Investigation of Grain Radius Dependence of Sensitivity for Porous Thin Film Semiconducting Metal Oxide Gas Sensor

In this paper, a new diffusion-reaction equation was formulated to research the influences of grain radius on the transients of gas transport and gas sensitivity for porous thin film medium semiconducting metal oxide gas sensor, based on the phenomenon that a target gas diffuses in the sensing film...

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Published inIEEE sensors journal Vol. 20; no. 8; pp. 4275 - 4282
Main Authors Yuan, Zhenyu, Zhang, Shouwen, Meng, Fanli, Zhang, Hua, Zuo, Kaiyuan
Format Journal Article
LanguageEnglish
Published New York IEEE 15.04.2020
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN1530-437X
1558-1748
DOI10.1109/JSEN.2019.2961388

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Abstract In this paper, a new diffusion-reaction equation was formulated to research the influences of grain radius on the transients of gas transport and gas sensitivity for porous thin film medium semiconducting metal oxide gas sensor, based on the phenomenon that a target gas diffuses in the sensing film via Knudsen diffusion and reacts with adsorbed oxygen on the pore surfaces following Langmuir adsorption. In order to describe gas transport inside the sensing film, the equation has been solved numerically under unsteady-state conditions. When the gas concentration reached a steady state, the relationship between gas concentration and film depth was formulated using data fitting method to investigate the influences of grain radius on gas sensitivity, according to the linear relation between the sheet conductance of the sensing film and the gas concentration at the corresponding depth, and the reality that the conductance of the entire film is an integration of sheet conductance over the whole range of the film from the surface to the substrate.
AbstractList In this paper, a new diffusion-reaction equation was formulated to research the influences of grain radius on the transients of gas transport and gas sensitivity for porous thin film medium semiconducting metal oxide gas sensor, based on the phenomenon that a target gas diffuses in the sensing film via Knudsen diffusion and reacts with adsorbed oxygen on the pore surfaces following Langmuir adsorption. In order to describe gas transport inside the sensing film, the equation has been solved numerically under unsteady-state conditions. When the gas concentration reached a steady state, the relationship between gas concentration and film depth was formulated using data fitting method to investigate the influences of grain radius on gas sensitivity, according to the linear relation between the sheet conductance of the sensing film and the gas concentration at the corresponding depth, and the reality that the conductance of the entire film is an integration of sheet conductance over the whole range of the film from the surface to the substrate.
Author Zuo, Kaiyuan
Zhang, Shouwen
Zhang, Hua
Meng, Fanli
Yuan, Zhenyu
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Cites_doi 10.1039/C4RA12467G
10.1016/j.apsusc.2019.03.043
10.1016/S0925-4005(99)00049-0
10.1016/j.snb.2016.12.026
10.1016/j.snb.2016.11.005
10.1166/jctn.2013.2735
10.1016/S0925-4005(01)00890-5
10.1039/C5NR05195A
10.1016/j.snb.2017.07.173
10.1016/j.snb.2009.02.018
10.1109/TNANO.2008.2005917
10.1252/jcej.17.39
10.1016/S0925-4005(00)00381-6
10.1007/s11665-015-1698-4
10.1021/ac60191a001
10.1063/1.1729783
10.1016/j.mseb.2004.02.013
10.1063/1.3225996
10.1039/C4RA10942B
10.1016/S0925-4005(97)00199-8
10.1002/chem.200700927
10.1021/j100117a030
10.1002/pssa.200622237
10.1021/jp981391v
10.1039/jm9940400631
10.1021/acsami.9b07021
10.1016/S0925-4005(00)00370-1
10.1016/j.tsf.2011.04.163
10.1016/j.snb.2016.08.085
10.1021/jp0509764
10.2109/jcersj.112.252
10.1007/s10832-004-5178-8
10.1016/S0925-4005(99)00245-2
10.1016/j.snb.2004.04.003
10.1007/s00285-006-0013-2
10.1016/S0925-4005(01)01043-7
10.1039/C2CS35379B
10.1016/S0254-0584(99)00267-9
10.1021/ie010195z
10.1016/S0925-4005(98)00272-X
10.1016/j.snb.2005.03.016
10.1021/ef980024f
10.1021/jp8003147
10.1016/S0925-4005(03)00528-8
10.1007/s10404-007-0182-3
10.4028/www.scientific.net/AMR.486.153
10.1166/jnn.2019.16765
10.1016/S0925-4005(03)00529-X
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References ref13
ref12
ref15
ref14
ref11
ref10
ref17
ref16
ref19
ref18
mcintire (ref20) 2006
ref50
ref46
ref45
ref48
ref47
ref42
ref41
ref44
ref43
ref49
ref8
ref7
ref9
ref4
ref3
ref6
ref5
ref40
ref35
ref34
ref37
ref36
ref31
ref30
ref33
ref32
ref1
ref39
ref38
taguchi (ref2) 1973
ref24
ref23
ref26
ref25
ref22
ref21
ref28
ref27
ref29
References_xml – ident: ref5
  doi: 10.1039/C4RA12467G
– ident: ref37
  doi: 10.1016/j.apsusc.2019.03.043
– ident: ref29
  doi: 10.1016/S0925-4005(99)00049-0
– ident: ref21
  doi: 10.1016/j.snb.2016.12.026
– ident: ref12
  doi: 10.1016/j.snb.2016.11.005
– ident: ref49
  doi: 10.1166/jctn.2013.2735
– ident: ref32
  doi: 10.1016/S0925-4005(01)00890-5
– ident: ref9
  doi: 10.1039/C5NR05195A
– ident: ref13
  doi: 10.1016/j.snb.2017.07.173
– ident: ref33
  doi: 10.1016/j.snb.2009.02.018
– ident: ref26
  doi: 10.1109/TNANO.2008.2005917
– ident: ref42
  doi: 10.1252/jcej.17.39
– ident: ref36
  doi: 10.1016/S0925-4005(00)00381-6
– ident: ref34
  doi: 10.1007/s11665-015-1698-4
– ident: ref1
  doi: 10.1021/ac60191a001
– ident: ref22
  doi: 10.1063/1.1729783
– ident: ref31
  doi: 10.1016/j.mseb.2004.02.013
– ident: ref16
  doi: 10.1063/1.3225996
– year: 1973
  ident: ref2
  article-title: Semiconductor gas detecting device
– ident: ref10
  doi: 10.1039/C4RA10942B
– ident: ref50
  doi: 10.1016/S0925-4005(97)00199-8
– ident: ref3
  doi: 10.1002/chem.200700927
– ident: ref43
  doi: 10.1021/j100117a030
– ident: ref45
  doi: 10.1002/pssa.200622237
– ident: ref25
  doi: 10.1021/jp981391v
– ident: ref44
  doi: 10.1039/jm9940400631
– ident: ref14
  doi: 10.1021/acsami.9b07021
– ident: ref19
  doi: 10.1016/S0925-4005(00)00370-1
– ident: ref41
  doi: 10.1016/j.tsf.2011.04.163
– ident: ref11
  doi: 10.1016/j.snb.2016.08.085
– ident: ref18
  doi: 10.1021/jp0509764
– ident: ref35
  doi: 10.2109/jcersj.112.252
– ident: ref38
  doi: 10.1007/s10832-004-5178-8
– ident: ref28
  doi: 10.1016/S0925-4005(99)00245-2
– year: 2006
  ident: ref20
  article-title: Diffusion layer for an enzyme-based sensor application
– ident: ref24
  doi: 10.1016/j.snb.2004.04.003
– ident: ref46
  doi: 10.1007/s00285-006-0013-2
– ident: ref17
  doi: 10.1016/S0925-4005(01)01043-7
– ident: ref4
  doi: 10.1039/C2CS35379B
– ident: ref30
  doi: 10.1016/S0254-0584(99)00267-9
– ident: ref15
  doi: 10.1021/ie010195z
– ident: ref7
  doi: 10.1016/S0925-4005(98)00272-X
– ident: ref40
  doi: 10.1016/j.snb.2005.03.016
– ident: ref48
  doi: 10.1021/ef980024f
– ident: ref27
  doi: 10.1021/jp8003147
– ident: ref8
  doi: 10.1016/S0925-4005(03)00528-8
– ident: ref23
  doi: 10.1007/s10404-007-0182-3
– ident: ref39
  doi: 10.4028/www.scientific.net/AMR.486.153
– ident: ref6
  doi: 10.1166/jnn.2019.16765
– ident: ref47
  doi: 10.1016/S0925-4005(03)00529-X
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Snippet In this paper, a new diffusion-reaction equation was formulated to research the influences of grain radius on the transients of gas transport and gas...
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SubjectTerms Adsorption
Detection
Diffusion-reaction equation
gas concentration
Gas detectors
gas sensitivity
Gas sensors
Gas transport
grain radius
Metal oxides
Metals
Porous media
Reaction-diffusion equations
Resistance
Sensitivity
Substrates
Surface treatment
Thin films
Title Investigation of Grain Radius Dependence of Sensitivity for Porous Thin Film Semiconducting Metal Oxide Gas Sensor
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