A Highly Reliable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source

• Published in: IEEE journal of solid-state circuits Vol. 56; no. 5; pp. 1641 - 1650
• Main Authors: Lin, Bohan, Pang, Yachuan, Gao, Bin, Tang, Jianshi, Wu, Dong, Chang, Ting-Wei, Lin, Wei-En, Sun, Xiaoyu, Yu, Shimeng, Chang, Meng-Fan, Qian, He, Wu, Huaqiang
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.05.2021; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Amplifier design; Bit error rate; Device-to-device communication; Hardware; Hardware security; Internet of Things; Physical unclonable function; physical unclonable function (PUF); post-process randomness; Random access memory; reconfigurability; Reliability; Resistance; resistive random access memory (RRAM); Security; Sense amplifiers; Switches

Physically unclonable function (PUF) has been increasingly used as a promising primitive for hardware security with a wide range of applications in the Internet of Things (IoT). In recent years, novel PUF techniques based on resistive switching mechanism in various emerging nonvolatile memories have...