTEM) analysis. The authors stated that the deposition process of GdMnO3 thin films and t...

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Published inApplied sciences Vol. 12; no. 15; p. 7729
Main Author Ţălu, Ştefan
Format Journal Article
LanguageEnglish
Published Basel MDPI AG 01.08.2022
Subjects
Adsorption
Conflicts of interest
Fractals
Ion beams
Morphology
n/a
Scanning electron microscopy
Spectrum analysis
Thin films
Topography
Transmission electron microscopy
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Abstract [1] compared several platinum–carbon (PtC) nano-tips by focusing ion beam-induced deposition (FIBID) and focused electron beam-induced deposition (FEBID) using high-resolution transmission electron microscopy (HRTEM) analysis. The authors stated that the deposition process of GdMnO3 thin films and the subsequent sintering at 850 °C produces films with interesting topographic properties that can be used to improve the fabrication process of thin films based on systems involving rare earths, which are known as excellent multiferroic materials for technological applications. Haub, M.; Günther, T.; Bogner, M.; Zimmermann, A. Investigation of Focused Ion and Electron Beam Platinum Carbon Nano-Tips with Transmission Electron Microscopy for Quantum Tunneling Vacuum Gap Applications.
AbstractList Nowadays, understanding the structural properties of materials with a specific internal microstructure on all length scales is the key to discovering new products based on new technologies [...]
[1] compared several platinum–carbon (PtC) nano-tips by focusing ion beam-induced deposition (FIBID) and focused electron beam-induced deposition (FEBID) using high-resolution transmission electron microscopy (HRTEM) analysis. The authors stated that the deposition process of GdMnO3 thin films and the subsequent sintering at 850 °C produces films with interesting topographic properties that can be used to improve the fabrication process of thin films based on systems involving rare earths, which are known as excellent multiferroic materials for technological applications. Haub, M.; Günther, T.; Bogner, M.; Zimmermann, A. Investigation of Focused Ion and Electron Beam Platinum Carbon Nano-Tips with Transmission Electron Microscopy for Quantum Tunneling Vacuum Gap Applications.
Author Ţălu, Ştefan
Author_xml – sequence: 1
  givenname: Ştefan
  surname: Ţălu
  fullname: Ţălu, Ştefan
BookMark eNptkU1P3DAQhq0KpFLYE38gEscqYDv-SLihLZSVliK0y9maOGPwKhundvZQfn3dXVShqnOZ0atn3tHMfCFHQxiQkHNGL6uqoVcwjowzqTVvPpETTrUqK8H00Yf6M5mltKE5GlbVjJ6Qp9WI1kNfLFLa4XUxf4UIdsLo32DyYUhFcMX6NSKW3_wWh5S1TK920YHFVMBUPHgbw9UPGEKy0OMZOXbQJ5y951PyfHe7nt-Xy8fvi_nNsrS8EVPJqQAtKVOOa-x4y4QC1SlVt6x1Hae0ltTWwCVK1LpVTWNb1klEIVvlaqxOyeLg2wXYmDH6LcRfJoA3eyHEFwNx8rZH02rmKtFy3dSN6CoLQqt8Ml5rxyh1PHtdHLzGGH7uME1mE3YxL5oM15RKIbTUmfp6oPK-KUV0f6cyav68wHx4QabZP7T10_6mUwTf_7fnN3YyiZo
CitedBy_id crossref_primary_10_3390_ma15217549
Cites_doi 10.3390/app112411793
10.3390/app11178088
10.3390/app11115089
10.3390/app11135848
10.3390/app11093886
10.3390/app11052436
ContentType Journal Article
Copyright 2022 by the author. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.
Copyright_xml – notice: 2022 by the author. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.
DBID AAYXX
CITATION
ABUWG
AFKRA
AZQEC
BENPR
CCPQU
DWQXO
PHGZM
PHGZT
PIMPY
PKEHL
PQEST
PQQKQ
PQUKI
PRINS
DOA
DOI 10.3390/app12157729
DatabaseName CrossRef
ProQuest Central (Alumni)
ProQuest Central UK/Ireland
ProQuest Central Essentials
ProQuest Central
ProQuest One
ProQuest Central Korea
ProQuest Central Premium
ProQuest One Academic
Publicly Available Content Database
ProQuest One Academic Middle East (New)
ProQuest One Academic Eastern Edition (DO NOT USE)
ProQuest One Academic
ProQuest One Academic UKI Edition
ProQuest Central China
DOAJ Directory of Open Access Journals
DatabaseTitle CrossRef
Publicly Available Content Database
ProQuest One Academic Middle East (New)
ProQuest Central Essentials
ProQuest One Academic Eastern Edition
ProQuest Central (Alumni Edition)
ProQuest One Community College
ProQuest Central China
ProQuest Central
ProQuest One Academic UKI Edition
ProQuest Central Korea
ProQuest Central (New)
ProQuest One Academic
ProQuest One Academic (New)
DatabaseTitleList CrossRef

Publicly Available Content Database
Database_xml – sequence: 1
  dbid: DOA
  name: DOAJ Directory of Open Access Journals
  url: https://www.doaj.org/
  sourceTypes: Open Website
– sequence: 2
  dbid: BENPR
  name: Proquest Central Journals
  url: https://www.proquest.com/central
  sourceTypes: Aggregation Database
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Sciences (General)
EISSN 2076-3417
ExternalDocumentID oai_doaj_org_article_b71f34b279894d3ca476339287f100f2
10_3390_app12157729
Genre Commentary
Editorial
GroupedDBID .4S
2XV
5VS
7XC
8CJ
8FE
8FG
8FH
AADQD
AAFWJ
AAYXX
ADBBV
ADMLS
AFKRA
AFPKN
AFZYC
ALMA_UNASSIGNED_HOLDINGS
APEBS
ARCSS
BCNDV
BENPR
CCPQU
CITATION
CZ9
D1I
D1J
D1K
GROUPED_DOAJ
IAO
IGS
ITC
K6-
K6V
KC.
KQ8
L6V
LK5
LK8
M7R
MODMG
M~E
OK1
P62
PHGZM
PHGZT
PIMPY
PROAC
TUS
ABUWG
AZQEC
DWQXO
PKEHL
PQEST
PQQKQ
PQUKI
PRINS
PUEGO
ID FETCH-LOGICAL-c294t-204a75016f27ed2b146a6d668b1bfd200850c8a25e5e77b699cb1d5ee45b6f8e3
IEDL.DBID BENPR
ISSN 2076-3417
IngestDate Wed Aug 27 01:20:02 EDT 2025
Mon Jun 30 07:28:09 EDT 2025
Thu Apr 24 23:10:16 EDT 2025
Tue Jul 01 00:41:28 EDT 2025
IsDoiOpenAccess true
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Issue 15
Language English
License https://creativecommons.org/licenses/by/4.0
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c294t-204a75016f27ed2b146a6d668b1bfd200850c8a25e5e77b699cb1d5ee45b6f8e3
Notes SourceType-Scholarly Journals-1
content type line 14
ObjectType-Editorial-2
ObjectType-Commentary-1
OpenAccessLink https://www.proquest.com/docview/2700544757?pq-origsite=%requestingapplication%
PQID 2700544757
PQPubID 2032433
ParticipantIDs doaj_primary_oai_doaj_org_article_b71f34b279894d3ca476339287f100f2
proquest_journals_2700544757
crossref_primary_10_3390_app12157729
crossref_citationtrail_10_3390_app12157729
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2022-08-01
PublicationDateYYYYMMDD 2022-08-01
PublicationDate_xml – month: 08
  year: 2022
  text: 2022-08-01
  day: 01
PublicationDecade 2020
PublicationPlace Basel
PublicationPlace_xml – name: Basel
PublicationTitle Applied sciences
PublicationYear 2022
Publisher MDPI AG
Publisher_xml – name: MDPI AG
References ref_1
ref_3
ref_2
ref_5
ref_4
ref_6
References_xml – ident: ref_1
  doi: 10.3390/app112411793
– ident: ref_2
  doi: 10.3390/app11178088
– ident: ref_4
  doi: 10.3390/app11115089
– ident: ref_3
  doi: 10.3390/app11135848
– ident: ref_5
  doi: 10.3390/app11093886
– ident: ref_6
  doi: 10.3390/app11052436
SSID ssj0000913810
Score 2.2274365
Snippet Nowadays, understanding the structural properties of materials with a specific internal microstructure on all length scales is the key to discovering new...
[1] compared several platinum–carbon (PtC) nano-tips by focusing ion beam-induced deposition (FIBID) and focused electron beam-induced deposition (FEBID) using...
SourceID doaj
proquest
crossref
SourceType Open Website
Aggregation Database
Enrichment Source
Index Database
StartPage 7729
SubjectTerms Adsorption
Conflicts of interest
Fractals
Ion beams
Morphology
n/a
Scanning electron microscopy
Spectrum analysis
Thin films
Topography
Transmission electron microscopy
SummonAdditionalLinks – databaseName: DOAJ Directory of Open Access Journals
  dbid: DOA
  link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwrZ3NS8MwFMCD7KQHcVNxOiWHHVQoa5M0abz5NYYwQdxgt5KkyUk22br_37w0mwMFL17Lg5b3nSb5PYT6hQOIF5MJY5IlLK9IIhXVCXM-LCmlNjXwv2P8ykdT9jLLZzujvuBMWIMHbhQ30CJzlGkigBReUaOYjwhf1AvhsjR1Ifv6mrezmAo5WGaArmou5HnxFPaDAaQQm8nvEhRI_T8ScaguwyN0GNtCfN98Thvt2XkHHezAAjuoHcNwha8jK_rmGL3F-fE4TNG7w49b_nK8XokXDk-8vWzyBBz_hsGB39dLB2exsKrxGI7kDXyWXay8vewJmg6fJ4-jJE5JSAyRrPZuzpQv-xl3RNiKaK9jxSvOC51pV5HApDOFIrnNrRCaS2l0VuXWslxzV1h6ilrzxdyeISwKxpQsnLECFk4-OH37oSy1jqdCVaaLbjeKK01EiMMki4_SLyVAy-WOlruovxX-bMgZv4s9gAW2IoC7Dg-8E5TRCcq_nKCLehv7lTEGVyVsqefAMxTn__GOC7RP4OpDOPzXQ616ubaXviGp9VXwvS_BeNo8
  priority: 102
  providerName: Directory of Open Access Journals
Title Special Issue: Characterizations of Three-Dimensional Surfaces at Micro/Nanoscale
URI https://www.proquest.com/docview/2700544757
https://doaj.org/article/b71f34b279894d3ca476339287f100f2
Volume 12
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfZ1LT8MwDIAt2C5wQIyHGIwphx0AqaJN0iblghhsICQQT4lblaQJF7TCNv4_cZcNJBDXNic7dmzH-QzQkw4hXjyPOM95xNOSRrliOuLOmyVjzMYG6x03t9nVM79-SV9CwW0S2irnPrF21GVlsEZ-jBekKdLpxOn7R4RTo_B2NYzQWIamd8FSNqDZH9zePSyqLEi9lEk8e5jHfH6P98IIVAhB5fdRVBP7fznk-pQZrsNaCA_J2UyfLViyow1Y_QEN3IBWMMcJOQjM6MNNuA9z5Ek9Te-EnC84zOGZJakcefJ6s9EF8vxnLA7y-Dl22JNF1JTcYGvesfe21cTrzW7B83DwdH4VhWkJkaE5n_rtzpU__pPMUWFLqr2sVVZmmdSJdiWt2XRGKpra1Aqhszw3OilTa3mqMyct24bGqBrZHSBCcq5y6YwVmEB5I_VhiLLMuiwWqjRtOJoLrjABJY4TLd4Kn1KglIsfUm5Db7H4fUbQ-HtZHzWwWILY6_pDNX4tghUVWiSOcU0FYuNLZhT37tFHeFK4JI4dbUNnrr8i2OKk-N45u___3oMVio8b6va-DjSm40-770OOqe7CshxedsPu6taJ-xdsf9ZR
linkProvider ProQuest
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwtV1NT9wwEB1ROLQ9IKCtuny0PlCprRSR2E6cIKGqhW6XwiJVXSRuwXZsLmgDu4sQf6q_sTOJsyC14sY1saLIfvNhe-Y9gO3cE4mXLCIpCxnJtOJRoYWJpEezFEK42NJ5x_AkG5zKn2fp2QL86XphqKyy84mNo65qS2fkO3RBmhI7nfpydR2RahTdrnYSGi0sjtzdLW7ZpnuHB7i-Hzjvfx_tD6KgKhBZXsgZwkJqDJNJ5rlyFTf4Tzqrsiw3ifEVbzjcbK556lKnlMmKwpqkSp2Tqcl87gR-9xksSYGRnDrT-z_mZzrEsZkncdsGiO9juoUm-oaQwt4HvkYf4B_338S0_gosh2SUfW3RswoLbrwGLx9QFK7BajD-KfsYGKo_vYJfQbWeNdp9u2x_zvocmjpZ7dkIUeKiA1IPaJk_2O-biacKMKZnbEiFgDvo2-sposS9htMnmcU3sDiux-4tMJVLqYvcW6dou4YuAZMe7YTzWax0ZXvwuZu40gbictLPuCxxA0OzXD6Y5R5szwdftXwd_x_2jVZgPoRItpsH9eSiDDZbGpV4IQ1XRFJfCaslOmPMJ3Plkzj2vAeb3fqVwfKn5T1O1x9__R6eD0bD4_L48ORoA15waqtoCgs3YXE2uXFbmOzMzLsGYQzOnxrSfwE4sQ_R
linkToPdf http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwtV1dT9RAFL3BJTH6QAQ1rqDOAyZq0mw7M-20JMYIywZENqiQ8FZmpjO-mC3uLiH8NX6d97bThQTiG6_tpGlmztyPmXvPAdjMPZF4ySKSspCRTCseFVqYSHrclkIIF1s67zgcZ3sn8ttperoE110vDJVVdjaxMdRVbemMfEAXpCmx06mBD2URR8PRl_O_ESlI0U1rJ6fRQuTAXV1i-jb7vD_EtX7P-Wj3eGcvCgoDkeWFnCNEpEaXmWSeK1dxg_-nsyrLcpMYX_GGz83mmqcudUqZrCisSarUOZmazOdO4HcfwbKirKgHy9u746OfixMeYtzMk7htChSiiOlOmsgcQkB74wYbtYA7zqDxcKNnsBJCU_a1xdIqLLnJGjy9RVi4BqvBFMzYh8BX_fE5_Aga9qxR8ttiOwsO6NDiyWrPjhEzLhqSlkDLA8J-XUw91YMxPWeHVBY4QEtfzxAz7gWcPMg8voTepJ64V8BULqUucm-douQNDQSGQNoJ57NY6cr24VM3caUNNOakpvGnxHSGZrm8Nct92FwMPm_ZO-4ftk0rsBhClNvNg3r6uww7uDQq8UIaroiyvhJWSzTNGF3myidx7HkfNrr1K4MdmJU3qH39_9fv4DHCufy-Pz5YhyeceiyaKsMN6M2nF-4NRj5z8zZAjMHZQ6P6H1SbFWM
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Special+Issue%3A+Characterizations+of+Three-Dimensional+Surfaces+at+Micro%2FNanoscale&rft.jtitle=Applied+sciences&rft.au=%C5%A2%C4%83lu%2C+%C5%9Etefan&rft.date=2022-08-01&rft.pub=MDPI+AG&rft.eissn=2076-3417&rft.volume=12&rft.issue=15&rft.spage=7729&rft_id=info:doi/10.3390%2Fapp12157729&rft.externalDBID=HAS_PDF_LINK
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2076-3417&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2076-3417&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2076-3417&client=summon